Abstract

A new beam-shaping device was realized by an abrupt taper with a length of 700μm and a waist of 40μm. The insertion loss of the device is less than 3%. The diameter of the flat beam top can be up to 900μm with a small intensity variation (4%) and a small half-divergence angle (2.5°). The conversion efficiency of the new device from a Gaussian-shaped to a flat-top profile is comparable with that of a long-period-gratings-based device, while keeping the fabrication cost low. The new device requires only a fusion splicer and standard SMF-28 fiber, eliminating the need for photolithographic procedures. The new device also has no obvious incident light polarization dependence.

© 2009 Optical Society of America

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References

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2008

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).
[CrossRef] [PubMed]

2006

1997

1996

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

1995

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Allott, R.

Barnes, J.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Bock, W.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Flanagan, J. C.

Fraser, J. M.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

German, A.

Greig, P.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Grunewald, P.

Gu, X.

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Hall, D. R.

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Harrington, J. A.

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

Hayes, J. R.

Jones, J. D. C.

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Katzir, A.

Loock, H. P.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).
[CrossRef] [PubMed]

Matsuura, K.

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

Matsuura, Y.

Y. Matsuura, M. Miyagi, A. German, L. Nagli, and A. Katzir, Opt. Lett. 22, 1308 (1997).
[CrossRef]

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

Miyagi, M.

Mohammed, W.

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Monro, T. M.

Nagli, L.

Oleschuk, R. D.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Qian, L.

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Rabii, C. D.

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

Richardson, D. J.

Smith, P. W. E.

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Somkuarnpaint, S.

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Su, D.

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Tian, Z.

Z. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).
[CrossRef] [PubMed]

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Z. Tian and S. S-H. Yam, “In-line abrupt taper optical fiber Mach-Zehnder interferometric strain sensor,” IEEE Photon. Technol. Lett. (to be published).

Yam, S. S-H.

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, and H. P. Loock, Opt. Lett. 33, 1105 (2008).
[CrossRef] [PubMed]

Z. Tian and S. S-H. Yam, “In-line abrupt taper optical fiber Mach-Zehnder interferometric strain sensor,” IEEE Photon. Technol. Lett. (to be published).

Electron. Lett.

Y. Matsuura, C. D. Rabii, K. Matsuura, and J. A. Harrington, Electron. Lett. 32, 1096 (1996).
[CrossRef]

IEEE Photon. Technol. Lett.

X. Gu, W. Mohammed, L. Qian, and P. W. E. Smith, IEEE Photon. Technol. Lett. 20, 1130 (2008).
[CrossRef]

Z. Tian, S. S-H. Yam, J. Barnes, W. Bock, P. Greig, J. M. Fraser, H. P. Loock, and R. D. Oleschuk, IEEE Photon. Technol. Lett. 20, 626 (2008).
[CrossRef]

Opt. Commun.

D. Su, S. Somkuarnpaint, D. R. Hall, and J. D. C. Jones, Opt. Commun. 114, 255 (1995).
[CrossRef]

Opt. Express

Opt. Lett.

Other

Z. Tian and S. S-H. Yam, “In-line abrupt taper optical fiber Mach-Zehnder interferometric strain sensor,” IEEE Photon. Technol. Lett. (to be published).

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Figures (4)

Fig. 1
Fig. 1

Beam shaping using the abrupt taper.

Fig. 2
Fig. 2

Photograph of a 3 dB attenuation abrupt taper.

Fig. 3
Fig. 3

Energy distribution observed on the camera ( L b = 12 mm ) : (a) λ = 1570.1 nm , (b) λ = 1589 nm .

Fig. 4
Fig. 4

Beam profiles with the abrupt taper (A) and with the SMF only (F) measured at different lengths ( L b = 7 mm and 12 mm ): (a) 1570.1 nm , (b) 1589 nm (the points in different curves with the same relative power level have different actual power levels; each curve is normalized with its own peak value).

Tables (1)

Tables Icon

Table 1 Performance of the Abrupt Taper Beam-Shaping Device

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