Abstract

High-quality Er3+:ZnO films were grown by the pulsed-laser deposition technique for 0.5 and 2wt.% Er doping. Two peaks were observed at approximately 1.54μm in the photoluminescence spectra of samples with 2wt.% doping contrary to only one peak in the 0.5wt.% doped sample. Both peaks were found to be strongly temperature dependent. The microscopic studies clearly illustrate that the appearance of the additional peak is attributed to the environment of Er3+ ions in the form of ErO6 clusters, which are optically active centers in the ZnO matrix. These results are very important for designing waveguides for telecommunications.

© 2008 Optical Society of America

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References

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]

2007 (1)

A. K. Pradhan, L. Douglas, H. Mustafa, R. Mundle, D. Hunter, and C. E. Bonner, Appl. Phys. Lett. 90, 072108 (2007).
[CrossRef]

2004 (1)

I. Izeddin, T. Gregorkiewicz, P. S. Lee, and A. J. Steckl, Superlattices Microstruct. 36, 701 (2004).
[CrossRef]

2001 (1)

M. Ishii, T. Ishikawa, T. Morikawa, and Y. Aoyagi, J. Appl. Phys. 89, 3679 (2001).
[CrossRef]

2000 (1)

S. Komuro, T. Katsumata, T. Morikawa, X. Zhao, H. Isshiki, and Y. Aoyagi, Appl. Phys. Lett. 76, 3935 (2000).
[CrossRef]

1999 (1)

N. Mais, J. P. Reithmaier, A. Forchel, M. Kohls, L. Spanhel, and G. Müller, Appl. Phys. Lett. 75, 2005 (1999).
[CrossRef]

1998 (1)

T. Schmidt, G. Müller, L. Spanhel, K. Kerkel, and A. Forchel, Chem. Mater. 10, 65 (1998).
[CrossRef]

1997 (2)

P. G. Kik, M. J. A. de Dood, K. Kikoin, and A. Polman, Appl. Phys. Lett. 70, 1721 (1997).
[CrossRef]

A. Polman, J. Appl. Phys. 82, 1 (1997).
[CrossRef]

Appl. Phys. Lett. (4)

N. Mais, J. P. Reithmaier, A. Forchel, M. Kohls, L. Spanhel, and G. Müller, Appl. Phys. Lett. 75, 2005 (1999).
[CrossRef]

S. Komuro, T. Katsumata, T. Morikawa, X. Zhao, H. Isshiki, and Y. Aoyagi, Appl. Phys. Lett. 76, 3935 (2000).
[CrossRef]

A. K. Pradhan, L. Douglas, H. Mustafa, R. Mundle, D. Hunter, and C. E. Bonner, Appl. Phys. Lett. 90, 072108 (2007).
[CrossRef]

P. G. Kik, M. J. A. de Dood, K. Kikoin, and A. Polman, Appl. Phys. Lett. 70, 1721 (1997).
[CrossRef]

Chem. Mater. (1)

T. Schmidt, G. Müller, L. Spanhel, K. Kerkel, and A. Forchel, Chem. Mater. 10, 65 (1998).
[CrossRef]

J. Appl. Phys. (2)

A. Polman, J. Appl. Phys. 82, 1 (1997).
[CrossRef]

M. Ishii, T. Ishikawa, T. Morikawa, and Y. Aoyagi, J. Appl. Phys. 89, 3679 (2001).
[CrossRef]

Superlattices Microstruct. (1)

I. Izeddin, T. Gregorkiewicz, P. S. Lee, and A. J. Steckl, Superlattices Microstruct. 36, 701 (2004).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Emission spectra of 0.5 and 2 wt. % Er 3 + : ZnO at room temperature.

Fig. 2
Fig. 2

Temperature-dependent emission spectra of 2.0 wt. % Er 3 + : ZnO . The inset shows the temperature-dependent intensity.

Fig. 3
Fig. 3

Dark-field TEM images of (a) 0.5 and (b) 2 wt. % .; HR-TEM image of (c) 0.5 and (d) 2 wt. % . The insets show the SAED pattern.

Fig. 4
Fig. 4

HR-TEM image of the selected area for Er 3 + ( 2 wt. % ) : ZnO films, showing the regions with distorted lattice.

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