Abstract

We report the observation of Bessel-like beams from periodic patterns induced on viscoelastic polymer surfaces by electric field. The patterns resembling a microaxicon array originate from electrohydrodynamic instabilities in polymer films, where the feature dimensions can be easily controlled. The output beam characteristics from these patterns revealed characteristic traits of Bessel beams.

© 2009 Optical Society of America

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2009 (1)

N. Arun, A. Sharma, P. S. G. Pattader, I. Banerjee, H. M. Dixit, and K. S. Narayan, Phys. Rev. Lett. 102, 254502 (2009).
[CrossRef] [PubMed]

2008 (1)

2006 (1)

2005 (4)

R. Verma, A. Sharma, K. Kargupta, and J. Bhaumik, Langmuir 21, 3710 (2005).
[CrossRef] [PubMed]

K. A. Leach, Z. Lin, and T. P. Russell, Macromolecules 38, 4868 (2005).
[CrossRef]

W. C. Cheong, B. P. S. Ahluwalia, X. Yuan, L. Zhang, H. Wang, H. B. Niu, and X. Peng, Appl. Phys. Lett. 87, 024104 (2005).
[CrossRef]

D. McGloin and K. Dholakia, Contemp. Phys. 46, 15 (2005).
[CrossRef]

2004 (2)

2003 (1)

T. Grosjean, D. Courjon, and D. V. Labeke, J. Microsc. 210, 319 (2003).
[CrossRef] [PubMed]

2001 (1)

E. Schaffer, T. Thurn-Albrecht, T. P. Russell, and U. Steiner, Europhys. Lett. 54, 518 (2001).
[CrossRef]

2000 (2)

1997 (1)

R. Grunwald, S. Woggon, R. Ehlert, and W. Reinecke, Pure Appl. Opt. 6, 663 (1997).
[CrossRef]

1992 (1)

1987 (1)

J. Durnin, J. J. Miceli, Jr., and J. H. Eberly, Phys. Rev. Lett. 58, 1499 (1987).
[CrossRef] [PubMed]

1954 (1)

Ahluwalia, B. P. S.

W. C. Cheong, B. P. S. Ahluwalia, X. Yuan, L. Zhang, H. Wang, H. B. Niu, and X. Peng, Appl. Phys. Lett. 87, 024104 (2005).
[CrossRef]

Arimoto, R.

Arun, N.

N. Arun, A. Sharma, P. S. G. Pattader, I. Banerjee, H. M. Dixit, and K. S. Narayan, Phys. Rev. Lett. 102, 254502 (2009).
[CrossRef] [PubMed]

Banerjee, I.

N. Arun, A. Sharma, P. S. G. Pattader, I. Banerjee, H. M. Dixit, and K. S. Narayan, Phys. Rev. Lett. 102, 254502 (2009).
[CrossRef] [PubMed]

Bhaumik, J.

R. Verma, A. Sharma, K. Kargupta, and J. Bhaumik, Langmuir 21, 3710 (2005).
[CrossRef] [PubMed]

Brzobohaty, O.

Burvall, A.

Cheong, W. C.

W. C. Cheong, B. P. S. Ahluwalia, X. Yuan, L. Zhang, H. Wang, H. B. Niu, and X. Peng, Appl. Phys. Lett. 87, 024104 (2005).
[CrossRef]

Cizmar, T.

Courjon, D.

T. Grosjean, D. Courjon, and D. V. Labeke, J. Microsc. 210, 319 (2003).
[CrossRef] [PubMed]

Dholakia, K.

D. McGloin and K. Dholakia, Contemp. Phys. 46, 15 (2005).
[CrossRef]

Dixit, H. M.

N. Arun, A. Sharma, P. S. G. Pattader, I. Banerjee, H. M. Dixit, and K. S. Narayan, Phys. Rev. Lett. 102, 254502 (2009).
[CrossRef] [PubMed]

Durnin, J.

J. Durnin, J. J. Miceli, Jr., and J. H. Eberly, Phys. Rev. Lett. 58, 1499 (1987).
[CrossRef] [PubMed]

Eberly, J. H.

J. Durnin, J. J. Miceli, Jr., and J. H. Eberly, Phys. Rev. Lett. 58, 1499 (1987).
[CrossRef] [PubMed]

Ehlert, R.

R. Grunwald, S. Woggon, R. Ehlert, and W. Reinecke, Pure Appl. Opt. 6, 663 (1997).
[CrossRef]

Elsaesser, T.

Friberg, A. T.

Griebner, U.

Grosjean, T.

T. Grosjean, D. Courjon, and D. V. Labeke, J. Microsc. 210, 319 (2003).
[CrossRef] [PubMed]

Grunwald, R.

Hartmann, H. J.

Jaroszewicz, Z.

Jezek, J.

Juptner, W.

Kargupta, K.

R. Verma, A. Sharma, K. Kargupta, and J. Bhaumik, Langmuir 21, 3710 (2005).
[CrossRef] [PubMed]

Kawata, S.

Kebbel, V.

Kolacz, K.

Kuhn, V. K. H.

Labeke, D. V.

T. Grosjean, D. Courjon, and D. V. Labeke, J. Microsc. 210, 319 (2003).
[CrossRef] [PubMed]

Leach, K. A.

K. A. Leach, Z. Lin, and T. P. Russell, Macromolecules 38, 4868 (2005).
[CrossRef]

Leinhos, U.

Lin, Z.

K. A. Leach, Z. Lin, and T. P. Russell, Macromolecules 38, 4868 (2005).
[CrossRef]

Mann, K.

McGloin, D.

D. McGloin and K. Dholakia, Contemp. Phys. 46, 15 (2005).
[CrossRef]

McLeod, J. H.

Miceli, J. J.

J. Durnin, J. J. Miceli, Jr., and J. H. Eberly, Phys. Rev. Lett. 58, 1499 (1987).
[CrossRef] [PubMed]

Mischke, H.

Nagel, S. R.

L. Oddershede and S. R. Nagel, Phys. Rev. Lett. 85, 1234 (2000).
[CrossRef] [PubMed]

Narayan, K. S.

N. Arun, A. Sharma, P. S. G. Pattader, I. Banerjee, H. M. Dixit, and K. S. Narayan, Phys. Rev. Lett. 102, 254502 (2009).
[CrossRef] [PubMed]

Nedela, V.

Neumann, U.

Nibbering, E. T. J.

Niu, H. B.

W. C. Cheong, B. P. S. Ahluwalia, X. Yuan, L. Zhang, H. Wang, H. B. Niu, and X. Peng, Appl. Phys. Lett. 87, 024104 (2005).
[CrossRef]

Oddershede, L.

L. Oddershede and S. R. Nagel, Phys. Rev. Lett. 85, 1234 (2000).
[CrossRef] [PubMed]

Pattader, P. S. G.

N. Arun, A. Sharma, P. S. G. Pattader, I. Banerjee, H. M. Dixit, and K. S. Narayan, Phys. Rev. Lett. 102, 254502 (2009).
[CrossRef] [PubMed]

Peng, X.

W. C. Cheong, B. P. S. Ahluwalia, X. Yuan, L. Zhang, H. Wang, H. B. Niu, and X. Peng, Appl. Phys. Lett. 87, 024104 (2005).
[CrossRef]

Reinecke, W.

R. Grunwald, S. Woggon, R. Ehlert, and W. Reinecke, Pure Appl. Opt. 6, 663 (1997).
[CrossRef]

Russell, T. P.

K. A. Leach, Z. Lin, and T. P. Russell, Macromolecules 38, 4868 (2005).
[CrossRef]

E. Schaffer, T. Thurn-Albrecht, T. P. Russell, and U. Steiner, Europhys. Lett. 54, 518 (2001).
[CrossRef]

Saloma, C.

Schaffer, E.

E. Schaffer, T. Thurn-Albrecht, T. P. Russell, and U. Steiner, Europhys. Lett. 54, 518 (2001).
[CrossRef]

Sharma, A.

N. Arun, A. Sharma, P. S. G. Pattader, I. Banerjee, H. M. Dixit, and K. S. Narayan, Phys. Rev. Lett. 102, 254502 (2009).
[CrossRef] [PubMed]

R. Verma, A. Sharma, K. Kargupta, and J. Bhaumik, Langmuir 21, 3710 (2005).
[CrossRef] [PubMed]

Steiner, U.

E. Schaffer, T. Thurn-Albrecht, T. P. Russell, and U. Steiner, Europhys. Lett. 54, 518 (2001).
[CrossRef]

Tanaka, T.

Thurn-Albrecht, T.

E. Schaffer, T. Thurn-Albrecht, T. P. Russell, and U. Steiner, Europhys. Lett. 54, 518 (2001).
[CrossRef]

Tschirschwitz, F.

Verma, R.

R. Verma, A. Sharma, K. Kargupta, and J. Bhaumik, Langmuir 21, 3710 (2005).
[CrossRef] [PubMed]

Wang, H.

W. C. Cheong, B. P. S. Ahluwalia, X. Yuan, L. Zhang, H. Wang, H. B. Niu, and X. Peng, Appl. Phys. Lett. 87, 024104 (2005).
[CrossRef]

Woggon, S.

R. Grunwald, S. Woggon, R. Ehlert, and W. Reinecke, Pure Appl. Opt. 6, 663 (1997).
[CrossRef]

Wulff-Molder, D.

Yuan, X.

W. C. Cheong, B. P. S. Ahluwalia, X. Yuan, L. Zhang, H. Wang, H. B. Niu, and X. Peng, Appl. Phys. Lett. 87, 024104 (2005).
[CrossRef]

Zemanek, P.

Zhang, L.

W. C. Cheong, B. P. S. Ahluwalia, X. Yuan, L. Zhang, H. Wang, H. B. Niu, and X. Peng, Appl. Phys. Lett. 87, 024104 (2005).
[CrossRef]

Appl. Opt. (2)

Appl. Phys. Lett. (1)

W. C. Cheong, B. P. S. Ahluwalia, X. Yuan, L. Zhang, H. Wang, H. B. Niu, and X. Peng, Appl. Phys. Lett. 87, 024104 (2005).
[CrossRef]

Contemp. Phys. (1)

D. McGloin and K. Dholakia, Contemp. Phys. 46, 15 (2005).
[CrossRef]

Europhys. Lett. (1)

E. Schaffer, T. Thurn-Albrecht, T. P. Russell, and U. Steiner, Europhys. Lett. 54, 518 (2001).
[CrossRef]

J. Microsc. (1)

T. Grosjean, D. Courjon, and D. V. Labeke, J. Microsc. 210, 319 (2003).
[CrossRef] [PubMed]

J. Opt. Soc. Am. (1)

Langmuir (1)

R. Verma, A. Sharma, K. Kargupta, and J. Bhaumik, Langmuir 21, 3710 (2005).
[CrossRef] [PubMed]

Macromolecules (1)

K. A. Leach, Z. Lin, and T. P. Russell, Macromolecules 38, 4868 (2005).
[CrossRef]

Opt. Express (2)

Opt. Lett. (2)

Phys. Rev. Lett. (3)

L. Oddershede and S. R. Nagel, Phys. Rev. Lett. 85, 1234 (2000).
[CrossRef] [PubMed]

N. Arun, A. Sharma, P. S. G. Pattader, I. Banerjee, H. M. Dixit, and K. S. Narayan, Phys. Rev. Lett. 102, 254502 (2009).
[CrossRef] [PubMed]

J. Durnin, J. J. Miceli, Jr., and J. H. Eberly, Phys. Rev. Lett. 58, 1499 (1987).
[CrossRef] [PubMed]

Pure Appl. Opt. (1)

R. Grunwald, S. Woggon, R. Ehlert, and W. Reinecke, Pure Appl. Opt. 6, 663 (1997).
[CrossRef]

Supplementary Material (1)

» Media 1: JPG (277 KB)     

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Figures (4)

Fig. 1
Fig. 1

(a) Schematic of experimental setup to generate columns. (b) Microscope image of column formation from a 20 - μ m -thick polymer film with a 90 μ m spacer at 500 V . (c) Cross section of a single column generated with a spacer of 270 μ m at 1000 V .

Fig. 2
Fig. 2

(a) Stages in the peeling process. (b) Scanning electron microscope images of the microaxicon arrays formed with a 180 μ m spacer at 800 V . (c) Surface profile of microaxicon as measured by profilometer and fitted Gaussian profile (solid curve).

Fig. 3
Fig. 3

Transverse intensity profiles of the beam at 4 cm (solid curve) from the array and the numerical fit (dashed curve) for beam shown in the inset. (See Media 1.)

Fig. 4
Fig. 4

Comparison of on-axis intensity of calculated (green – curve) and measured (blue ● curve) Bessel beam with a Gaussian beam (red left ● curve) as a function of axial distance z. Measured (black ◻ curve) and calculated (inset) spot size as a function of axial position.

Equations (1)

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A ( r , z ) = a 0 k i z 0 exp [ ρ 2 ω 2 i β ρ + i k ( r 2 + ρ 2 ) 2 z ] J 0 ( ρ ) ρ d ρ ,

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