Abstract

We report what we believe to be the first highly symmetric first-order IR femtosecond laser fiber Bragg gratings within the telecommunications C band in free-standing optical fiber, fabricated with a relatively low NA lens and without use of oil immersion techniques. This grating features the smallest dimensions for a point-by-point fiber grating reported so far (to our knowledge). This achievement paves the way to rapid mass manufacturing of highly efficient and stable Bragg gratings using ultrafast lasers in any type of fiber. Mastering this femtosecond grating inscription technique also allowed the fabrication of the first Bragg gratings with direct near-IR femtosecond inscription in photonic crystal fibers, and without the use of techniques that rely on the compensation of the holey structure.

© 2010 Optical Society of America

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References

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  1. A. Othonos and K. Kalli, Fiber Bragg Gratings: Fundamentals and Applications in Telecommunications and Sensing (Artech, 1999).
  2. J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
    [CrossRef]
  3. S. J. Mihailov, D. Grobnic, H. Ding, C. W. Smelser, and J. Broeng, IEEE Photon. Technol. Lett. 18, 1837 (2006).
    [CrossRef]
  4. M. Becker, J. Bergmann, S. Brückner, M. Franke, E. Lindner, M. W. Rothhardt, and H. Bartelt, Opt. Express 16, 19169 (2008).
    [CrossRef]
  5. B. Malo, K. O. Hill, F. Bilodeau, D. C. Johnson, and J. Albert, Electron. Lett. 29, 1668 (1993).
    [CrossRef]
  6. Y. Lai, K. Zhou, K. Sugden, and I. Bennion, Opt. Express 15, 18318 (2007).
    [CrossRef] [PubMed]
  7. G. D. Marshall, M. Ams, and M. J. Withford, in PICALO 2006 Conference Proceedings (Laser-Institute of America, 2006), Paper M206.
  8. A. Martinez, M. Dubov, and I. Khrushchev, Electron. Lett. 40, 1170 (2004).
    [CrossRef]
  9. A. Martinez, I. Y. Khrushchev, and I. Bennion, Opt. Lett. 31, 1603 (2006).
    [CrossRef] [PubMed]
  10. E. Wikszak, J. Thomas, S. Klingebiel, B. Orta, J. Limpert, S. Nolte, and A. Tünnermann, Opt. Lett. 31, 2390 (2006).
    [CrossRef] [PubMed]
  11. C. B. Schaffer, A. Brodeur, and E. Mazur, Meas. Sci. Technol. 12, 1784 (2001).
    [CrossRef]
  12. T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
    [CrossRef]
  13. V. Beugin, L. Bigot, P. Niay, M. Lancry, Y. Quiquempois, M. Douay, G. MŽlin, A. Fleureau, S. Lempereur, and L. Gasca, Appl. Opt. 45, 8186 (2006).
    [CrossRef] [PubMed]
  14. T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
    [CrossRef]
  15. G. D. Marshall, D. J. Kan, A. A. Asatryan, L. C. Botten, and M. J. Withford, Opt. Express 15, 7876 (2007).
    [CrossRef] [PubMed]
  16. J. L. Holdsworth, J. Canning, and C. Dewhurst, Proc. SPIE 7004, 1 (2008).

2009 (1)

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

2008 (4)

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

J. L. Holdsworth, J. Canning, and C. Dewhurst, Proc. SPIE 7004, 1 (2008).

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

M. Becker, J. Bergmann, S. Brückner, M. Franke, E. Lindner, M. W. Rothhardt, and H. Bartelt, Opt. Express 16, 19169 (2008).
[CrossRef]

2007 (2)

2006 (4)

2004 (1)

A. Martinez, M. Dubov, and I. Khrushchev, Electron. Lett. 40, 1170 (2004).
[CrossRef]

2001 (1)

C. B. Schaffer, A. Brodeur, and E. Mazur, Meas. Sci. Technol. 12, 1784 (2001).
[CrossRef]

1993 (1)

B. Malo, K. O. Hill, F. Bilodeau, D. C. Johnson, and J. Albert, Electron. Lett. 29, 1668 (1993).
[CrossRef]

Albert, J.

B. Malo, K. O. Hill, F. Bilodeau, D. C. Johnson, and J. Albert, Electron. Lett. 29, 1668 (1993).
[CrossRef]

Ams, M.

G. D. Marshall, M. Ams, and M. J. Withford, in PICALO 2006 Conference Proceedings (Laser-Institute of America, 2006), Paper M206.

Asatryan, A. A.

Bandyopadhyay, S.

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

Bartelt, H.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

M. Becker, J. Bergmann, S. Brückner, M. Franke, E. Lindner, M. W. Rothhardt, and H. Bartelt, Opt. Express 16, 19169 (2008).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Becker, M.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

M. Becker, J. Bergmann, S. Brückner, M. Franke, E. Lindner, M. W. Rothhardt, and H. Bartelt, Opt. Express 16, 19169 (2008).
[CrossRef]

Bennion, I.

Berghmans, F.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Bergmann, J.

Beugin, V.

Bigot, L.

Bilodeau, F.

B. Malo, K. O. Hill, F. Bilodeau, D. C. Johnson, and J. Albert, Electron. Lett. 29, 1668 (1993).
[CrossRef]

Botten, L. C.

Brodeur, A.

C. B. Schaffer, A. Brodeur, and E. Mazur, Meas. Sci. Technol. 12, 1784 (2001).
[CrossRef]

Broeng, J.

S. J. Mihailov, D. Grobnic, H. Ding, C. W. Smelser, and J. Broeng, IEEE Photon. Technol. Lett. 18, 1837 (2006).
[CrossRef]

Brückner, S.

Canning, J.

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

J. L. Holdsworth, J. Canning, and C. Dewhurst, Proc. SPIE 7004, 1 (2008).

Chah, K.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Cook, K.

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

De Waele, W.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

Degrieck, J.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

Dewhurst, C.

J. L. Holdsworth, J. Canning, and C. Dewhurst, Proc. SPIE 7004, 1 (2008).

Ding, H.

S. J. Mihailov, D. Grobnic, H. Ding, C. W. Smelser, and J. Broeng, IEEE Photon. Technol. Lett. 18, 1837 (2006).
[CrossRef]

Douay, M.

Dubov, M.

A. Martinez, M. Dubov, and I. Khrushchev, Electron. Lett. 40, 1170 (2004).
[CrossRef]

Fleureau, A.

Franke, M.

Gasca, L.

Geernaert, T.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Grobnic, D.

S. J. Mihailov, D. Grobnic, H. Ding, C. W. Smelser, and J. Broeng, IEEE Photon. Technol. Lett. 18, 1837 (2006).
[CrossRef]

Groothoff, N.

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

Hill, K. O.

B. Malo, K. O. Hill, F. Bilodeau, D. C. Johnson, and J. Albert, Electron. Lett. 29, 1668 (1993).
[CrossRef]

Holdsworth, J.

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

Holdsworth, J. L.

J. L. Holdsworth, J. Canning, and C. Dewhurst, Proc. SPIE 7004, 1 (2008).

Johnson, D. C.

B. Malo, K. O. Hill, F. Bilodeau, D. C. Johnson, and J. Albert, Electron. Lett. 29, 1668 (1993).
[CrossRef]

Kalli, K.

A. Othonos and K. Kalli, Fiber Bragg Gratings: Fundamentals and Applications in Telecommunications and Sensing (Artech, 1999).

Kan, D. J.

Khrushchev, I.

A. Martinez, M. Dubov, and I. Khrushchev, Electron. Lett. 40, 1170 (2004).
[CrossRef]

Khrushchev, I. Y.

Klingebiel, S.

Lai, Y.

Lancry, M.

Lempereur, S.

Limpert, J.

Lindner, E.

Luyckx, G.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

Malo, B.

B. Malo, K. O. Hill, F. Bilodeau, D. C. Johnson, and J. Albert, Electron. Lett. 29, 1668 (1993).
[CrossRef]

Marshall, G. D.

G. D. Marshall, D. J. Kan, A. A. Asatryan, L. C. Botten, and M. J. Withford, Opt. Express 15, 7876 (2007).
[CrossRef] [PubMed]

G. D. Marshall, M. Ams, and M. J. Withford, in PICALO 2006 Conference Proceedings (Laser-Institute of America, 2006), Paper M206.

Martelli, C.

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

Martinez, A.

A. Martinez, I. Y. Khrushchev, and I. Bennion, Opt. Lett. 31, 1603 (2006).
[CrossRef] [PubMed]

A. Martinez, M. Dubov, and I. Khrushchev, Electron. Lett. 40, 1170 (2004).
[CrossRef]

Mazur, E.

C. B. Schaffer, A. Brodeur, and E. Mazur, Meas. Sci. Technol. 12, 1784 (2001).
[CrossRef]

Mihailov, S. J.

S. J. Mihailov, D. Grobnic, H. Ding, C. W. Smelser, and J. Broeng, IEEE Photon. Technol. Lett. 18, 1837 (2006).
[CrossRef]

MŽlin, G.

Nasilowski, T.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Niay, P.

Nolte, S.

Olszewski, J.

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Orta, B.

Othonos, A.

A. Othonos and K. Kalli, Fiber Bragg Gratings: Fundamentals and Applications in Telecommunications and Sensing (Artech, 1999).

Pohl, A.

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

Poturaj, K.

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Quiquempois, Y.

Rothhardt, M.

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Rothhardt, M. W.

Schaffer, C. B.

C. B. Schaffer, A. Brodeur, and E. Mazur, Meas. Sci. Technol. 12, 1784 (2001).
[CrossRef]

Smelser, C. W.

S. J. Mihailov, D. Grobnic, H. Ding, C. W. Smelser, and J. Broeng, IEEE Photon. Technol. Lett. 18, 1837 (2006).
[CrossRef]

Statkiewicz, G.

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Stevenson, M.

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

Sugden, K.

Szpulak, M.

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Terryn, H.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

Thienpont, H.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Thomas, J.

Tünnermann, A.

Urbanczyk, W.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Voet, E.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

Wikszak, E.

Withford, M. J.

G. D. Marshall, D. J. Kan, A. A. Asatryan, L. C. Botten, and M. J. Withford, Opt. Express 15, 7876 (2007).
[CrossRef] [PubMed]

G. D. Marshall, M. Ams, and M. J. Withford, in PICALO 2006 Conference Proceedings (Laser-Institute of America, 2006), Paper M206.

Wojcik, J.

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

Zhou, K.

Appl. Opt. (1)

Electron. Lett. (2)

B. Malo, K. O. Hill, F. Bilodeau, D. C. Johnson, and J. Albert, Electron. Lett. 29, 1668 (1993).
[CrossRef]

A. Martinez, M. Dubov, and I. Khrushchev, Electron. Lett. 40, 1170 (2004).
[CrossRef]

IEEE Photon. Technol. Lett. (3)

S. J. Mihailov, D. Grobnic, H. Ding, C. W. Smelser, and J. Broeng, IEEE Photon. Technol. Lett. 18, 1837 (2006).
[CrossRef]

T. Geernaert, T. Nasilowski, K. Chah, M. Szpulak, J. Olszewski, G. Statkiewicz, J. Wojcik, K. Poturaj, W. Urbanczyk, M. Becker, M. Rothhardt, H. Bartelt, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 20, 554 (2008).
[CrossRef]

T. Geernaert, G. Luyckx, E. Voet, T. Nasilowski, K. Chah, M. Becker, H. Bartelt, W. Urbanczyk, J. Wojcik, W. De Waele, J. Degrieck, H. Terryn, F. Berghmans, and H. Thienpont, IEEE Photon. Technol. Lett. 21, 6 (2009).
[CrossRef]

Laser Chem. (1)

J. Canning, N. Groothoff, K. Cook, C. Martelli, A. Pohl, J. Holdsworth, S. Bandyopadhyay, and M. Stevenson, Laser Chem. 2008, 239417 (2008).
[CrossRef]

Meas. Sci. Technol. (1)

C. B. Schaffer, A. Brodeur, and E. Mazur, Meas. Sci. Technol. 12, 1784 (2001).
[CrossRef]

Opt. Express (3)

Opt. Lett. (2)

Proc. SPIE (1)

J. L. Holdsworth, J. Canning, and C. Dewhurst, Proc. SPIE 7004, 1 (2008).

Other (2)

G. D. Marshall, M. Ams, and M. J. Withford, in PICALO 2006 Conference Proceedings (Laser-Institute of America, 2006), Paper M206.

A. Othonos and K. Kalli, Fiber Bragg Gratings: Fundamentals and Applications in Telecommunications and Sensing (Artech, 1999).

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Figures (4)

Fig. 1
Fig. 1

Simplified scheme of the experimental setup. Femtosecond laser light ( 1035 nm ) is focused with a microscope objective into the optical fiber core. (Bottom center) Microscope image of a second-order FBG in a conventional step-index fiber with a grating period of 1078 nm . The inscribed grating structure is smaller than the core diameter.

Fig. 2
Fig. 2

Left, transmission spectrum of a femtosecond point-by-point first- and second-order FBG in a conventional step-index fiber. Right, Bragg resonance of the first-order grating shows high spectral symmetry in reflection and transmission.

Fig. 3
Fig. 3

Left, microscope image showing a FBG in the microstructure of the PCF. Right, scanning electron micrograph of the highly birefringent PCF. The microstructure contains a 7 mol % Ge O 2 -doped region in the center of the microstructure.

Fig. 4
Fig. 4

Left, transmission spectrum of the FBG in the studied PCF. Right, wavelength shift versus temperature in PCF.

Metrics