Abstract

The generation of encryption secret keys with a high level of security is crucial to ensure secure enduring data storage and is a challenging topic of investigation. We show that the use of nano-objects and optical response permits us to produce a complex optical tomography map, which can be used as a pseudorandom generator that satisfies the basic requirements for encryption based on the secret key.

© 2010 Optical Society of America

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References

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2010 (1)

H. Borouchaki, T. Grosges, and D. Barchiesi, Finite Elem. Anal. Des. 46, 84 (2010).
[CrossRef]

2006 (3)

J. Katz and M. Yung, J. Cryptology 19, 67 (2006).
[CrossRef]

N. Chevalier, Y. Sonnefraud, J. F. Motte, S. Huant, and K. Karrai, Rev. Sci. Instrum. 77, 063704 (2006).
[CrossRef]

T. Grosges and D. Barchiesi, Opt. Lett. 31, 3435 (2006).
[CrossRef] [PubMed]

2005 (2)

2003 (1)

2002 (2)

2001 (2)

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

N. Nesci, R. Dändliker, and H. Herzig, Opt. Lett. 26, 208 (2001).
[CrossRef]

2000 (1)

B. Knoll and F. Keilmann, Opt. Commun. 182, 321 (2000).
[CrossRef]

1999 (1)

1995 (3)

F. Zenhausern, Y. Martin, and H. K. Wickramsinghe, Science 269, 1083 (1995).
[CrossRef] [PubMed]

K. Karrai and R. D. Grober, Appl. Phys. Lett. 66,1842 (1995).
[CrossRef]

P. Refregier and B. Javidi, Opt. Lett. 20, 767 (1995).
[CrossRef] [PubMed]

1984 (1)

S. Goldwasser and S. Micali, J. Comput. Syst. Sci. 28, 270 (1984).
[CrossRef]

1948 (1)

C. E. Shannon, Bell Syst. Tech. J. 27, 379, 623 (1948).

Abashin, M.

Adam, P. M.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

Banks, D.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Barchiesi, D.

H. Borouchaki, T. Grosges, and D. Barchiesi, Finite Elem. Anal. Des. 46, 84 (2010).
[CrossRef]

T. Grosges and D. Barchiesi, Opt. Lett. 31, 3435 (2006).
[CrossRef] [PubMed]

Barker, E.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Bijeon, J. L.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

Bonnans, V.

Borouchaki, H.

H. Borouchaki, T. Grosges, and D. Barchiesi, Finite Elem. Anal. Des. 46, 84 (2010).
[CrossRef]

Carminati, R.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

Chevalier, N.

N. Chevalier, Y. Sonnefraud, J. F. Motte, S. Huant, and K. Karrai, Rev. Sci. Instrum. 77, 063704 (2006).
[CrossRef]

Dändliker, R.

Denyer, R.

Dray, J.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Fainman, Y.

Fukaya, T.

Gharbi, T.

Goldwasser, S.

S. Goldwasser and S. Micali, J. Comput. Syst. Sci. 28, 270 (1984).
[CrossRef]

Greffet, J. J.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

Grober, R. D.

K. Karrai and R. D. Grober, Appl. Phys. Lett. 66,1842 (1995).
[CrossRef]

Grosges, T.

H. Borouchaki, T. Grosges, and D. Barchiesi, Finite Elem. Anal. Des. 46, 84 (2010).
[CrossRef]

T. Grosges and D. Barchiesi, Opt. Lett. 31, 3435 (2006).
[CrossRef] [PubMed]

Hara, M.

Heckert, A.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Herzig, H.

Hillenbrand, R.

R. Hillenbrand, T. Taubner, and F. Keilmann, Nature 418, 159 (2002).
[CrossRef] [PubMed]

Huant, S.

N. Chevalier, Y. Sonnefraud, J. F. Motte, S. Huant, and K. Karrai, Rev. Sci. Instrum. 77, 063704 (2006).
[CrossRef]

Hudlet, S.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

Javidi, B.

Karrai, K.

N. Chevalier, Y. Sonnefraud, J. F. Motte, S. Huant, and K. Karrai, Rev. Sci. Instrum. 77, 063704 (2006).
[CrossRef]

K. Karrai and R. D. Grober, Appl. Phys. Lett. 66,1842 (1995).
[CrossRef]

Katz, J.

J. Katz and M. Yung, J. Cryptology 19, 67 (2006).
[CrossRef]

Keilmann, F.

R. Hillenbrand, T. Taubner, and F. Keilmann, Nature 418, 159 (2002).
[CrossRef] [PubMed]

B. Knoll and F. Keilmann, Opt. Commun. 182, 321 (2000).
[CrossRef]

Kim, J.

Knoll, B.

B. Knoll and F. Keilmann, Opt. Commun. 182, 321 (2000).
[CrossRef]

Knoll, W.

Leigh, S.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Levenson, M.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Levy, U.

Liu, Q.

Martin, Y.

F. Zenhausern, Y. Martin, and H. K. Wickramsinghe, Science 269, 1083 (1995).
[CrossRef] [PubMed]

Micali, S.

S. Goldwasser and S. Micali, J. Comput. Syst. Sci. 28, 270 (1984).
[CrossRef]

Micheletto, R.

Ming, H.

Motte, J. F.

N. Chevalier, Y. Sonnefraud, J. F. Motte, S. Huant, and K. Karrai, Rev. Sci. Instrum. 77, 063704 (2006).
[CrossRef]

Mrki, T.

Nakagawa, W.

Nakajima, K.

Nechvatal, J.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Nesci, N.

Offenhauser, A.

Porto, J. A.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

Refregier, P.

Royer, P.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

Rukhin, A.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Salt, M.

Sandoz, P.

Scholl, M.

Shannon, C. E.

C. E. Shannon, Bell Syst. Tech. J. 27, 379, 623 (1948).

Smid, M.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Sonnefraud, Y.

N. Chevalier, Y. Sonnefraud, J. F. Motte, S. Huant, and K. Karrai, Rev. Sci. Instrum. 77, 063704 (2006).
[CrossRef]

Soto, J.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Stashkevitch, A.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

Sun, H.

Taubner, T.

R. Hillenbrand, T. Taubner, and F. Keilmann, Nature 418, 159 (2002).
[CrossRef] [PubMed]

Tominaga, J.

Tortora, P.

Vaccaro, L.

Vangel, M.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Vo, V.

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

Walford, J. N.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

Wickramsinghe, H. K.

F. Zenhausern, Y. Martin, and H. K. Wickramsinghe, Science 269, 1083 (1995).
[CrossRef] [PubMed]

Xie, J.

Yung, M.

J. Katz and M. Yung, J. Cryptology 19, 67 (2006).
[CrossRef]

Zenhausern, F.

F. Zenhausern, Y. Martin, and H. K. Wickramsinghe, Science 269, 1083 (1995).
[CrossRef] [PubMed]

Zheng, Z.

Appl. Opt. (2)

Appl. Phys. Lett. (1)

K. Karrai and R. D. Grober, Appl. Phys. Lett. 66,1842 (1995).
[CrossRef]

Bell Syst. Tech. J. (1)

C. E. Shannon, Bell Syst. Tech. J. 27, 379, 623 (1948).

Chin. Opt. Lett. (1)

Finite Elem. Anal. Des. (1)

H. Borouchaki, T. Grosges, and D. Barchiesi, Finite Elem. Anal. Des. 46, 84 (2010).
[CrossRef]

J. Appl. Phys. (1)

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevitch, and P. Royer, J. Appl. Phys. 89, 5159 (2001).
[CrossRef]

J. Comput. Syst. Sci. (1)

S. Goldwasser and S. Micali, J. Comput. Syst. Sci. 28, 270 (1984).
[CrossRef]

J. Cryptology (1)

J. Katz and M. Yung, J. Cryptology 19, 67 (2006).
[CrossRef]

Nature (1)

R. Hillenbrand, T. Taubner, and F. Keilmann, Nature 418, 159 (2002).
[CrossRef] [PubMed]

Opt. Commun. (1)

B. Knoll and F. Keilmann, Opt. Commun. 182, 321 (2000).
[CrossRef]

Opt. Express (1)

Opt. Lett. (4)

Rev. Sci. Instrum. (1)

N. Chevalier, Y. Sonnefraud, J. F. Motte, S. Huant, and K. Karrai, Rev. Sci. Instrum. 77, 063704 (2006).
[CrossRef]

Science (1)

F. Zenhausern, Y. Martin, and H. K. Wickramsinghe, Science 269, 1083 (1995).
[CrossRef] [PubMed]

Other (1)

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray, and V. Vo, NIST Special Publication 800-22rev1 (National Institute of Standards and Technology, August 2008).

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Figures (2)

Fig. 1
Fig. 1

Generation of the cryptographic map from the tomography map of the near-field optical signal as a function of the scan direction (along the x and y axes) and the altitude (along the z axis) above the nanostructures and substrate, taking into account the interference pattern with the microscope.

Fig. 2
Fig. 2

The encrypted data file is given as a sequence of the exclusive integer.

Equations (1)

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nano-objects ( K S ( 1 ) , K S ( 2 ) ) tomography measurement I ( x , y , z ) M S remeshing & permutations Ψ ( n ) .

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