Abstract

A new beam-shaping device was realized by an abrupt taper with a length of 700μm and a waist of 40μm. The insertion loss of the device is less than 3%. The diameter of the flat beam top can be up to 900μm with a small intensity variation (4%) and a small half-divergence angle (2.5°). The conversion efficiency of the new device from a Gaussian-shaped to a flat-top profile is comparable with that of a long-period-gratings-based device, while keeping the fabrication cost low. The new device requires only a fusion splicer and standard SMF-28 fiber, eliminating the need for photolithographic procedures. The new device also has no obvious incident light polarization dependence.

© 2009 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. Y. Matsuura, M. Miyagi, A. German, L. Nagli, and A. Katzir, Opt. Lett. 22, 1308 (1997).
    [CrossRef]
  2. J. R. Hayes, J. C. Flanagan, T. M. Monro, D. J. Richardson, P. Grunewald, and R. Allott, Opt. Express 14, 10345 (2006).
    [CrossRef] [PubMed]
  3. D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
    [CrossRef]
  4. Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
    [CrossRef]
  5. X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
    [CrossRef]
  6. Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
    [CrossRef]
  7. Z. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).
    [CrossRef] [PubMed]
  8. Z. Tian and S. S-H. Yam, “In-line abrupt taper optical fiber Mach-Zehnder interferometric strain sensor,” IEEE Photon. Technol. Lett. (to be published).

2008 (3)

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).
[CrossRef] [PubMed]

2006 (1)

1997 (1)

1996 (1)

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

1995 (1)

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Allott, R.

Barnes, J.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Bock, W.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Flanagan, J. C.

Fraser, J. M.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

German, A.

Greig, P.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Grunewald, P.

Gu, X.

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Hall, D. R.

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Harrington, J. A.

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

Hayes, J. R.

Jones, J. D. C.

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Katzir, A.

Loock, H. P.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).
[CrossRef] [PubMed]

Matsuura, K.

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

Matsuura, Y.

Y. Matsuura, M. Miyagi, A. German, L. Nagli, and A. Katzir, Opt. Lett. 22, 1308 (1997).
[CrossRef]

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

Miyagi, M.

Mohammed, W.

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Monro, T. M.

Nagli, L.

Oleschuk, R. D.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Qian, L.

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Rabii, C. D.

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

Richardson, D. J.

Smith, P. W. E.

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Somkuarnpaint, S.

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Su, D.

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Tian, Z.

Z. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).
[CrossRef] [PubMed]

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Z. Tian and S. S-H. Yam, “In-line abrupt taper optical fiber Mach-Zehnder interferometric strain sensor,” IEEE Photon. Technol. Lett. (to be published).

Yam, S. S-H.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).
[CrossRef] [PubMed]

Z. Tian and S. S-H. Yam, “In-line abrupt taper optical fiber Mach-Zehnder interferometric strain sensor,” IEEE Photon. Technol. Lett. (to be published).

Electron. Lett. (1)

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

IEEE Photon. Technol. Lett. (2)

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Opt. Commun. (1)

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Opt. Express (1)

Opt. Lett. (2)

Other (1)

Z. Tian and S. S-H. Yam, “In-line abrupt taper optical fiber Mach-Zehnder interferometric strain sensor,” IEEE Photon. Technol. Lett. (to be published).

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Beam shaping using the abrupt taper.

Fig. 2
Fig. 2

Photograph of a 3 dB attenuation abrupt taper.

Fig. 3
Fig. 3

Energy distribution observed on the camera ( L b = 12 mm ) : (a) λ = 1570.1 nm , (b) λ = 1589 nm .

Fig. 4
Fig. 4

Beam profiles with the abrupt taper (A) and with the SMF only (F) measured at different lengths ( L b = 7 mm and 12 mm ): (a) 1570.1 nm , (b) 1589 nm (the points in different curves with the same relative power level have different actual power levels; each curve is normalized with its own peak value).

Tables (1)

Tables Icon

Table 1 Performance of the Abrupt Taper Beam-Shaping Device

Metrics