Abstract

A thin-film InGaAs/GaAs edge-emitting single-quantum-well laser has been integrated with a tapered multimode SU-8 waveguide onto an Si substrate. The SU-8 waveguide is passively aligned to the laser using mask-based photolithography, mimicking electrical interconnection in Si complementary metal–oxide semiconductor, and overlaps one facet of the thin-film laser for coupling power from the laser to the waveguide. Injected threshold current densities of 260A/cm2 are measured with the reduced reflectivity of the embedded laser facet while improving single mode coupling efficiency, which is theoretically simulated to be 77%.

© 2010 Optical Society of America

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  1. D. A. B. Miller, Proc. IEEE 88, 728 (2000).
    [CrossRef]
  2. Y. J. Joo, S. Fike, K. S. Chung, M. Brooke, N. M. Jokerst, and D. S. Wills, in Proceedings of the Fourth International Conference on Massively Parallel Processing Using Optical Interconnections (IEEE, 1997), pp. 96–100.
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    [CrossRef]
  4. J. A. Chediak, Z. Luo, J. Seo, N. Cheung, L. P. Lee, and T. M. Sands, Sens. Act. A 111, 1 (2004).
    [CrossRef]
  5. J. Hubner, T. Anhøj, S. Pedersen, D. A. Zauner, A. M. Jorgensen, G. Blagoi, I. Talian, and O. Hansen, Proc. SPIE 6896, 689614 (2008).
    [CrossRef]
  6. N. Jokerst, M. Royal, S. Palit, L. Luan, S. Dhar, and T. Tyler, J. Biophoton. 2, 212 (2009).
    [CrossRef]
  7. M. Yanagisawa, H. Terui, K. Shuto, T. Miya, and M. Kobayashi, IEEE Photon. Technol. Lett. 4, 21 (1992).
    [CrossRef]
  8. R. Jones, H. D. Park, A. W. Fang, J. E. Bowers, O. Cohen, O. Raday, and M. J. Paniccia, J. Mat. Sci. Mat. Electron. 20, 3 (2007).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  12. H.-F. Kuo, S.-Y. Cho, J. Hall, and N. M. Jokerst, in Proceedings of the 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society (IEEE, 2003), pp. 63–64.
  13. P. de la Fuente, J. A. Etxeberria, J. Berganzo, J. M. Ruano-López, M. T. Arroyo, E. Castaño, and F. J. Gracia, Sens. Act. A 123–124, 313 (2005).
  14. S.-Y. Cho, S.-W. Seo, N. M. Jokerst, and M. Brooke, in Proceedings of the 55th Electronic Components Technology Conference (2005), pp. 1611–1616.
  15. S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, Proc. SPIE 7607, 76070I (2010).
    [CrossRef]
  16. S. Palit, J. Kirch, L. Mawst, and N. M. Jokerst, in Proceedings of the Conference on Lasers and Electro-Optics(Optical Society of America, 2010), paper CWP5.
  17. S. Palit, J. Kirch, G. Tsvid, L. Mawst, T. Kuech, and N. M. Jokerst, Opt. Lett. 34, 2802 (2009).
    [CrossRef] [PubMed]
  18. S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, “Thermal characteristics of III/V thin film edge emitting lasers on silicon,” submitted to Int. J. Microw. Opt. Tech.

2010 (2)

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, Proc. SPIE 7607, 76070I (2010).
[CrossRef]

S. Palit, J. Kirch, L. Mawst, and N. M. Jokerst, in Proceedings of the Conference on Lasers and Electro-Optics(Optical Society of America, 2010), paper CWP5.

2009 (2)

S. Palit, J. Kirch, G. Tsvid, L. Mawst, T. Kuech, and N. M. Jokerst, Opt. Lett. 34, 2802 (2009).
[CrossRef] [PubMed]

N. Jokerst, M. Royal, S. Palit, L. Luan, S. Dhar, and T. Tyler, J. Biophoton. 2, 212 (2009).
[CrossRef]

2008 (1)

J. Hubner, T. Anhøj, S. Pedersen, D. A. Zauner, A. M. Jorgensen, G. Blagoi, I. Talian, and O. Hansen, Proc. SPIE 6896, 689614 (2008).
[CrossRef]

2007 (1)

R. Jones, H. D. Park, A. W. Fang, J. E. Bowers, O. Cohen, O. Raday, and M. J. Paniccia, J. Mat. Sci. Mat. Electron. 20, 3 (2007).
[CrossRef]

2006 (1)

G. Roelkens, J. Brouckaert, S. Verstuyft, J. Schrauwen, D. Van Thourhout, and R. Baets, in Proceedings of the Third IEEE International Conference on Group IV Photonics (IEEE, 2006), pp. 188–190.
[CrossRef]

2005 (3)

S.-W. Seo, S.-Y. Cho, and N. M. Jokerst, IEEE Photon. Technol. Lett. 17, 2197 (2005).
[CrossRef]

P. de la Fuente, J. A. Etxeberria, J. Berganzo, J. M. Ruano-López, M. T. Arroyo, E. Castaño, and F. J. Gracia, Sens. Act. A 123–124, 313 (2005).

S.-Y. Cho, S.-W. Seo, N. M. Jokerst, and M. Brooke, in Proceedings of the 55th Electronic Components Technology Conference (2005), pp. 1611–1616.

2004 (1)

J. A. Chediak, Z. Luo, J. Seo, N. Cheung, L. P. Lee, and T. M. Sands, Sens. Act. A 111, 1 (2004).
[CrossRef]

2003 (1)

H.-F. Kuo, S.-Y. Cho, J. Hall, and N. M. Jokerst, in Proceedings of the 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society (IEEE, 2003), pp. 63–64.

2000 (1)

D. A. B. Miller, Proc. IEEE 88, 728 (2000).
[CrossRef]

1997 (2)

Y. J. Joo, S. Fike, K. S. Chung, M. Brooke, N. M. Jokerst, and D. S. Wills, in Proceedings of the Fourth International Conference on Massively Parallel Processing Using Optical Interconnections (IEEE, 1997), pp. 96–100.

R. E. Kunz, Sens. Act. B 38, 13 (1997).
[CrossRef]

1994 (1)

P. M. DeDobbelaere, F. Vermaerke, G. Vermeire, P. Demeester, P. VanDaele, G. R. Moehlmann, J.-L. P. Heideman, and W. H. G. Horsthuis, Proc. SPIE 2285, 352(1994).
[CrossRef]

1992 (1)

M. Yanagisawa, H. Terui, K. Shuto, T. Miya, and M. Kobayashi, IEEE Photon. Technol. Lett. 4, 21 (1992).
[CrossRef]

Anhøj, T.

J. Hubner, T. Anhøj, S. Pedersen, D. A. Zauner, A. M. Jorgensen, G. Blagoi, I. Talian, and O. Hansen, Proc. SPIE 6896, 689614 (2008).
[CrossRef]

Arroyo, M. T.

P. de la Fuente, J. A. Etxeberria, J. Berganzo, J. M. Ruano-López, M. T. Arroyo, E. Castaño, and F. J. Gracia, Sens. Act. A 123–124, 313 (2005).

Baets, R.

G. Roelkens, J. Brouckaert, S. Verstuyft, J. Schrauwen, D. Van Thourhout, and R. Baets, in Proceedings of the Third IEEE International Conference on Group IV Photonics (IEEE, 2006), pp. 188–190.
[CrossRef]

Berganzo, J.

P. de la Fuente, J. A. Etxeberria, J. Berganzo, J. M. Ruano-López, M. T. Arroyo, E. Castaño, and F. J. Gracia, Sens. Act. A 123–124, 313 (2005).

Blagoi, G.

J. Hubner, T. Anhøj, S. Pedersen, D. A. Zauner, A. M. Jorgensen, G. Blagoi, I. Talian, and O. Hansen, Proc. SPIE 6896, 689614 (2008).
[CrossRef]

Bowers, J. E.

R. Jones, H. D. Park, A. W. Fang, J. E. Bowers, O. Cohen, O. Raday, and M. J. Paniccia, J. Mat. Sci. Mat. Electron. 20, 3 (2007).
[CrossRef]

Brooke, M.

S.-Y. Cho, S.-W. Seo, N. M. Jokerst, and M. Brooke, in Proceedings of the 55th Electronic Components Technology Conference (2005), pp. 1611–1616.

Y. J. Joo, S. Fike, K. S. Chung, M. Brooke, N. M. Jokerst, and D. S. Wills, in Proceedings of the Fourth International Conference on Massively Parallel Processing Using Optical Interconnections (IEEE, 1997), pp. 96–100.

Brouckaert, J.

G. Roelkens, J. Brouckaert, S. Verstuyft, J. Schrauwen, D. Van Thourhout, and R. Baets, in Proceedings of the Third IEEE International Conference on Group IV Photonics (IEEE, 2006), pp. 188–190.
[CrossRef]

Castaño, E.

P. de la Fuente, J. A. Etxeberria, J. Berganzo, J. M. Ruano-López, M. T. Arroyo, E. Castaño, and F. J. Gracia, Sens. Act. A 123–124, 313 (2005).

Chediak, J. A.

J. A. Chediak, Z. Luo, J. Seo, N. Cheung, L. P. Lee, and T. M. Sands, Sens. Act. A 111, 1 (2004).
[CrossRef]

Cheung, N.

J. A. Chediak, Z. Luo, J. Seo, N. Cheung, L. P. Lee, and T. M. Sands, Sens. Act. A 111, 1 (2004).
[CrossRef]

Cho, S.-Y.

S.-W. Seo, S.-Y. Cho, and N. M. Jokerst, IEEE Photon. Technol. Lett. 17, 2197 (2005).
[CrossRef]

S.-Y. Cho, S.-W. Seo, N. M. Jokerst, and M. Brooke, in Proceedings of the 55th Electronic Components Technology Conference (2005), pp. 1611–1616.

H.-F. Kuo, S.-Y. Cho, J. Hall, and N. M. Jokerst, in Proceedings of the 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society (IEEE, 2003), pp. 63–64.

Chung, K. S.

Y. J. Joo, S. Fike, K. S. Chung, M. Brooke, N. M. Jokerst, and D. S. Wills, in Proceedings of the Fourth International Conference on Massively Parallel Processing Using Optical Interconnections (IEEE, 1997), pp. 96–100.

Cohen, O.

R. Jones, H. D. Park, A. W. Fang, J. E. Bowers, O. Cohen, O. Raday, and M. J. Paniccia, J. Mat. Sci. Mat. Electron. 20, 3 (2007).
[CrossRef]

de la Fuente, P.

P. de la Fuente, J. A. Etxeberria, J. Berganzo, J. M. Ruano-López, M. T. Arroyo, E. Castaño, and F. J. Gracia, Sens. Act. A 123–124, 313 (2005).

DeDobbelaere, P. M.

P. M. DeDobbelaere, F. Vermaerke, G. Vermeire, P. Demeester, P. VanDaele, G. R. Moehlmann, J.-L. P. Heideman, and W. H. G. Horsthuis, Proc. SPIE 2285, 352(1994).
[CrossRef]

Demeester, P.

P. M. DeDobbelaere, F. Vermaerke, G. Vermeire, P. Demeester, P. VanDaele, G. R. Moehlmann, J.-L. P. Heideman, and W. H. G. Horsthuis, Proc. SPIE 2285, 352(1994).
[CrossRef]

Dhar, S.

N. Jokerst, M. Royal, S. Palit, L. Luan, S. Dhar, and T. Tyler, J. Biophoton. 2, 212 (2009).
[CrossRef]

Etxeberria, J. A.

P. de la Fuente, J. A. Etxeberria, J. Berganzo, J. M. Ruano-López, M. T. Arroyo, E. Castaño, and F. J. Gracia, Sens. Act. A 123–124, 313 (2005).

Fang, A. W.

R. Jones, H. D. Park, A. W. Fang, J. E. Bowers, O. Cohen, O. Raday, and M. J. Paniccia, J. Mat. Sci. Mat. Electron. 20, 3 (2007).
[CrossRef]

Fike, S.

Y. J. Joo, S. Fike, K. S. Chung, M. Brooke, N. M. Jokerst, and D. S. Wills, in Proceedings of the Fourth International Conference on Massively Parallel Processing Using Optical Interconnections (IEEE, 1997), pp. 96–100.

Gracia, F. J.

P. de la Fuente, J. A. Etxeberria, J. Berganzo, J. M. Ruano-López, M. T. Arroyo, E. Castaño, and F. J. Gracia, Sens. Act. A 123–124, 313 (2005).

Hall, J.

H.-F. Kuo, S.-Y. Cho, J. Hall, and N. M. Jokerst, in Proceedings of the 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society (IEEE, 2003), pp. 63–64.

Hansen, O.

J. Hubner, T. Anhøj, S. Pedersen, D. A. Zauner, A. M. Jorgensen, G. Blagoi, I. Talian, and O. Hansen, Proc. SPIE 6896, 689614 (2008).
[CrossRef]

Heideman, J.-L. P.

P. M. DeDobbelaere, F. Vermaerke, G. Vermeire, P. Demeester, P. VanDaele, G. R. Moehlmann, J.-L. P. Heideman, and W. H. G. Horsthuis, Proc. SPIE 2285, 352(1994).
[CrossRef]

Horsthuis, W. H. G.

P. M. DeDobbelaere, F. Vermaerke, G. Vermeire, P. Demeester, P. VanDaele, G. R. Moehlmann, J.-L. P. Heideman, and W. H. G. Horsthuis, Proc. SPIE 2285, 352(1994).
[CrossRef]

Hubner, J.

J. Hubner, T. Anhøj, S. Pedersen, D. A. Zauner, A. M. Jorgensen, G. Blagoi, I. Talian, and O. Hansen, Proc. SPIE 6896, 689614 (2008).
[CrossRef]

Jokerst, N.

N. Jokerst, M. Royal, S. Palit, L. Luan, S. Dhar, and T. Tyler, J. Biophoton. 2, 212 (2009).
[CrossRef]

Jokerst, N. M.

S. Palit, J. Kirch, L. Mawst, and N. M. Jokerst, in Proceedings of the Conference on Lasers and Electro-Optics(Optical Society of America, 2010), paper CWP5.

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, Proc. SPIE 7607, 76070I (2010).
[CrossRef]

S. Palit, J. Kirch, G. Tsvid, L. Mawst, T. Kuech, and N. M. Jokerst, Opt. Lett. 34, 2802 (2009).
[CrossRef] [PubMed]

S.-Y. Cho, S.-W. Seo, N. M. Jokerst, and M. Brooke, in Proceedings of the 55th Electronic Components Technology Conference (2005), pp. 1611–1616.

S.-W. Seo, S.-Y. Cho, and N. M. Jokerst, IEEE Photon. Technol. Lett. 17, 2197 (2005).
[CrossRef]

H.-F. Kuo, S.-Y. Cho, J. Hall, and N. M. Jokerst, in Proceedings of the 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society (IEEE, 2003), pp. 63–64.

Y. J. Joo, S. Fike, K. S. Chung, M. Brooke, N. M. Jokerst, and D. S. Wills, in Proceedings of the Fourth International Conference on Massively Parallel Processing Using Optical Interconnections (IEEE, 1997), pp. 96–100.

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, “Thermal characteristics of III/V thin film edge emitting lasers on silicon,” submitted to Int. J. Microw. Opt. Tech.

Jones, R.

R. Jones, H. D. Park, A. W. Fang, J. E. Bowers, O. Cohen, O. Raday, and M. J. Paniccia, J. Mat. Sci. Mat. Electron. 20, 3 (2007).
[CrossRef]

Joo, Y. J.

Y. J. Joo, S. Fike, K. S. Chung, M. Brooke, N. M. Jokerst, and D. S. Wills, in Proceedings of the Fourth International Conference on Massively Parallel Processing Using Optical Interconnections (IEEE, 1997), pp. 96–100.

Jorgensen, A. M.

J. Hubner, T. Anhøj, S. Pedersen, D. A. Zauner, A. M. Jorgensen, G. Blagoi, I. Talian, and O. Hansen, Proc. SPIE 6896, 689614 (2008).
[CrossRef]

Kirch, J.

S. Palit, J. Kirch, L. Mawst, and N. M. Jokerst, in Proceedings of the Conference on Lasers and Electro-Optics(Optical Society of America, 2010), paper CWP5.

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, Proc. SPIE 7607, 76070I (2010).
[CrossRef]

S. Palit, J. Kirch, G. Tsvid, L. Mawst, T. Kuech, and N. M. Jokerst, Opt. Lett. 34, 2802 (2009).
[CrossRef] [PubMed]

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, “Thermal characteristics of III/V thin film edge emitting lasers on silicon,” submitted to Int. J. Microw. Opt. Tech.

Kobayashi, M.

M. Yanagisawa, H. Terui, K. Shuto, T. Miya, and M. Kobayashi, IEEE Photon. Technol. Lett. 4, 21 (1992).
[CrossRef]

Kuech, T.

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, Proc. SPIE 7607, 76070I (2010).
[CrossRef]

S. Palit, J. Kirch, G. Tsvid, L. Mawst, T. Kuech, and N. M. Jokerst, Opt. Lett. 34, 2802 (2009).
[CrossRef] [PubMed]

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, “Thermal characteristics of III/V thin film edge emitting lasers on silicon,” submitted to Int. J. Microw. Opt. Tech.

Kunz, R. E.

R. E. Kunz, Sens. Act. B 38, 13 (1997).
[CrossRef]

Kuo, H.-F.

H.-F. Kuo, S.-Y. Cho, J. Hall, and N. M. Jokerst, in Proceedings of the 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society (IEEE, 2003), pp. 63–64.

Lee, L. P.

J. A. Chediak, Z. Luo, J. Seo, N. Cheung, L. P. Lee, and T. M. Sands, Sens. Act. A 111, 1 (2004).
[CrossRef]

Luan, L.

N. Jokerst, M. Royal, S. Palit, L. Luan, S. Dhar, and T. Tyler, J. Biophoton. 2, 212 (2009).
[CrossRef]

Luo, Z.

J. A. Chediak, Z. Luo, J. Seo, N. Cheung, L. P. Lee, and T. M. Sands, Sens. Act. A 111, 1 (2004).
[CrossRef]

Mawst, L.

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, Proc. SPIE 7607, 76070I (2010).
[CrossRef]

S. Palit, J. Kirch, L. Mawst, and N. M. Jokerst, in Proceedings of the Conference on Lasers and Electro-Optics(Optical Society of America, 2010), paper CWP5.

S. Palit, J. Kirch, G. Tsvid, L. Mawst, T. Kuech, and N. M. Jokerst, Opt. Lett. 34, 2802 (2009).
[CrossRef] [PubMed]

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, “Thermal characteristics of III/V thin film edge emitting lasers on silicon,” submitted to Int. J. Microw. Opt. Tech.

Miller, D. A. B.

D. A. B. Miller, Proc. IEEE 88, 728 (2000).
[CrossRef]

Miya, T.

M. Yanagisawa, H. Terui, K. Shuto, T. Miya, and M. Kobayashi, IEEE Photon. Technol. Lett. 4, 21 (1992).
[CrossRef]

Moehlmann, G. R.

P. M. DeDobbelaere, F. Vermaerke, G. Vermeire, P. Demeester, P. VanDaele, G. R. Moehlmann, J.-L. P. Heideman, and W. H. G. Horsthuis, Proc. SPIE 2285, 352(1994).
[CrossRef]

Palit, S.

S. Palit, J. Kirch, L. Mawst, and N. M. Jokerst, in Proceedings of the Conference on Lasers and Electro-Optics(Optical Society of America, 2010), paper CWP5.

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, Proc. SPIE 7607, 76070I (2010).
[CrossRef]

S. Palit, J. Kirch, G. Tsvid, L. Mawst, T. Kuech, and N. M. Jokerst, Opt. Lett. 34, 2802 (2009).
[CrossRef] [PubMed]

N. Jokerst, M. Royal, S. Palit, L. Luan, S. Dhar, and T. Tyler, J. Biophoton. 2, 212 (2009).
[CrossRef]

S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, “Thermal characteristics of III/V thin film edge emitting lasers on silicon,” submitted to Int. J. Microw. Opt. Tech.

Paniccia, M. J.

R. Jones, H. D. Park, A. W. Fang, J. E. Bowers, O. Cohen, O. Raday, and M. J. Paniccia, J. Mat. Sci. Mat. Electron. 20, 3 (2007).
[CrossRef]

Park, H. D.

R. Jones, H. D. Park, A. W. Fang, J. E. Bowers, O. Cohen, O. Raday, and M. J. Paniccia, J. Mat. Sci. Mat. Electron. 20, 3 (2007).
[CrossRef]

Pedersen, S.

J. Hubner, T. Anhøj, S. Pedersen, D. A. Zauner, A. M. Jorgensen, G. Blagoi, I. Talian, and O. Hansen, Proc. SPIE 6896, 689614 (2008).
[CrossRef]

Raday, O.

R. Jones, H. D. Park, A. W. Fang, J. E. Bowers, O. Cohen, O. Raday, and M. J. Paniccia, J. Mat. Sci. Mat. Electron. 20, 3 (2007).
[CrossRef]

Roelkens, G.

G. Roelkens, J. Brouckaert, S. Verstuyft, J. Schrauwen, D. Van Thourhout, and R. Baets, in Proceedings of the Third IEEE International Conference on Group IV Photonics (IEEE, 2006), pp. 188–190.
[CrossRef]

Royal, M.

N. Jokerst, M. Royal, S. Palit, L. Luan, S. Dhar, and T. Tyler, J. Biophoton. 2, 212 (2009).
[CrossRef]

Ruano-López, J. M.

P. de la Fuente, J. A. Etxeberria, J. Berganzo, J. M. Ruano-López, M. T. Arroyo, E. Castaño, and F. J. Gracia, Sens. Act. A 123–124, 313 (2005).

Sands, T. M.

J. A. Chediak, Z. Luo, J. Seo, N. Cheung, L. P. Lee, and T. M. Sands, Sens. Act. A 111, 1 (2004).
[CrossRef]

Schrauwen, J.

G. Roelkens, J. Brouckaert, S. Verstuyft, J. Schrauwen, D. Van Thourhout, and R. Baets, in Proceedings of the Third IEEE International Conference on Group IV Photonics (IEEE, 2006), pp. 188–190.
[CrossRef]

Seo, J.

J. A. Chediak, Z. Luo, J. Seo, N. Cheung, L. P. Lee, and T. M. Sands, Sens. Act. A 111, 1 (2004).
[CrossRef]

Seo, S.-W.

S.-W. Seo, S.-Y. Cho, and N. M. Jokerst, IEEE Photon. Technol. Lett. 17, 2197 (2005).
[CrossRef]

S.-Y. Cho, S.-W. Seo, N. M. Jokerst, and M. Brooke, in Proceedings of the 55th Electronic Components Technology Conference (2005), pp. 1611–1616.

Shuto, K.

M. Yanagisawa, H. Terui, K. Shuto, T. Miya, and M. Kobayashi, IEEE Photon. Technol. Lett. 4, 21 (1992).
[CrossRef]

Talian, I.

J. Hubner, T. Anhøj, S. Pedersen, D. A. Zauner, A. M. Jorgensen, G. Blagoi, I. Talian, and O. Hansen, Proc. SPIE 6896, 689614 (2008).
[CrossRef]

Terui, H.

M. Yanagisawa, H. Terui, K. Shuto, T. Miya, and M. Kobayashi, IEEE Photon. Technol. Lett. 4, 21 (1992).
[CrossRef]

Tsvid, G.

Tyler, T.

N. Jokerst, M. Royal, S. Palit, L. Luan, S. Dhar, and T. Tyler, J. Biophoton. 2, 212 (2009).
[CrossRef]

Van Thourhout, D.

G. Roelkens, J. Brouckaert, S. Verstuyft, J. Schrauwen, D. Van Thourhout, and R. Baets, in Proceedings of the Third IEEE International Conference on Group IV Photonics (IEEE, 2006), pp. 188–190.
[CrossRef]

VanDaele, P.

P. M. DeDobbelaere, F. Vermaerke, G. Vermeire, P. Demeester, P. VanDaele, G. R. Moehlmann, J.-L. P. Heideman, and W. H. G. Horsthuis, Proc. SPIE 2285, 352(1994).
[CrossRef]

Vermaerke, F.

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S. Palit, J. Kirch, L. Mawst, T. Kuech, and N. M. Jokerst, “Thermal characteristics of III/V thin film edge emitting lasers on silicon,” submitted to Int. J. Microw. Opt. Tech.

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Figures (4)

Fig. 1
Fig. 1

Scanning electron micrograph (SEM) image of embedded TF-EEL facet and SU-8 waveguide. The TF-EEL bar is preferentially cleaved along the wedge shown in the SEM image.

Fig. 2
Fig. 2

(a) Waveguide output power versus current (L-I) from 800-μm-long laser integrated with an SU-8 waveguide. The original integration (blue) with gap has lower J th and lower power. After embedding (red), the L-I has a 27.2% higher J th and higher coupled power. (b) L-I for an embedded facet 1000 μm laser, showing J th = 260 A / cm 2 . Inset, spectrum at J = 420 A / cm 2 .

Fig. 3
Fig. 3

(a) IR image of an 800 μm ( 40 μm p metal stripe, p ridge width of 50 μm and depth of 0.61 μm , and n metal stripe of 40 μm ) laser with front facet embedded in SU-8 tapered S bend waveguide of 4 μm width. (b) L-I characteristic and spectrum for the system.

Fig. 4
Fig. 4

Simulated waveguide power as a function of injected current density for the embedded and separated cases. J th increases by 33%, but the slope efficiency is higher.

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