The scanning delay line is a key component of time-domain optical coherence tomography systems. It has evolved since its inception toward higher scan rates and simpler implementation. However, existing approaches still suffer from drawbacks in terms of size, cost, and complexity, and they are not suitable for implementation using integrated optics. In this Letter, we report a rapid scanning delay line based on the thermo-optic effect of silicon at manufactured around a generic planar lightwave circuit technology. The reported device attained line scan rates of and demonstrated a scan range of without suffering any observable loss of resolution ( FWHM) owing to depth-dependent chromatic dispersion.
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