Abstract

Tip-enhanced Raman spectroscopy with a spatial resolution of 25nm is conducted on a sample of graphite that has been exposed to a 50keV focused Ga ion beam with a diameter of 20nm. The G mode located at 1579cm1 does not exhibit a measurable tip enhancement, while the D mode at 1364cm1 is significantly enhanced. A method is proposed to calculate the enhancement factor of anisotropic materials due to the electromagnetic field using the measured signal enhancement induced by the tip.

© 2009 Optical Society of America

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