Abstract

We introduce on-chip interferometers in which the spatial output interference pattern is observed along a detection plane. We show that by using photonic crystals with strong dispersive properties in these devices, highly sensitive interferometers can be realized. We discuss potentials of these interferometers in spectroscopy and sensing applications using their strong wavelength sensitivity and their ability to spatially map the spectral information of an input signal.

© 2009 Optical Society of America

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References

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  1. P. Hariharan, Optical Interferometry (Academic, 2003).
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2008 (1)

2007 (2)

2006 (1)

2005 (3)

Adibi, A.

Askari, M.

Boyd, R.

Camargo, E. A.

Chamanzar, M.

Chong, H. M. H.

De La Rue, R. M.

Dudley, C.

Gauthier, D.

Hariharan, P.

P. Hariharan, Optical Interferometry (Academic, 2003).

Lipson, M.

Momeni, B.

Shah Hosseini, E.

Shi, Z.

Soltani, M.

Yegnanarayanan, S.

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Figures (4)

Fig. 1
Fig. 1

Schematic illustration of the proposed PC interferometer.

Fig. 2
Fig. 2

Wavelength-sensitivity parameter S plotted versus wavelength for normal incidence, i.e., along the k y direction for a 45°-rotated square lattice PC on an SOI substrate in the wavelength range where the sensitivity is large.

Fig. 3
Fig. 3

Cross correlation of the output interference patterns defined in Eq. (2) versus λ for two center wavelengths, λ 0 = 1566.4 nm and λ 0 = 1569.4 nm , obtained for the interferometer in Fig. 1 with r a = 0.35 , a = 450 nm , L = 50 μ m , and d = 70 μ m .

Fig. 4
Fig. 4

FWHM of the cross-correlation function versus λ for the interferometer in Fig. 1 with PC (squares), and with planar Si and no PC (circles).

Equations (2)

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S = λ Λ d Λ d λ .
X cor ( λ 0 , λ ) = I ( x , λ 0 ) I ( x , λ ) I ( x , λ 0 ) I ( x , λ 0 ) I ( x , λ ) I ( x , λ ) ,

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