Abstract

We developed an ultrahigh-sensitivity single-photon detector using a linear-mode avalanche photodiode (APD) with a cryogenic low-noise readout circuit; the APD is operated at 78K. The noise-equivalent power of the detector is as low as 2.2×1020W/Hz1/2 at a wavelength of 450nm. The photon-detection efficiency and dark-count rate (DCR) are 0.72 and 0.0008 counts/s, respectively. A low DCR is achieved by thermal treatment for reducing the trapped carriers when the thermal treatment temperature is above 100K.

© 2010 Optical Society of America

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