Abstract

The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant nondestructive method. The technique uses integrated Bragg grating structures, which are observed from opposing launch directions to obtain information about the optical power at different positions along the length of the waveguide. Critically, the technique is ratiometric and independent of coupling loss and grating variability. This high-precision measurement is suitable for low-loss planar waveguides. From this data, the propagation loss of the UV-written waveguides was observed to be $0.235\pm 0.006\mathrm{dB}/\mathrm{cm}$.

© 2010 Optical Society of America

Direct UV written integrated planar waveguides using a 213 nm laser

Paul C. Gow, Rex H. S. Bannerman, Paolo L. Mennea, Christopher Holmes, James C. Gates, and Peter G. R. Smith
Opt. Express 27(20) 29133-29138 (2019)

Direct laser written waveguide-Bragg gratings in bulk fused silica

Graham D. Marshall, Martin Ams, and Michael J. Withford
Opt. Lett. 31(18) 2690-2691 (2006)

Demonstration of UV-written waveguides, Bragg gratings and cavities at 780 nm, and an original experimental measurement of group delay

G. Lepert, M. Trupke, E. A. Hinds, H. Rogers, J. C. Gates, and P. G. R. Smith
Opt. Express 19(25) 24933-24943 (2011)

Direct measurement of propagation losses in silver nanowires

Yaoguang Ma, Xiyuan Li, Huakang Yu, Limin Tong, Ying Gu, and Qihuang Gong
Opt. Lett. 35(8) 1160-1162 (2010)

Planar waveguide tilted Bragg grating refractometer fabricated through physical micromachining and direct UV writing

Christopher Holmes, Lewis G. Carpenter, Helen L. Rogers, Ian J. G. Sparrow, James C. Gates, and Peter G. R. Smith
Opt. Express 19(13) 12462-12468 (2011)