Abstract

We characterized the reflectivity and the modal discrimination of intracavity reflectors (ICRs) with different numbers of slots and presented harmonic mode-locking operation of a monolithic semiconductor laser comprising a compound cavity formed by a single deeply etched slot ICR fabricated from 1.55μm AlGaInAs strained quantum well material. Gaussian pulses were generated at a 161.8GHz repetition rate with a pulse duration of 1.67ps and a time–bandwidth product of 0.81.

© 2010 Optical Society of America

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  1. S. Arahira, S. Sasaki, K. Tachibana, and Y. Ogawa, IEEE Photon. Technol. Lett. 16, 1558 (2004).
    [CrossRef]
  2. Y. Wen, D. Novak, H. Liu, and A. Nirmalathus, Electron. Lett. 37, 581 (2001).
    [CrossRef]
  3. T. Shimizu, I. Ogura, and H. Yokoyama, Electron. Lett. 33, 1868 (1997).
    [CrossRef]
  4. S. Arahira, Y. Matsui, and Y. Ogawa, IEEE J. Quantum Electron. 32, 1211 (1996).
    [CrossRef]
  5. D. A. Yanson, M. W. Street, S. D. McDougall, I. G. Thayne, J. H. Marsh, and E. A. Avrutin, IEEE J. Quantum Electron. 38, 1 (2002).
    [CrossRef]
  6. L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
    [CrossRef]
  7. L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
    [CrossRef]
  8. S. A. Merritt, C. Dauga, S. Fox, I.-F. Wu, and M. Dagenais, J. Lightwave Technol. 13, 430 (1995).
    [CrossRef]
  9. J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
    [CrossRef]
  10. G. P. Agrawal and N. A. Olsson, IEEE J. Quantum Electron. 25, 2297 (1989).
    [CrossRef]

2010 (1)

L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
[CrossRef]

2009 (1)

L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
[CrossRef]

2005 (1)

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

2004 (1)

S. Arahira, S. Sasaki, K. Tachibana, and Y. Ogawa, IEEE Photon. Technol. Lett. 16, 1558 (2004).
[CrossRef]

2002 (1)

D. A. Yanson, M. W. Street, S. D. McDougall, I. G. Thayne, J. H. Marsh, and E. A. Avrutin, IEEE J. Quantum Electron. 38, 1 (2002).
[CrossRef]

2001 (1)

Y. Wen, D. Novak, H. Liu, and A. Nirmalathus, Electron. Lett. 37, 581 (2001).
[CrossRef]

1997 (1)

T. Shimizu, I. Ogura, and H. Yokoyama, Electron. Lett. 33, 1868 (1997).
[CrossRef]

1996 (1)

S. Arahira, Y. Matsui, and Y. Ogawa, IEEE J. Quantum Electron. 32, 1211 (1996).
[CrossRef]

1995 (1)

S. A. Merritt, C. Dauga, S. Fox, I.-F. Wu, and M. Dagenais, J. Lightwave Technol. 13, 430 (1995).
[CrossRef]

1989 (1)

G. P. Agrawal and N. A. Olsson, IEEE J. Quantum Electron. 25, 2297 (1989).
[CrossRef]

Agrawal, G. P.

G. P. Agrawal and N. A. Olsson, IEEE J. Quantum Electron. 25, 2297 (1989).
[CrossRef]

Arahira, S.

S. Arahira, S. Sasaki, K. Tachibana, and Y. Ogawa, IEEE Photon. Technol. Lett. 16, 1558 (2004).
[CrossRef]

S. Arahira, Y. Matsui, and Y. Ogawa, IEEE J. Quantum Electron. 32, 1211 (1996).
[CrossRef]

Avrutin, E. A.

D. A. Yanson, M. W. Street, S. D. McDougall, I. G. Thayne, J. H. Marsh, and E. A. Avrutin, IEEE J. Quantum Electron. 38, 1 (2002).
[CrossRef]

Bryce, A. C.

L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
[CrossRef]

L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
[CrossRef]

Dagenais, M.

S. A. Merritt, C. Dauga, S. Fox, I.-F. Wu, and M. Dagenais, J. Lightwave Technol. 13, 430 (1995).
[CrossRef]

Dauga, C.

S. A. Merritt, C. Dauga, S. Fox, I.-F. Wu, and M. Dagenais, J. Lightwave Technol. 13, 430 (1995).
[CrossRef]

Dylewicz, R.

L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
[CrossRef]

Erbert, G.

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

Fox, S.

S. A. Merritt, C. Dauga, S. Fox, I.-F. Wu, and M. Dagenais, J. Lightwave Technol. 13, 430 (1995).
[CrossRef]

Fricke, J.

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

Green, R.

L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
[CrossRef]

Haji, M.

L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
[CrossRef]

Hou, L.

L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
[CrossRef]

L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
[CrossRef]

Ironside, C.

L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
[CrossRef]

Javaloyes, J.

L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
[CrossRef]

L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
[CrossRef]

Klehr, A.

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

Liu, H.

Y. Wen, D. Novak, H. Liu, and A. Nirmalathus, Electron. Lett. 37, 581 (2001).
[CrossRef]

Marsh, J. H.

D. A. Yanson, M. W. Street, S. D. McDougall, I. G. Thayne, J. H. Marsh, and E. A. Avrutin, IEEE J. Quantum Electron. 38, 1 (2002).
[CrossRef]

Matalla, M.

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

Matsui, Y.

S. Arahira, Y. Matsui, and Y. Ogawa, IEEE J. Quantum Electron. 32, 1211 (1996).
[CrossRef]

McDougall, S. D.

D. A. Yanson, M. W. Street, S. D. McDougall, I. G. Thayne, J. H. Marsh, and E. A. Avrutin, IEEE J. Quantum Electron. 38, 1 (2002).
[CrossRef]

Merritt, S. A.

S. A. Merritt, C. Dauga, S. Fox, I.-F. Wu, and M. Dagenais, J. Lightwave Technol. 13, 430 (1995).
[CrossRef]

Nirmalathus, A.

Y. Wen, D. Novak, H. Liu, and A. Nirmalathus, Electron. Lett. 37, 581 (2001).
[CrossRef]

Novak, D.

Y. Wen, D. Novak, H. Liu, and A. Nirmalathus, Electron. Lett. 37, 581 (2001).
[CrossRef]

Ogawa, Y.

S. Arahira, S. Sasaki, K. Tachibana, and Y. Ogawa, IEEE Photon. Technol. Lett. 16, 1558 (2004).
[CrossRef]

S. Arahira, Y. Matsui, and Y. Ogawa, IEEE J. Quantum Electron. 32, 1211 (1996).
[CrossRef]

Ogura, I.

T. Shimizu, I. Ogura, and H. Yokoyama, Electron. Lett. 33, 1868 (1997).
[CrossRef]

Olsson, N. A.

G. P. Agrawal and N. A. Olsson, IEEE J. Quantum Electron. 25, 2297 (1989).
[CrossRef]

Qiu, B.

L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
[CrossRef]

Sasaki, S.

S. Arahira, S. Sasaki, K. Tachibana, and Y. Ogawa, IEEE Photon. Technol. Lett. 16, 1558 (2004).
[CrossRef]

Shimizu, T.

T. Shimizu, I. Ogura, and H. Yokoyama, Electron. Lett. 33, 1868 (1997).
[CrossRef]

Sorel, M.

L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
[CrossRef]

Stolarz, P.

L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
[CrossRef]

L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
[CrossRef]

Street, M. W.

D. A. Yanson, M. W. Street, S. D. McDougall, I. G. Thayne, J. H. Marsh, and E. A. Avrutin, IEEE J. Quantum Electron. 38, 1 (2002).
[CrossRef]

Tachibana, K.

S. Arahira, S. Sasaki, K. Tachibana, and Y. Ogawa, IEEE Photon. Technol. Lett. 16, 1558 (2004).
[CrossRef]

Thayne, I. G.

D. A. Yanson, M. W. Street, S. D. McDougall, I. G. Thayne, J. H. Marsh, and E. A. Avrutin, IEEE J. Quantum Electron. 38, 1 (2002).
[CrossRef]

Wen, Y.

Y. Wen, D. Novak, H. Liu, and A. Nirmalathus, Electron. Lett. 37, 581 (2001).
[CrossRef]

Wenzel, H.

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

Wu, I.-F.

S. A. Merritt, C. Dauga, S. Fox, I.-F. Wu, and M. Dagenais, J. Lightwave Technol. 13, 430 (1995).
[CrossRef]

Yanson, D. A.

D. A. Yanson, M. W. Street, S. D. McDougall, I. G. Thayne, J. H. Marsh, and E. A. Avrutin, IEEE J. Quantum Electron. 38, 1 (2002).
[CrossRef]

Yokoyama, H.

T. Shimizu, I. Ogura, and H. Yokoyama, Electron. Lett. 33, 1868 (1997).
[CrossRef]

Electron. Lett. (2)

Y. Wen, D. Novak, H. Liu, and A. Nirmalathus, Electron. Lett. 37, 581 (2001).
[CrossRef]

T. Shimizu, I. Ogura, and H. Yokoyama, Electron. Lett. 33, 1868 (1997).
[CrossRef]

IEEE J. Quantum Electron. (3)

S. Arahira, Y. Matsui, and Y. Ogawa, IEEE J. Quantum Electron. 32, 1211 (1996).
[CrossRef]

D. A. Yanson, M. W. Street, S. D. McDougall, I. G. Thayne, J. H. Marsh, and E. A. Avrutin, IEEE J. Quantum Electron. 38, 1 (2002).
[CrossRef]

G. P. Agrawal and N. A. Olsson, IEEE J. Quantum Electron. 25, 2297 (1989).
[CrossRef]

IEEE Photon. Technol. Lett. (3)

S. Arahira, S. Sasaki, K. Tachibana, and Y. Ogawa, IEEE Photon. Technol. Lett. 16, 1558 (2004).
[CrossRef]

L. Hou, P. Stolarz, R. Dylewicz, M. Haji, J. Javaloyes, B. Qiu, and A. C. Bryce, IEEE Photon. Technol. Lett. 22, 727(2010).
[CrossRef]

L. Hou, P. Stolarz, J. Javaloyes, R. Green, C. Ironside, M. Sorel, and A. C. Bryce, IEEE Photon. Technol. Lett. 21, 1731 (2009).
[CrossRef]

J. Lightwave Technol. (1)

S. A. Merritt, C. Dauga, S. Fox, I.-F. Wu, and M. Dagenais, J. Lightwave Technol. 13, 430 (1995).
[CrossRef]

Semicond. Sci. Technol. (1)

J. Fricke, H. Wenzel, M. Matalla, A. Klehr, and G. Erbert, Semicond. Sci. Technol. 20, 1149 (2005).
[CrossRef]

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Figures (5)

Fig. 1
Fig. 1

(a) Scanning electron microscope (SEM) pictures of ridge waveguide with HSQ planarization, (b) laser wafer cross section with a deeply etched single-slot ICR, and (c) schematic of monolithic CCM device with one ICR.

Fig. 2
Fig. 2

(a) Simulated reflectivity. Inset, SEM micrographs of different ICRs. (b) Measured R G product. Inset, reflectivity as a function of the wavelength for the ICR with different number of slots.

Fig. 3
Fig. 3

Calculated modal discrimination versus ICR reflectance and the corresponding autocorrelation trace of the pulse train for the ICR with different slots.

Fig. 4
Fig. 4

Typical L–I characteristics under SA applied bias from 0 to 3 V , in 0.5 V steps (from top to bottom) with I SG = 5 mA . Inset, output power versus I LG for different I SG settings with V SA = 0 V at a heat-sink temperature of 20 ° C .

Fig. 5
Fig. 5

Optical spectrum and corresponding autocorrelation trace of the pulse train of the mode-locked device for I LG = 80 mA , I SG = 5 mA , and V SA = 2.0 V measured at the temperature of 20 ° C .

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