Abstract

We present a shearing interferometer that is based on the birefringent properties of a phase-only spatial light modulator. The main advantages of this approach are the high flexibility, the robustness, and the light efficiency. In contrast to already existing methods the suppression of unwanted diffraction orders is not required.

© 2009 Optical Society of America

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References

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  1. F. Chen, J. Electron. Imaging 10, 240 (2001).
    [CrossRef]
  2. S. Mallick and K. Robin, Appl. Phys. Lett. 14, 61 (1969).
    [CrossRef]
  3. S. Nakadate, Opt. Lasers Eng. 26, 331 (1997).
    [CrossRef]
  4. S. Zhao and P. Chung, Opt. Eng. 45, 105606 (2006).
    [CrossRef]
  5. R. Jones, J. Opt. Soc. Am. 7, 488 (1941).
    [CrossRef]

2006 (1)

S. Zhao and P. Chung, Opt. Eng. 45, 105606 (2006).
[CrossRef]

2001 (1)

F. Chen, J. Electron. Imaging 10, 240 (2001).
[CrossRef]

1997 (1)

S. Nakadate, Opt. Lasers Eng. 26, 331 (1997).
[CrossRef]

1969 (1)

S. Mallick and K. Robin, Appl. Phys. Lett. 14, 61 (1969).
[CrossRef]

1941 (1)

R. Jones, J. Opt. Soc. Am. 7, 488 (1941).
[CrossRef]

Chen, F.

F. Chen, J. Electron. Imaging 10, 240 (2001).
[CrossRef]

Chung, P.

S. Zhao and P. Chung, Opt. Eng. 45, 105606 (2006).
[CrossRef]

Jones, R.

R. Jones, J. Opt. Soc. Am. 7, 488 (1941).
[CrossRef]

Mallick, S.

S. Mallick and K. Robin, Appl. Phys. Lett. 14, 61 (1969).
[CrossRef]

Nakadate, S.

S. Nakadate, Opt. Lasers Eng. 26, 331 (1997).
[CrossRef]

Robin, K.

S. Mallick and K. Robin, Appl. Phys. Lett. 14, 61 (1969).
[CrossRef]

Zhao, S.

S. Zhao and P. Chung, Opt. Eng. 45, 105606 (2006).
[CrossRef]

Appl. Phys. Lett. (1)

S. Mallick and K. Robin, Appl. Phys. Lett. 14, 61 (1969).
[CrossRef]

J. Electron. Imaging (1)

F. Chen, J. Electron. Imaging 10, 240 (2001).
[CrossRef]

J. Opt. Soc. Am. (1)

R. Jones, J. Opt. Soc. Am. 7, 488 (1941).
[CrossRef]

Opt. Eng. (1)

S. Zhao and P. Chung, Opt. Eng. 45, 105606 (2006).
[CrossRef]

Opt. Lasers Eng. (1)

S. Nakadate, Opt. Lasers Eng. 26, 331 (1997).
[CrossRef]

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Figures (2)

Fig. 1
Fig. 1

Schematic setup of the proposed interferometer.

Fig. 2
Fig. 2

(a) Intensity distribution, slow axis, and (b) interference pattern between slow and fast axis.

Equations (8)

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E in = J 0 exp ( i ϕ ) = 1 2 ( 1 1 ) E ̃ 0 .
E M = M M E in = ( t 0 0 1 ) E in = 1 2 ( t 1 ) E ̃ 0 .
E A = 1 2 ( P { E ̃ 0 t } P { E ̃ 0 } ) .
E S = M A E A = 1 2 ( 1 1 1 1 ) E A = 1 8 ( 1 1 ) [ P { E ̃ 0 } + P { E ̃ 0 t } ] .
Δ ϕ Δ ϕ B = 2 π g r M .
g = ( g x g y ) = 1 p ( cos α sin α ) .
E S P { E ̃ 0 } ( r S ) + P { E ̃ 0 } ( r S + λ z 0 g ) exp ( i Δ ϕ B ) ,
s = λ z 0 g .

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