Abstract

We describe a coating based on potassium silicate, commonly known as water glass, and multiwall carbon nanotubes. The coating has a high absorbance (0.96 at 1064nm in wavelength) and a laser damage threshold that is comparable to that of ceramic coatings presently used for commercial thermopiles for high-power laser measurements. In addition to a potassium silicate-based coating we discuss sodium silicate, lithium silicate, and a commercially available ceramic coating. We document the coating process and experiments that demonstrate that the laser damage threshold at 1064nm is 15kWcm2.

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  1. J. H. Lehman, K. E. Hurst, A. M. Radojevic, A. C. Dillon, and R. M. Osgood, Jr., Opt. Lett. 32, 772 (2007).
    [CrossRef] [PubMed]
  2. J. H. Lehman, E. Theocharous, G. Eppeldauer, and C. Pannell, Meas. Sci. Technol. 14, 916 (2003).
    [CrossRef]
  3. M. Jung de Andrade, M. Dias Lima, L. Stein, C. Pérez Bergmann, and S. Roth, Phys. Status Solidi B 244, 4218 (2007).
    [CrossRef]
  4. J. H. Lehman, C. Engtrakul, T. Gennett, and A. C. Dillon, Appl. Opt. 44, 483 (2005).
    [CrossRef] [PubMed]
  5. K. Ramadurai, C. L. Cromer, J. H. Lehman, K. E. Hurst, L. A. Lewis, A. C. Dillon, and R. J. Mahajan, J. Appl. Phys. 103, 013103 (2008).
    [CrossRef]
  6. D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
    [CrossRef]
  7. KASIL 1, 2.50 weight ratio potassium silicate, 29.1% solution in water. Manufacturer, PQ Corporation, P.O. Box 840, Valley Forge, Pa. 19482, USA.
  8. MicrotechNano, LLC8831 Log Run Dr. N., Indianapolis, Ind. 46234, USA.
  9. Badger Air-Brush Co., model 150-7, 9128 W. Belmont Ave., Franklin Park, Ill. 60131, USA.
  10. N CLEAR, 3.22 weight ratio sodium silicate, 37.5% solution in water. Manufacturer, PQ Corporation, P.O. Box 840 Valley Forge, Pa. 19482, USA.
  11. LITHSIL, 23% lithium silicate solution in water. Manufacturer, PQ Corporation, P.O. Box 840, Valley Forge, Pa. 19482, USA.
  12. P. G. Collins and P. Avouris, Sci. Am. 283, 62 (2000).
    [CrossRef] [PubMed]

2008 (1)

K. Ramadurai, C. L. Cromer, J. H. Lehman, K. E. Hurst, L. A. Lewis, A. C. Dillon, and R. J. Mahajan, J. Appl. Phys. 103, 013103 (2008).
[CrossRef]

2007 (2)

J. H. Lehman, K. E. Hurst, A. M. Radojevic, A. C. Dillon, and R. M. Osgood, Jr., Opt. Lett. 32, 772 (2007).
[CrossRef] [PubMed]

M. Jung de Andrade, M. Dias Lima, L. Stein, C. Pérez Bergmann, and S. Roth, Phys. Status Solidi B 244, 4218 (2007).
[CrossRef]

2005 (1)

2003 (1)

J. H. Lehman, E. Theocharous, G. Eppeldauer, and C. Pannell, Meas. Sci. Technol. 14, 916 (2003).
[CrossRef]

2002 (1)

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

2000 (1)

P. G. Collins and P. Avouris, Sci. Am. 283, 62 (2000).
[CrossRef] [PubMed]

Ahn, J.

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

Avouris, P.

P. G. Collins and P. Avouris, Sci. Am. 283, 62 (2000).
[CrossRef] [PubMed]

Bergmann, C. Pérez

M. Jung de Andrade, M. Dias Lima, L. Stein, C. Pérez Bergmann, and S. Roth, Phys. Status Solidi B 244, 4218 (2007).
[CrossRef]

Collins, P. G.

P. G. Collins and P. Avouris, Sci. Am. 283, 62 (2000).
[CrossRef] [PubMed]

Cromer, C. L.

K. Ramadurai, C. L. Cromer, J. H. Lehman, K. E. Hurst, L. A. Lewis, A. C. Dillon, and R. J. Mahajan, J. Appl. Phys. 103, 013103 (2008).
[CrossRef]

de Andrade, M. Jung

M. Jung de Andrade, M. Dias Lima, L. Stein, C. Pérez Bergmann, and S. Roth, Phys. Status Solidi B 244, 4218 (2007).
[CrossRef]

Dias Lima, M.

M. Jung de Andrade, M. Dias Lima, L. Stein, C. Pérez Bergmann, and S. Roth, Phys. Status Solidi B 244, 4218 (2007).
[CrossRef]

Dillon, A. C.

Engtrakul, C.

Eppeldauer, G.

J. H. Lehman, E. Theocharous, G. Eppeldauer, and C. Pannell, Meas. Sci. Technol. 14, 916 (2003).
[CrossRef]

Gennett, T.

Hurst, K. E.

K. Ramadurai, C. L. Cromer, J. H. Lehman, K. E. Hurst, L. A. Lewis, A. C. Dillon, and R. J. Mahajan, J. Appl. Phys. 103, 013103 (2008).
[CrossRef]

J. H. Lehman, K. E. Hurst, A. M. Radojevic, A. C. Dillon, and R. M. Osgood, Jr., Opt. Lett. 32, 772 (2007).
[CrossRef] [PubMed]

Lehman, J. H.

K. Ramadurai, C. L. Cromer, J. H. Lehman, K. E. Hurst, L. A. Lewis, A. C. Dillon, and R. J. Mahajan, J. Appl. Phys. 103, 013103 (2008).
[CrossRef]

J. H. Lehman, K. E. Hurst, A. M. Radojevic, A. C. Dillon, and R. M. Osgood, Jr., Opt. Lett. 32, 772 (2007).
[CrossRef] [PubMed]

J. H. Lehman, C. Engtrakul, T. Gennett, and A. C. Dillon, Appl. Opt. 44, 483 (2005).
[CrossRef] [PubMed]

J. H. Lehman, E. Theocharous, G. Eppeldauer, and C. Pannell, Meas. Sci. Technol. 14, 916 (2003).
[CrossRef]

Lewis, L. A.

K. Ramadurai, C. L. Cromer, J. H. Lehman, K. E. Hurst, L. A. Lewis, A. C. Dillon, and R. J. Mahajan, J. Appl. Phys. 103, 013103 (2008).
[CrossRef]

Li, J. Q.

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

Mahajan, R. J.

K. Ramadurai, C. L. Cromer, J. H. Lehman, K. E. Hurst, L. A. Lewis, A. C. Dillon, and R. J. Mahajan, J. Appl. Phys. 103, 013103 (2008).
[CrossRef]

Osgood, R. M.

Pannell, C.

J. H. Lehman, E. Theocharous, G. Eppeldauer, and C. Pannell, Meas. Sci. Technol. 14, 916 (2003).
[CrossRef]

Radojevic, A. M.

Ramadurai, K.

K. Ramadurai, C. L. Cromer, J. H. Lehman, K. E. Hurst, L. A. Lewis, A. C. Dillon, and R. J. Mahajan, J. Appl. Phys. 103, 013103 (2008).
[CrossRef]

Roth, S.

M. Jung de Andrade, M. Dias Lima, L. Stein, C. Pérez Bergmann, and S. Roth, Phys. Status Solidi B 244, 4218 (2007).
[CrossRef]

Stein, L.

M. Jung de Andrade, M. Dias Lima, L. Stein, C. Pérez Bergmann, and S. Roth, Phys. Status Solidi B 244, 4218 (2007).
[CrossRef]

Theocharous, E.

J. H. Lehman, E. Theocharous, G. Eppeldauer, and C. Pannell, Meas. Sci. Technol. 14, 916 (2003).
[CrossRef]

Wang, Q.

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

Wang, S. G.

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

Yang, D. J.

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

Yoon, C. S. F.

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

Zhang, Q.

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

Zhou, Q.

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

Appl. Opt. (1)

J. Appl. Phys. (1)

K. Ramadurai, C. L. Cromer, J. H. Lehman, K. E. Hurst, L. A. Lewis, A. C. Dillon, and R. J. Mahajan, J. Appl. Phys. 103, 013103 (2008).
[CrossRef]

Meas. Sci. Technol. (1)

J. H. Lehman, E. Theocharous, G. Eppeldauer, and C. Pannell, Meas. Sci. Technol. 14, 916 (2003).
[CrossRef]

Opt. Lett. (1)

Phys. Rev. B (1)

D. J. Yang, Q. Zhang, C. S. F. Yoon, J. Ahn, S. G. Wang, Q. Zhou, Q. Wang, and J. Q. Li, Phys. Rev. B 66, 165440 (2002).
[CrossRef]

Phys. Status Solidi B (1)

M. Jung de Andrade, M. Dias Lima, L. Stein, C. Pérez Bergmann, and S. Roth, Phys. Status Solidi B 244, 4218 (2007).
[CrossRef]

Sci. Am. (1)

P. G. Collins and P. Avouris, Sci. Am. 283, 62 (2000).
[CrossRef] [PubMed]

Other (5)

KASIL 1, 2.50 weight ratio potassium silicate, 29.1% solution in water. Manufacturer, PQ Corporation, P.O. Box 840, Valley Forge, Pa. 19482, USA.

MicrotechNano, LLC8831 Log Run Dr. N., Indianapolis, Ind. 46234, USA.

Badger Air-Brush Co., model 150-7, 9128 W. Belmont Ave., Franklin Park, Ill. 60131, USA.

N CLEAR, 3.22 weight ratio sodium silicate, 37.5% solution in water. Manufacturer, PQ Corporation, P.O. Box 840 Valley Forge, Pa. 19482, USA.

LITHSIL, 23% lithium silicate solution in water. Manufacturer, PQ Corporation, P.O. Box 840, Valley Forge, Pa. 19482, USA.

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Figures (2)

Fig. 1
Fig. 1

Photograph of copper coupons coated with MWCNT and sodium silicate. The lower coupon has been baked at 300 ° C and shows efflorescence. The brightness of the image has been modified to enhance the distinction.

Fig. 2
Fig. 2

Photographic image of a laser-induced damaged area. The diameter of the damaged area, indicated by the outermost ring, is approximately 2 mm . The translucent nature of the center suggests that the carbon is depleted and the frozen silicate remains. The brightness and contrast are modified to enhance the visibility of the black coating that surrounds the damaged area.

Tables (1)

Tables Icon

Table 1 Absorbance ( α ) and Damage Threshold ( P t ) at 1064 nm in Wavelength

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