Abstract

What we believe to be a new technique for the generation of white-light Haidinger’s-type fringes using a cyclic path optical configuration is presented. Differences of the fringes with common Haidinger fringes have been discussed, and the result obtained with a white-light source is presented.

© 2009 Optical Society of America

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References

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  1. C. V. Raman and V. S. Rajagopalon, J. Opt. Soc. Am. 29, 413 (1939).
    [CrossRef]
  2. M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, 1989), Chap. 7, p. 281.
  3. F. K. Bauchwitz and D. Shoenbebg, Nature 156, 142 (1945).
    [CrossRef]
  4. M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, 1989), Chap. 7, p. 300.
  5. M. V. Mantravadi and D. Malacara, Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 1, p. 35.
  6. J. B. Song, H. Y. Lee, Y. W. Lee, and I. W. Lee, Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, J.C.Wyant and H.Wang, eds. (SPIE, 2008).
    [PubMed]
  7. R. E. Parks, L. Shao, A. D. Devis, and C. J. Evans, Proc. SPIE 4344, 496 (2001).
    [CrossRef]
  8. E. A. de Oliveira and J. Frejlich, Appl. Opt. 28, 1382 (1989).
    [CrossRef] [PubMed]
  9. R. P. Shukla, D. V. Udupa, N. C. Das, and M. V. Mantravadi, Opt. Laser Technol. 38, 552 (2006).
    [CrossRef]

2006 (1)

R. P. Shukla, D. V. Udupa, N. C. Das, and M. V. Mantravadi, Opt. Laser Technol. 38, 552 (2006).
[CrossRef]

2001 (1)

R. E. Parks, L. Shao, A. D. Devis, and C. J. Evans, Proc. SPIE 4344, 496 (2001).
[CrossRef]

1989 (1)

1945 (1)

F. K. Bauchwitz and D. Shoenbebg, Nature 156, 142 (1945).
[CrossRef]

1939 (1)

Bauchwitz, F. K.

F. K. Bauchwitz and D. Shoenbebg, Nature 156, 142 (1945).
[CrossRef]

Born, M.

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, 1989), Chap. 7, p. 300.

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, 1989), Chap. 7, p. 281.

Das, N. C.

R. P. Shukla, D. V. Udupa, N. C. Das, and M. V. Mantravadi, Opt. Laser Technol. 38, 552 (2006).
[CrossRef]

de Oliveira, E. A.

Devis, A. D.

R. E. Parks, L. Shao, A. D. Devis, and C. J. Evans, Proc. SPIE 4344, 496 (2001).
[CrossRef]

Evans, C. J.

R. E. Parks, L. Shao, A. D. Devis, and C. J. Evans, Proc. SPIE 4344, 496 (2001).
[CrossRef]

Frejlich, J.

Lee, H. Y.

J. B. Song, H. Y. Lee, Y. W. Lee, and I. W. Lee, Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, J.C.Wyant and H.Wang, eds. (SPIE, 2008).
[PubMed]

Lee, I. W.

J. B. Song, H. Y. Lee, Y. W. Lee, and I. W. Lee, Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, J.C.Wyant and H.Wang, eds. (SPIE, 2008).
[PubMed]

Lee, Y. W.

J. B. Song, H. Y. Lee, Y. W. Lee, and I. W. Lee, Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, J.C.Wyant and H.Wang, eds. (SPIE, 2008).
[PubMed]

Malacara, D.

M. V. Mantravadi and D. Malacara, Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 1, p. 35.

Mantravadi, M. V.

R. P. Shukla, D. V. Udupa, N. C. Das, and M. V. Mantravadi, Opt. Laser Technol. 38, 552 (2006).
[CrossRef]

M. V. Mantravadi and D. Malacara, Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 1, p. 35.

Parks, R. E.

R. E. Parks, L. Shao, A. D. Devis, and C. J. Evans, Proc. SPIE 4344, 496 (2001).
[CrossRef]

Rajagopalon, V. S.

Raman, C. V.

Shao, L.

R. E. Parks, L. Shao, A. D. Devis, and C. J. Evans, Proc. SPIE 4344, 496 (2001).
[CrossRef]

Shoenbebg, D.

F. K. Bauchwitz and D. Shoenbebg, Nature 156, 142 (1945).
[CrossRef]

Shukla, R. P.

R. P. Shukla, D. V. Udupa, N. C. Das, and M. V. Mantravadi, Opt. Laser Technol. 38, 552 (2006).
[CrossRef]

Song, J. B.

J. B. Song, H. Y. Lee, Y. W. Lee, and I. W. Lee, Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, J.C.Wyant and H.Wang, eds. (SPIE, 2008).
[PubMed]

Udupa, D. V.

R. P. Shukla, D. V. Udupa, N. C. Das, and M. V. Mantravadi, Opt. Laser Technol. 38, 552 (2006).
[CrossRef]

Wolf, E.

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, 1989), Chap. 7, p. 281.

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, 1989), Chap. 7, p. 300.

Appl. Opt. (1)

J. Opt. Soc. Am. (1)

Nature (1)

F. K. Bauchwitz and D. Shoenbebg, Nature 156, 142 (1945).
[CrossRef]

Opt. Laser Technol. (1)

R. P. Shukla, D. V. Udupa, N. C. Das, and M. V. Mantravadi, Opt. Laser Technol. 38, 552 (2006).
[CrossRef]

Proc. SPIE (1)

R. E. Parks, L. Shao, A. D. Devis, and C. J. Evans, Proc. SPIE 4344, 496 (2001).
[CrossRef]

Other (4)

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, 1989), Chap. 7, p. 281.

M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, 1989), Chap. 7, p. 300.

M. V. Mantravadi and D. Malacara, Optical Shop Testing, 3rd ed., D.Malacara, ed. (Wiley, 2007), Chap. 1, p. 35.

J. B. Song, H. Y. Lee, Y. W. Lee, and I. W. Lee, Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, J.C.Wyant and H.Wang, eds. (SPIE, 2008).
[PubMed]

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Figures (4)

Fig. 1
Fig. 1

Optical schematic of the CPOC-based setup for the generation of white-light HF/FEI.

Fig. 2
Fig. 2

Variation of Δ with x for different values of s ( D = 500 mm ) .

Fig. 3
Fig. 3

White-light fringes obtained with the setup shown in Fig. 1.

Fig. 4
Fig. 4

Spectral intensity distribution of the broadband source (Halogen lamp).

Equations (2)

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Δ = { [ S 2 x ] + [ s ] [ S 1 x ] } .
Δ = s { [ ( D + s ) 2 + x 2 ] ( D 2 + x 2 ) } ,

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