Abstract

The scanning delay line is a key component of time-domain optical coherence tomography systems. It has evolved since its inception toward higher scan rates and simpler implementation. However, existing approaches still suffer from drawbacks in terms of size, cost, and complexity, and they are not suitable for implementation using integrated optics. In this Letter, we report a rapid scanning delay line based on the thermo-optic effect of silicon at λ=1.3μm manufactured around a generic planar lightwave circuit technology. The reported device attained line scan rates of 10kHz and demonstrated a scan range of 0.95mm without suffering any observable loss of resolution (15µm FWHM) owing to depth-dependent chromatic dispersion.

© 2010 Optical Society of America

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