Abstract

By coupling photorefractive holography with speckle shearography, it is possible to simultaneously perform both coherent imaging and strain measurement. Use of the photorefractive effect, which is insensitive to incoherently scattered light, is a significant advantage in coherent imaging as described. Experimental results obtained from a centrally loaded steel plate are presented.

© 2008 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |

  1. Y. Chen, S.-W. Huang, A. Aguirre, and J. Fujimoto, Opt. Lett. 32, 1971 (2007).
    [Crossref] [PubMed]
  2. R. Jones and C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, 1989).
  3. Y. Hung and H. Ho, Mater. Sci. Eng., R. 49, 61 (2005).
    [Crossref]
  4. D. K. Sharma, R. S. Sirohi, and M. P. Kothiyal, Appl. Opt. 23, 1542 (1984).
    [Crossref] [PubMed]
  5. P. Gunter, Phys. Rep. 93, 199 (1982).
    [Crossref]
  6. S. C. W. Hyde, N. P. Barry, R. Jones, J. C. Dainty, P. M. W. French, M. B. Klein, and B. A. Wechsler, Opt. Lett. 20, 1331 (1995).
    [Crossref] [PubMed]
  7. D. Pepper, J. Feinberg, and N. Kukhtarev, Sci. Am. 263, 34 (1990).
    [Crossref]
  8. Q. Li and F. Chiang, Opt. Eng. 27, 200 (1988).
  9. A. Davila, P. Ruiz, G. Kaufmann, and J. Huntley, Opt. Lasers Eng. 40, 447 (2003).
    [Crossref]
  10. P. Ruiz, J. Huntley, and R. Wildman, Appl. Opt. 44, 3945 (2005).
    [Crossref] [PubMed]
  11. V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
    [Crossref]
  12. K. Creath, Appl. Opt. 24, 3053 (1985).
    [Crossref] [PubMed]
  13. R. Jones, S. Hyde, M. Lynn, N. Barry, J. Dainty, P. French, K. Kwolek, D. Nolte, and M. Melloch, Appl. Phys. Lett. 69, 1837 (1996).
    [Crossref]

2007 (2)

Y. Chen, S.-W. Huang, A. Aguirre, and J. Fujimoto, Opt. Lett. 32, 1971 (2007).
[Crossref] [PubMed]

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[Crossref]

2005 (2)

2003 (1)

A. Davila, P. Ruiz, G. Kaufmann, and J. Huntley, Opt. Lasers Eng. 40, 447 (2003).
[Crossref]

1996 (1)

R. Jones, S. Hyde, M. Lynn, N. Barry, J. Dainty, P. French, K. Kwolek, D. Nolte, and M. Melloch, Appl. Phys. Lett. 69, 1837 (1996).
[Crossref]

1995 (1)

1990 (1)

D. Pepper, J. Feinberg, and N. Kukhtarev, Sci. Am. 263, 34 (1990).
[Crossref]

1988 (1)

Q. Li and F. Chiang, Opt. Eng. 27, 200 (1988).

1985 (1)

1984 (1)

1982 (1)

P. Gunter, Phys. Rep. 93, 199 (1982).
[Crossref]

Appl. Opt. (3)

Appl. Phys. Lett. (1)

R. Jones, S. Hyde, M. Lynn, N. Barry, J. Dainty, P. French, K. Kwolek, D. Nolte, and M. Melloch, Appl. Phys. Lett. 69, 1837 (1996).
[Crossref]

Mater. Sci. Eng., R. (1)

Y. Hung and H. Ho, Mater. Sci. Eng., R. 49, 61 (2005).
[Crossref]

Opt. Eng. (2)

V. Rosso, Y. Renotte, S. Habraken, Y. Lion, F. Michel, V. Moreau, and B. Tilkens, Opt. Eng. 46, 105601 (2007).
[Crossref]

Q. Li and F. Chiang, Opt. Eng. 27, 200 (1988).

Opt. Lasers Eng. (1)

A. Davila, P. Ruiz, G. Kaufmann, and J. Huntley, Opt. Lasers Eng. 40, 447 (2003).
[Crossref]

Opt. Lett. (2)

Phys. Rep. (1)

P. Gunter, Phys. Rep. 93, 199 (1982).
[Crossref]

Sci. Am. (1)

D. Pepper, J. Feinberg, and N. Kukhtarev, Sci. Am. 263, 34 (1990).
[Crossref]

Other (1)

R. Jones and C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, 1989).

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Schematic of the coupled setup, a photorefractive holography interferometer (top) and a speckle shearing interferometer (bottom).

Fig. 2
Fig. 2

Hologram recorded by the photorefractive holography interferometer consisting of an “S” (symbol of the Université de Sherbrooke) etched in chromium on a glass slide.

Fig. 3
Fig. 3

Typical sheared hologram (shearogram) obtained with the coupled system.

Fig. 4
Fig. 4

Differential wrapped phase map ( 5 × 5 median filtering) obtained with the coupled system depicting the displacement gradient information between two deformation states of a steel plate.

Metrics