Abstract

An enhanced material-classification algorithm using turbulence-degraded polarimetric imagery is presented. The proposed technique improves upon an existing dielectric/metal material-classification algorithm by providing a more detailed object classification. This is accomplished by redesigning the degree-of-linear-polarization priors in the blind-deconvolution algorithm to include two subclasses of metals—an aluminum group classification (includes aluminum, copper, gold, and silver) and an iron group classification (includes iron, titanium, nickel, and chromium). This new classification provides functional information about the object that is not provided by existing dielectric/metal material classifiers. A discussion of the design of these new degree-of-linear-polarization priors is provided. Experimental results of two painted metal samples are also provided to verify the algorithm’s accuracy.

© 2010 Optical Society of America

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  1. P. Terrier, V. Devlaminck, and J. M. Charbois, J. Opt. Soc. Am. A 25, 423 (2008).
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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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2010

M. W. Hyde, S. C. Cain, J. D. Schmidt, and M. J. Havrilla, IEEE Trans. Geosci. Remote Sens. (to be published) [ PP(99), (2010)].

2009

2008

1990

L. B. Wolff, IEEE Trans. Pattern Anal. Mach. Intell. 12, 1059 (1990).
[CrossRef]

Cain, S. C.

M. W. Hyde, S. C. Cain, J. D. Schmidt, and M. J. Havrilla, IEEE Trans. Geosci. Remote Sens. (to be published) [ PP(99), (2010)].

D. A. LeMaster and S. C. Cain, J. Opt. Soc. Am. A 25, 2170 (2008).
[CrossRef]

Charbois, J. M.

Devlaminck, V.

Goodman, J. W.

J. W. Goodman, Statistical Optics (Wiley, 2000).

Havrilla, M. J.

M. W. Hyde, S. C. Cain, J. D. Schmidt, and M. J. Havrilla, IEEE Trans. Geosci. Remote Sens. (to be published) [ PP(99), (2010)].

M. W. Hyde, J. D. Schmidt, and M. J. Havrilla, Opt. Express 17, 22138 (2009).
[CrossRef] [PubMed]

Hyde, M. W.

M. W. Hyde, S. C. Cain, J. D. Schmidt, and M. J. Havrilla, IEEE Trans. Geosci. Remote Sens. (to be published) [ PP(99), (2010)].

M. W. Hyde, J. D. Schmidt, and M. J. Havrilla, Opt. Express 17, 22138 (2009).
[CrossRef] [PubMed]

Kimachi, A.

S. Tominaga and A. Kimachi, Opt. Eng. 47, 123201 (2008).
[CrossRef]

LeMaster, D. A.

Schmidt, J. D.

M. W. Hyde, S. C. Cain, J. D. Schmidt, and M. J. Havrilla, IEEE Trans. Geosci. Remote Sens. (to be published) [ PP(99), (2010)].

M. W. Hyde, J. D. Schmidt, and M. J. Havrilla, Opt. Express 17, 22138 (2009).
[CrossRef] [PubMed]

Schott, J. R.

J. R. Schott, Fundamentals of Polarimetric Remote Sensing (SPIE, 2009).
[CrossRef]

Terrier, P.

Tominaga, S.

S. Tominaga and A. Kimachi, Opt. Eng. 47, 123201 (2008).
[CrossRef]

Wolff, L. B.

L. B. Wolff, IEEE Trans. Pattern Anal. Mach. Intell. 12, 1059 (1990).
[CrossRef]

IEEE Trans. Geosci. Remote Sens.

M. W. Hyde, S. C. Cain, J. D. Schmidt, and M. J. Havrilla, IEEE Trans. Geosci. Remote Sens. (to be published) [ PP(99), (2010)].

IEEE Trans. Pattern Anal. Mach. Intell.

L. B. Wolff, IEEE Trans. Pattern Anal. Mach. Intell. 12, 1059 (1990).
[CrossRef]

J. Opt. Soc. Am. A

Opt. Eng.

S. Tominaga and A. Kimachi, Opt. Eng. 47, 123201 (2008).
[CrossRef]

Opt. Express

Other

J. R. Schott, Fundamentals of Polarimetric Remote Sensing (SPIE, 2009).
[CrossRef]

J. W. Goodman, Statistical Optics (Wiley, 2000).

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Figures (3)

Fig. 1
Fig. 1

(a) DOLP plots of the Al group, Fe group, and dielectrics versus θ r ( θ i = 45 ° ) predicted using a pBRDF (b) Al group, Fe group, and dielectric DOLP priors.

Fig. 2
Fig. 2

S 0 results (collected at θ i = θ r = 55 ° ) of the enhanced material-classification algorithm: (a) no-turbulence, (b) turbulence-degraded, and (c) corrected S 0 images for the painted Al sample. (d)–(f) show those same S 0 results for the painted steel sample, respectively. The dimensions annotated on the figures are object coordinates in millimeters.

Fig. 3
Fig. 3

Classification results of the enhanced material-classification algorithm: (a) painted Al and (b) painted steel samples. The dimensions annotated on the figures are object coordinates in millimeters.

Equations (1)

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Π ( P ) = c 1 exp { [ c 2 ( P c 3 ) ] m } ,

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