Abstract

We experimentally study the effects of the coupling-induced phase shift (CIPS) in silicon-on-insulator microring-coupled Mach–Zehnder interferometer (MZI) devices for the flat-top filter application. Excellent agreement is obtained between the theoretical modeling and the experiment. It is demonstrated that width offset of the uncoupled MZI arm can compensate the CIPS and approximate a box-like filter with only 0.02% deviation from its ideal requirement.

© 2010 Optical Society of America

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2008 (3)

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 1560 (2008).
[CrossRef]

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 9 (2008).
[CrossRef]

L. Y. M. Tobing, P. Dumon, R. Baets, and M. K. Chin, Opt. Lett. 33, 2512 (2008).
[CrossRef] [PubMed]

2007 (1)

2006 (2)

2005 (1)

2004 (1)

2003 (1)

C. Chung-Yen and L. J. Guo, Appl. Phys. Lett. 83, 1527 (2003).
[CrossRef]

2000 (2)

M. Kohtoku, S. Oku, Y. Kadota, Y. Shibata, and Y. Yoshikuni, IEEE Photon. Technol. Lett. 12, 1174 (2000).
[CrossRef]

P. P. Absil, J. V. Hryniewicz, B. E. Little, R. A. Wilson, L. G. Joneckis, and P.-T. Ho, IEEE Photon. Technol. Lett. 12, 398 (2000).
[CrossRef]

1998 (1)

Absil, P. P.

P. P. Absil, J. V. Hryniewicz, B. E. Little, R. A. Wilson, L. G. Joneckis, and P.-T. Ho, IEEE Photon. Technol. Lett. 12, 398 (2000).
[CrossRef]

Baets, R.

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 1560 (2008).
[CrossRef]

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 9 (2008).
[CrossRef]

L. Y. M. Tobing, P. Dumon, R. Baets, and M. K. Chin, Opt. Lett. 33, 2512 (2008).
[CrossRef] [PubMed]

Boyd, R.

Chin, M. K.

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 9 (2008).
[CrossRef]

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 1560 (2008).
[CrossRef]

L. Y. M. Tobing, P. Dumon, R. Baets, and M. K. Chin, Opt. Lett. 33, 2512 (2008).
[CrossRef] [PubMed]

L. Y. Mario, S. Darmawan, and M. K. Chin, Opt. Express 14, 12770 (2006).
[CrossRef] [PubMed]

Chu, S. T.

Chung-Yen, C.

C. Chung-Yen and L. J. Guo, Appl. Phys. Lett. 83, 1527 (2003).
[CrossRef]

Darmawan, S.

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 1560 (2008).
[CrossRef]

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 9 (2008).
[CrossRef]

L. Y. Mario, S. Darmawan, and M. K. Chin, Opt. Express 14, 12770 (2006).
[CrossRef] [PubMed]

Dumon, P.

L. Y. M. Tobing, P. Dumon, R. Baets, and M. K. Chin, Opt. Lett. 33, 2512 (2008).
[CrossRef] [PubMed]

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 9 (2008).
[CrossRef]

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 1560 (2008).
[CrossRef]

Grover, R.

Guo, L. J.

C. Chung-Yen and L. J. Guo, Appl. Phys. Lett. 83, 1527 (2003).
[CrossRef]

Haus, H. A.

Heebner, J.

Ho, P.

Ho, P. -T.

P. P. Absil, J. V. Hryniewicz, B. E. Little, R. A. Wilson, L. G. Joneckis, and P.-T. Ho, IEEE Photon. Technol. Lett. 12, 398 (2000).
[CrossRef]

Hryniewicz, J. V.

P. P. Absil, J. V. Hryniewicz, B. E. Little, R. A. Wilson, L. G. Joneckis, and P.-T. Ho, IEEE Photon. Technol. Lett. 12, 398 (2000).
[CrossRef]

Joneckis, L. G.

P. P. Absil, J. V. Hryniewicz, B. E. Little, R. A. Wilson, L. G. Joneckis, and P.-T. Ho, IEEE Photon. Technol. Lett. 12, 398 (2000).
[CrossRef]

Kadota, Y.

M. Kohtoku, S. Oku, Y. Kadota, Y. Shibata, and Y. Yoshikuni, IEEE Photon. Technol. Lett. 12, 1174 (2000).
[CrossRef]

Kohtoku, M.

M. Kohtoku, S. Oku, Y. Kadota, Y. Shibata, and Y. Yoshikuni, IEEE Photon. Technol. Lett. 12, 1174 (2000).
[CrossRef]

Landobasa, Y. M.

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 1560 (2008).
[CrossRef]

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 9 (2008).
[CrossRef]

Lepeshkin, N.

Li, X.

Little, B. E.

P. P. Absil, J. V. Hryniewicz, B. E. Little, R. A. Wilson, L. G. Joneckis, and P.-T. Ho, IEEE Photon. Technol. Lett. 12, 398 (2000).
[CrossRef]

B. E. Little, S. T. Chu, and H. A. Haus, Opt. Lett. 23, 894 (1998).
[CrossRef]

Lu, Y.

Manolatou, C.

Mario, L. Y.

Oku, S.

M. Kohtoku, S. Oku, Y. Kadota, Y. Shibata, and Y. Yoshikuni, IEEE Photon. Technol. Lett. 12, 1174 (2000).
[CrossRef]

Poon, A. W.

Popovic, M.

Schweinsberg, A.

Shibata, Y.

M. Kohtoku, S. Oku, Y. Kadota, Y. Shibata, and Y. Yoshikuni, IEEE Photon. Technol. Lett. 12, 1174 (2000).
[CrossRef]

Tobing, L. Y. M.

Wang, P.

Watts, M.

Wicks, G.

Wilson, R. A.

P. P. Absil, J. V. Hryniewicz, B. E. Little, R. A. Wilson, L. G. Joneckis, and P.-T. Ho, IEEE Photon. Technol. Lett. 12, 398 (2000).
[CrossRef]

Yao, J.

Yoshikuni, Y.

M. Kohtoku, S. Oku, Y. Kadota, Y. Shibata, and Y. Yoshikuni, IEEE Photon. Technol. Lett. 12, 1174 (2000).
[CrossRef]

Zhou, L.

Appl. Phys. Lett. (1)

C. Chung-Yen and L. J. Guo, Appl. Phys. Lett. 83, 1527 (2003).
[CrossRef]

IEEE Photon. Technol. Lett. (4)

M. Kohtoku, S. Oku, Y. Kadota, Y. Shibata, and Y. Yoshikuni, IEEE Photon. Technol. Lett. 12, 1174 (2000).
[CrossRef]

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 1560 (2008).
[CrossRef]

S. Darmawan, Y. M. Landobasa, P. Dumon, R. Baets, and M. K. Chin, IEEE Photon. Technol. Lett. 20, 9 (2008).
[CrossRef]

P. P. Absil, J. V. Hryniewicz, B. E. Little, R. A. Wilson, L. G. Joneckis, and P.-T. Ho, IEEE Photon. Technol. Lett. 12, 398 (2000).
[CrossRef]

Opt. Express (2)

Opt. Lett. (5)

Other (1)

www.epixnet.org.

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Figures (4)

Fig. 1
Fig. 1

(a) Fabricated REMZIs based on 3 dB MMI-coupler, with length and width offsets at the lower MZI arm. (b) Schematic representation of MZI devices in the presence of CIPS.

Fig. 2
Fig. 2

Measured (thick-faded) and fitted (solid) cross transmission of balanced arm length REMZI.

Fig. 3
Fig. 3

(a) Superimposed MZI and resonator frequency combs in two different situations. (b) Calculated (solid) and measured (thick-faded) transmissions for three DUTs, with frequency comb situations indicated in DUT2 and DUT3. The peak of MZI envelope (dashed) for each DUT is at (1) 1539.8, (2) 1545.4, and (3) 1533.5 nm.

Fig. 4
Fig. 4

Calculated (dashed) and measured (thick-faded) transmissions of DUT 2 and DUT 3.

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