Abstract

We present the design, fabrication, and characterization of an ultracompact silicon-on-insulator-based echelle grating triplexer. It is based on the cross-order design, which utilizes different diffraction orders to cover a large spectral range from $1.3\text{to}1.5\mu \mathrm{m}$ with three channels located at 1310, 1490, and $1550\mathrm{nm}$ and with a footprint of $150\mu \mathrm{m}\times 130\mu \mathrm{m}$.

© 2009 Optical Society of America

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