Abstract

A set of four-temporal phases in photoelastic-modulated polarimetry is proposed to measure the Stokes parameters. In comparison with the conventional polarimetry, which uses a set of four-spatial angles by rotating a quarter-wave plate to obtain the polarimetric parameters, this temporal type polarimetry not only can reduce the time consumption but also can avoid the measurement error from the beam deviation. In addition, based on singular value decomposition, the figure of merit of this temporal phase technique can improve its signal-to-noise ratio by a factor of 2 in comparison with the rotating quarter-wave plate.

© 2009 Optical Society of America

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References

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    [CrossRef]

2007 (2)

Y. F. Chao and C. Y. Han, Rev. Sci. Instrum. 77, 032107 (2007).

Y. F. Chao and C. Y. Han, Sens. Actuators B 121, 490 (2007).
[CrossRef]

2006 (1)

2004 (1)

M. W. Wang, Y. F. Chao, K. C. Leou, F. H. Tsai, T. L. Lin, S. S. Chen, and Y. W. Liu, Jpn. J. Appl. Phys. 43, 827 (2004).
[CrossRef]

2003 (1)

2000 (2)

1998 (1)

Y. F. Chao, W. C. Lee, C. S. Hung, and J. J. Lin, J. Phys. D 31, 1968 (1998).
[CrossRef]

1995 (1)

A. Ambirajan and D. C. Look, Jr., Opt. Eng. 34, 1651 (1995).
[CrossRef]

1993 (1)

1991 (1)

1969 (1)

Ambirajan, A.

A. Ambirajan and D. C. Look, Jr., Opt. Eng. 34, 1651 (1995).
[CrossRef]

Azzam, R. M. A.

R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1989).

Bashara, N. M.

R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1989).

Chao, Y. F.

Y. F. Chao and C. Y. Han, Rev. Sci. Instrum. 77, 032107 (2007).

Y. F. Chao and C. Y. Han, Sens. Actuators B 121, 490 (2007).
[CrossRef]

M. W. Wang, Y. F. Chao, K. C. Leou, F. H. Tsai, T. L. Lin, S. S. Chen, and Y. W. Liu, Jpn. J. Appl. Phys. 43, 827 (2004).
[CrossRef]

Y. F. Chao, W. C. Lee, C. S. Hung, and J. J. Lin, J. Phys. D 31, 1968 (1998).
[CrossRef]

Y. F. Chao and W. F. Hsieh, Appl. Opt. 30, 4012 (1991).
[CrossRef] [PubMed]

Chen, S. S.

M. W. Wang, Y. F. Chao, K. C. Leou, F. H. Tsai, T. L. Lin, S. S. Chen, and Y. W. Liu, Jpn. J. Appl. Phys. 43, 827 (2004).
[CrossRef]

Chipman, R. A.

Collett, E.

E. Collett, Polarized Light: Fundamentals and Applications (Marcel Dekker, 1993), p. 549.

De Martino, A.

Dereniak, E.

Descour, M.

Drevillon, B.

Drévillon, B.

Gracia-Caurel, E.

Han, C. Y.

Y. F. Chao and C. Y. Han, Sens. Actuators B 121, 490 (2007).
[CrossRef]

Y. F. Chao and C. Y. Han, Rev. Sci. Instrum. 77, 032107 (2007).

Hatit, S. B.

Hsieh, W. F.

Hung, C. S.

Y. F. Chao, W. C. Lee, C. S. Hung, and J. J. Lin, J. Phys. D 31, 1968 (1998).
[CrossRef]

Kemme, S.

Kemp, J. C.

Kim, Y. K.

Laude, B.

Lee, W. C.

Y. F. Chao, W. C. Lee, C. S. Hung, and J. J. Lin, J. Phys. D 31, 1968 (1998).
[CrossRef]

Leou, K. C.

M. W. Wang, Y. F. Chao, K. C. Leou, F. H. Tsai, T. L. Lin, S. S. Chen, and Y. W. Liu, Jpn. J. Appl. Phys. 43, 827 (2004).
[CrossRef]

Lin, J. J.

Y. F. Chao, W. C. Lee, C. S. Hung, and J. J. Lin, J. Phys. D 31, 1968 (1998).
[CrossRef]

Lin, T. L.

M. W. Wang, Y. F. Chao, K. C. Leou, F. H. Tsai, T. L. Lin, S. S. Chen, and Y. W. Liu, Jpn. J. Appl. Phys. 43, 827 (2004).
[CrossRef]

Liu, Y. W.

M. W. Wang, Y. F. Chao, K. C. Leou, F. H. Tsai, T. L. Lin, S. S. Chen, and Y. W. Liu, Jpn. J. Appl. Phys. 43, 827 (2004).
[CrossRef]

Look, D. C.

A. Ambirajan and D. C. Look, Jr., Opt. Eng. 34, 1651 (1995).
[CrossRef]

Lu, S. Y.

McClain, S. C.

Novikova, T.

Pezzaniti, J. L.

Phipps, G.

Sabatke, D.

Sweatt, W.

Tompkins, H. G.

H. G. Tompkins, A User's Guide to Ellipsometry (Academic, 1993), p. 35.

Tsai, F. H.

M. W. Wang, Y. F. Chao, K. C. Leou, F. H. Tsai, T. L. Lin, S. S. Chen, and Y. W. Liu, Jpn. J. Appl. Phys. 43, 827 (2004).
[CrossRef]

Tyo, J.

Wang, M. W.

M. W. Wang, Y. F. Chao, K. C. Leou, F. H. Tsai, T. L. Lin, S. S. Chen, and Y. W. Liu, Jpn. J. Appl. Phys. 43, 827 (2004).
[CrossRef]

Appl. Opt. (2)

J. Opt. Soc. Am. (1)

J. Phys. D (1)

Y. F. Chao, W. C. Lee, C. S. Hung, and J. J. Lin, J. Phys. D 31, 1968 (1998).
[CrossRef]

Jpn. J. Appl. Phys. (1)

M. W. Wang, Y. F. Chao, K. C. Leou, F. H. Tsai, T. L. Lin, S. S. Chen, and Y. W. Liu, Jpn. J. Appl. Phys. 43, 827 (2004).
[CrossRef]

Opt. Eng. (1)

A. Ambirajan and D. C. Look, Jr., Opt. Eng. 34, 1651 (1995).
[CrossRef]

Opt. Lett. (4)

Rev. Sci. Instrum. (1)

Y. F. Chao and C. Y. Han, Rev. Sci. Instrum. 77, 032107 (2007).

Sens. Actuators B (1)

Y. F. Chao and C. Y. Han, Sens. Actuators B 121, 490 (2007).
[CrossRef]

Other (3)

H. G. Tompkins, A User's Guide to Ellipsometry (Academic, 1993), p. 35.

R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1989).

E. Collett, Polarized Light: Fundamentals and Applications (Marcel Dekker, 1993), p. 549.

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Figures (3)

Fig. 1
Fig. 1

Schematic setup of the phase-lock PEM polarimetry, which consists of a laser diode coupled with a pulse generator to perform the stroboscopic illumination technique, the polarizer, the photoelastic modulator, and the CCD.

Fig. 2
Fig. 2

EWV as a function of the number N of measurements for different techniques: (1) Ambirajan and Look's [8] four optimal angles for the RRFP of the quarter-wave retarder (solid squares), (2) uniformly spaced angles for RRFP of the quarter-wave retarder of Sabatke et al. [9] (stars), (3) optimal repeated angles for the RRFP of the optimal phase retardation (132°) of Sabatke et al. [9] (open squares), (4) uniformly spaced temporal phase for the photoelastic modulator whose modulation amplitude is π (inverted triangles), (5) four STP states repeated for the photoelastic modulator whose modulation amplitude is π (upright triangles).

Fig. 3
Fig. 3

Trajectory of the phase-lock PEM polarimetry on the Poincaré sphere: the four specific polarization states are indicated in the graph.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

tan   Ψ e i Δ = r p r s ,
S = ( 1 cos ( 2 Ψ ) sin ( 2 Ψ ) cos ( Δ ) sin ( 2 Ψ ) sin ( Δ ) ) .
{ ε } = [ A ] 1 { n } .
EWV = j = 0 3 k = 0 N 1 ( [ A ] 1 ) j , k 2 = Tr [ [ A ] 1 ( [ A ] 1 ) T ] .

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