Abstract

An analytic solution for a magnetic line source imaged through a uniaxially anisotropic slab is derived for electric fields, and example results are supported by finite element simulations. The analytical result provides a convenient means to evaluate the effect of material parameters in applications. We introduce a spectrometer that can be realized by illuminating a slab composed of a Ag/ZnO multilayer stack through a small aperture, and we use this example to evaluate the performance of the analytic model.

© 2010 Optical Society of America

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