Abstract

We present a compact optical circular-polarization-splitting common-path interferometer based on a zero-twist liquid-crystal display (LCD). A blazed diffraction grating is encoded onto the LCD. The optical system produces a reference beam that has one sense of circularly polarized light, while the diffracted beam has the opposite sense of circularly polarized light. Using a linear polarizer, these two beams form an interferogram that can be used to analyze optically active media. Experimental results are provided showing the detection of left-handed-rotary and right-handed-rotary media.

© 2009 Optical Society of America

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References

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  1. P.K.Rastogi, ed., Optical Measurement Techniques and Applications (Artech House, 1997).
  2. S. Mallik, in Optical Shop Testing, D.Malacara, ed. (Wiley, 1992), Chap. 3.
  3. V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
    [CrossRef]
  4. G. Rodríguez-Zurita, C. Meneses-Fabian, N.-I. Toto-Arellano, J. F. Vázquez-Castillo, and C. Robledo-Sánchez, Opt. Express 16, 7806 (2008).
    [CrossRef] [PubMed]
  5. C. Zhao, D. Kang, and J. H. Burge, Appl. Opt. 44, 7548 (2005).
    [CrossRef] [PubMed]
  6. J. B. Bentley, J. A. Davis, M. A. Bandres, and J. C. Gutiérrez-Vega, Opt. Lett. 31, 649 (2006).
    [CrossRef] [PubMed]
  7. J. E. Bentley, J. A. Davis, J. Albero, and I. Moreno, Appl. Opt. 45, 7791 (2006).
    [CrossRef] [PubMed]
  8. I. Moreno, J. A. Davis, F. A. Klein, and M. J. Mitra, Appl. Opt. 47, 1797 (2008).
    [CrossRef] [PubMed]
  9. J. A. Davis, D. E. McNamara, D. M. Cottrell, and T. Sonehara, Appl. Opt. 39, 1549 (2000).
    [CrossRef]
  10. J. A. Davis, J. Adachi, C. R. Fernández-Pousa, and I. Moreno, Opt. Lett. 26, 587 (2001).
    [CrossRef]
  11. G. Jin, N. Bao, and P. S. Chung, Opt. Eng. 33, 2733 (1994).
    [CrossRef]
  12. T. Nakata and M. Watanabe, Opt. Rev. 15, 276 (2008).
    [CrossRef]
  13. J. A. Davis, P. Tsai, D. M. Cottrell, T. Sonehara, and J. Amako, Opt. Eng. 38, 1051 (1999).
    [CrossRef]

2008 (3)

2007 (1)

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[CrossRef]

2006 (2)

2005 (1)

2001 (1)

2000 (1)

1999 (1)

J. A. Davis, P. Tsai, D. M. Cottrell, T. Sonehara, and J. Amako, Opt. Eng. 38, 1051 (1999).
[CrossRef]

1994 (1)

G. Jin, N. Bao, and P. S. Chung, Opt. Eng. 33, 2733 (1994).
[CrossRef]

Adachi, J.

Albero, J.

Amako, J.

J. A. Davis, P. Tsai, D. M. Cottrell, T. Sonehara, and J. Amako, Opt. Eng. 38, 1051 (1999).
[CrossRef]

Bandres, M. A.

Bao, N.

G. Jin, N. Bao, and P. S. Chung, Opt. Eng. 33, 2733 (1994).
[CrossRef]

Bentley, J. B.

Bentley, J. E.

Burge, J. H.

Chung, P. S.

G. Jin, N. Bao, and P. S. Chung, Opt. Eng. 33, 2733 (1994).
[CrossRef]

Cottrell, D. M.

J. A. Davis, D. E. McNamara, D. M. Cottrell, and T. Sonehara, Appl. Opt. 39, 1549 (2000).
[CrossRef]

J. A. Davis, P. Tsai, D. M. Cottrell, T. Sonehara, and J. Amako, Opt. Eng. 38, 1051 (1999).
[CrossRef]

Davis, J. A.

Fernández-Pousa, C. R.

Gutiérrez-Vega, J. C.

Habraken, S.

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[CrossRef]

Jin, G.

G. Jin, N. Bao, and P. S. Chung, Opt. Eng. 33, 2733 (1994).
[CrossRef]

Kang, D.

Klein, F. A.

Lion, Y.

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[CrossRef]

Mallik, S.

S. Mallik, in Optical Shop Testing, D.Malacara, ed. (Wiley, 1992), Chap. 3.

McNamara, D. E.

Meneses-Fabian, C.

Michel, F.

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[CrossRef]

Mitra, M. J.

Moreau, V.

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[CrossRef]

Moreno, I.

Nakata, T.

T. Nakata and M. Watanabe, Opt. Rev. 15, 276 (2008).
[CrossRef]

Renotte, Y.

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[CrossRef]

Robledo-Sánchez, C.

Rodríguez-Zurita, G.

Rosso, V.

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[CrossRef]

Sonehara, T.

J. A. Davis, D. E. McNamara, D. M. Cottrell, and T. Sonehara, Appl. Opt. 39, 1549 (2000).
[CrossRef]

J. A. Davis, P. Tsai, D. M. Cottrell, T. Sonehara, and J. Amako, Opt. Eng. 38, 1051 (1999).
[CrossRef]

Tilkens, B.

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[CrossRef]

Toto-Arellano, N.-I.

Tsai, P.

J. A. Davis, P. Tsai, D. M. Cottrell, T. Sonehara, and J. Amako, Opt. Eng. 38, 1051 (1999).
[CrossRef]

Vázquez-Castillo, J. F.

Watanabe, M.

T. Nakata and M. Watanabe, Opt. Rev. 15, 276 (2008).
[CrossRef]

Zhao, C.

Appl. Opt. (4)

Opt. Eng. (3)

J. A. Davis, P. Tsai, D. M. Cottrell, T. Sonehara, and J. Amako, Opt. Eng. 38, 1051 (1999).
[CrossRef]

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[CrossRef]

G. Jin, N. Bao, and P. S. Chung, Opt. Eng. 33, 2733 (1994).
[CrossRef]

Opt. Express (1)

Opt. Lett. (2)

Opt. Rev. (1)

T. Nakata and M. Watanabe, Opt. Rev. 15, 276 (2008).
[CrossRef]

Other (2)

P.K.Rastogi, ed., Optical Measurement Techniques and Applications (Artech House, 1997).

S. Mallik, in Optical Shop Testing, D.Malacara, ed. (Wiley, 1992), Chap. 3.

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Figures (4)

Fig. 1
Fig. 1

Schematic of optical system. Here the linear polarizers are denoted LP1 and LP2, while the quarter-wave plates are denoted QWP1 and QWP2. The LCD is placed between the wave plates, while the sample is inserted between QWP2 and LP2.

Fig. 2
Fig. 2

Interference patterns when the analyzer is rotated: (a) α = 0 ° , (b) α = 45 ° , (c) α = 90 ° .

Fig. 3
Fig. 3

Interference patterns: (a) without active media; (b), (c) with sucrose sugar solution introduced into the left-hand part, 1 and 2 cm thick, respectively.

Fig. 4
Fig. 4

Interference patterns: (a) without active media; (b), (c) with fructose sugar solution introduced into the left-hand part, 1 and 2 cm thick, respectively.

Equations (4)

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R ( φ 2 ) = i e i φ 2 ( cos ( φ 2 ) sin ( φ 2 ) sin ( φ 2 ) cos ( φ 2 ) ) .
R ( φ 2 ) = i { 1 2 ( 1 + i i 1 ) + e i φ 1 2 ( 1 i + i 1 ) } = i { P L + e i φ P R } .
J = P ( α ) R ( θ ) R ( φ 2 ) ( 1 0 ) = i 2 { e i α + e i ( φ + 2 θ + α ) } ( cos ( α ) sin ( α ) ) .
I = 1 2 [ 1 + cos ( γ x + 2 θ + 2 α ) ] .

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