Abstract

Wavelength-stabilized compact laser systems at 670nm on a micro-optical bench are presented. The resonator concept consists of a tapered semiconductor gain medium and a reflection Bragg grating as a wavelength selective resonator mirror. In pulse operation mode with 100ns pulses, an optical peak power of 5W with a spectral width below 150pm was achieved. Nearly diffraction-limited beam quality at optical output powers up to 1W is obtained. Such laser systems can be used, e.g., for Raman spectroscopy and as pumping sources for frequency conversion toward UV spectral range.

© 2008 Optical Society of America

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References

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  1. R. L. McCreery, in Raman Spectroscopy for Chemical Analysis, Chemical Analysis (Wiley, 2000), Vol. 157, p. 128.
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    [CrossRef]
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    [CrossRef] [PubMed]
  4. R. Grunwald, H. Schoennagel, and A. Bärwolff, in Technical Digest Series of CLEO'99 (IEEE, 1999), paper CWF32.
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  6. B. Pezeshki, M. Hagberg, B. Lu, M. Zelinski, S. Zou, and E. Kolev, Proc. SPIE 3947, 80 (2000).
    [CrossRef]
  7. G. Ferrari, M. O. Mewes, F. Schreck, and Ch. Salomon, Opt. Lett. 24, 151 (1999).
    [CrossRef]
  8. B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
    [CrossRef]
  9. G. J. Steckman, W. Liu, R. Platz, D. Schröder, Ch. Moser, and F. Havermeyer, IEEE J. Sel. Top. Quantum Electron. 13, 672 (2007).
    [CrossRef]
  10. L. B. Glebov, Proc. SPIE 6216, 621601 (2006).
    [CrossRef]
  11. M. Zorn, H. Wenzel, U. Zeimer, B. Sumpf, G. Erbert, and M. Weyers, J. Cryst. Growth 298, 667 (2007).
    [CrossRef]
  12. B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
    [CrossRef]
  13. A. R. Adams, E. P. O'Reilly, and M. Silver, in Semiconductor Lasers I: Fundamentals, E.Kapon ed. (Academic, 1999), p. 167.
  14. O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).
  15. ISO 11146 Lasers and laser-related equipment--test methods for laser beam parameters--beam width, divergence, angle and beam propagation factor (1999).
  16. L. Borruel, S. Sujecki, J. Wykes, H. Welzel, E. C. Larkins, and I. Esquivias, in Proceedings of the Fourth International Conference on Numerical Simulation of Optoelectronic Devices (IEEE, 2004), p. 9.
    [CrossRef]
  17. L. Borruel, H. Ordriozola, J. M. G. Tijero, I. Esquivias, S. Sujecki, and E. C. Larkins, Opt. Quantum Electron. 40, 175 (2008).
    [CrossRef]

2008 (2)

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

L. Borruel, H. Ordriozola, J. M. G. Tijero, I. Esquivias, S. Sujecki, and E. C. Larkins, Opt. Quantum Electron. 40, 175 (2008).
[CrossRef]

2007 (5)

O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).

R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, and W. G. Kaenders, Proc. SPIE 6485, 648516 (2007).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

G. J. Steckman, W. Liu, R. Platz, D. Schröder, Ch. Moser, and F. Havermeyer, IEEE J. Sel. Top. Quantum Electron. 13, 672 (2007).
[CrossRef]

M. Zorn, H. Wenzel, U. Zeimer, B. Sumpf, G. Erbert, and M. Weyers, J. Cryst. Growth 298, 667 (2007).
[CrossRef]

2006 (1)

L. B. Glebov, Proc. SPIE 6216, 621601 (2006).
[CrossRef]

2000 (1)

B. Pezeshki, M. Hagberg, B. Lu, M. Zelinski, S. Zou, and E. Kolev, Proc. SPIE 3947, 80 (2000).
[CrossRef]

1999 (1)

1995 (1)

Adams, A. R.

A. R. Adams, E. P. O'Reilly, and M. Silver, in Semiconductor Lasers I: Fundamentals, E.Kapon ed. (Academic, 1999), p. 167.

Andersen, P. E.

O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).

Bärwolff, A.

R. Grunwald, H. Schoennagel, and A. Bärwolff, in Technical Digest Series of CLEO'99 (IEEE, 1999), paper CWF32.

Boller, K. J.

Borruel, L.

L. Borruel, H. Ordriozola, J. M. G. Tijero, I. Esquivias, S. Sujecki, and E. C. Larkins, Opt. Quantum Electron. 40, 175 (2008).
[CrossRef]

L. Borruel, S. Sujecki, J. Wykes, H. Welzel, E. C. Larkins, and I. Esquivias, in Proceedings of the Fourth International Conference on Numerical Simulation of Optoelectronic Devices (IEEE, 2004), p. 9.
[CrossRef]

Dittmar, F.

O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).

Erbert, G.

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).

R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, and W. G. Kaenders, Proc. SPIE 6485, 648516 (2007).
[CrossRef]

M. Zorn, H. Wenzel, U. Zeimer, B. Sumpf, G. Erbert, and M. Weyers, J. Cryst. Growth 298, 667 (2007).
[CrossRef]

Esquivias, I.

L. Borruel, H. Ordriozola, J. M. G. Tijero, I. Esquivias, S. Sujecki, and E. C. Larkins, Opt. Quantum Electron. 40, 175 (2008).
[CrossRef]

L. Borruel, S. Sujecki, J. Wykes, H. Welzel, E. C. Larkins, and I. Esquivias, in Proceedings of the Fourth International Conference on Numerical Simulation of Optoelectronic Devices (IEEE, 2004), p. 9.
[CrossRef]

Ferrari, G.

Fricke, J.

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

Froese, P.

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

Glebov, L. B.

L. B. Glebov, Proc. SPIE 6216, 621601 (2006).
[CrossRef]

Grunwald, R.

R. Grunwald, H. Schoennagel, and A. Bärwolff, in Technical Digest Series of CLEO'99 (IEEE, 1999), paper CWF32.

Hagberg, M.

B. Pezeshki, M. Hagberg, B. Lu, M. Zelinski, S. Zou, and E. Kolev, Proc. SPIE 3947, 80 (2000).
[CrossRef]

Häring, R.

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, and W. G. Kaenders, Proc. SPIE 6485, 648516 (2007).
[CrossRef]

Havermeyer, F.

G. J. Steckman, W. Liu, R. Platz, D. Schröder, Ch. Moser, and F. Havermeyer, IEEE J. Sel. Top. Quantum Electron. 13, 672 (2007).
[CrossRef]

Jensen, O. B.

O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).

Kaenders, W. G.

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, and W. G. Kaenders, Proc. SPIE 6485, 648516 (2007).
[CrossRef]

Klehr, A.

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).

Knappe, R.

Kolev, E.

B. Pezeshki, M. Hagberg, B. Lu, M. Zelinski, S. Zou, and E. Kolev, Proc. SPIE 3947, 80 (2000).
[CrossRef]

Larkins, E. C.

L. Borruel, H. Ordriozola, J. M. G. Tijero, I. Esquivias, S. Sujecki, and E. C. Larkins, Opt. Quantum Electron. 40, 175 (2008).
[CrossRef]

L. Borruel, S. Sujecki, J. Wykes, H. Welzel, E. C. Larkins, and I. Esquivias, in Proceedings of the Fourth International Conference on Numerical Simulation of Optoelectronic Devices (IEEE, 2004), p. 9.
[CrossRef]

Lison, F.

R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, and W. G. Kaenders, Proc. SPIE 6485, 648516 (2007).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

Liu, W.

G. J. Steckman, W. Liu, R. Platz, D. Schröder, Ch. Moser, and F. Havermeyer, IEEE J. Sel. Top. Quantum Electron. 13, 672 (2007).
[CrossRef]

Lu, B.

B. Pezeshki, M. Hagberg, B. Lu, M. Zelinski, S. Zou, and E. Kolev, Proc. SPIE 3947, 80 (2000).
[CrossRef]

Maiwald, M.

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

McCreery, R. L.

R. L. McCreery, in Raman Spectroscopy for Chemical Analysis, Chemical Analysis (Wiley, 2000), Vol. 157, p. 128.

Mewes, M. O.

Moser, Ch.

G. J. Steckman, W. Liu, R. Platz, D. Schröder, Ch. Moser, and F. Havermeyer, IEEE J. Sel. Top. Quantum Electron. 13, 672 (2007).
[CrossRef]

Ordriozola, H.

L. Borruel, H. Ordriozola, J. M. G. Tijero, I. Esquivias, S. Sujecki, and E. C. Larkins, Opt. Quantum Electron. 40, 175 (2008).
[CrossRef]

O'Reilly, E. P.

A. R. Adams, E. P. O'Reilly, and M. Silver, in Semiconductor Lasers I: Fundamentals, E.Kapon ed. (Academic, 1999), p. 167.

Petersen, P. M.

O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).

Pezeshki, B.

B. Pezeshki, M. Hagberg, B. Lu, M. Zelinski, S. Zou, and E. Kolev, Proc. SPIE 3947, 80 (2000).
[CrossRef]

Platz, R.

G. J. Steckman, W. Liu, R. Platz, D. Schröder, Ch. Moser, and F. Havermeyer, IEEE J. Sel. Top. Quantum Electron. 13, 672 (2007).
[CrossRef]

Ressel, P.

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

Salomon, Ch.

Schoennagel, H.

R. Grunwald, H. Schoennagel, and A. Bärwolff, in Technical Digest Series of CLEO'99 (IEEE, 1999), paper CWF32.

Schreck, F.

Schröder, D.

G. J. Steckman, W. Liu, R. Platz, D. Schröder, Ch. Moser, and F. Havermeyer, IEEE J. Sel. Top. Quantum Electron. 13, 672 (2007).
[CrossRef]

Silver, M.

A. R. Adams, E. P. O'Reilly, and M. Silver, in Semiconductor Lasers I: Fundamentals, E.Kapon ed. (Academic, 1999), p. 167.

Staske, R.

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

Steckman, G. J.

G. J. Steckman, W. Liu, R. Platz, D. Schröder, Ch. Moser, and F. Havermeyer, IEEE J. Sel. Top. Quantum Electron. 13, 672 (2007).
[CrossRef]

Sujecki, S.

L. Borruel, H. Ordriozola, J. M. G. Tijero, I. Esquivias, S. Sujecki, and E. C. Larkins, Opt. Quantum Electron. 40, 175 (2008).
[CrossRef]

L. Borruel, S. Sujecki, J. Wykes, H. Welzel, E. C. Larkins, and I. Esquivias, in Proceedings of the Fourth International Conference on Numerical Simulation of Optoelectronic Devices (IEEE, 2004), p. 9.
[CrossRef]

Sumpf, B.

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).

R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, and W. G. Kaenders, Proc. SPIE 6485, 648516 (2007).
[CrossRef]

M. Zorn, H. Wenzel, U. Zeimer, B. Sumpf, G. Erbert, and M. Weyers, J. Cryst. Growth 298, 667 (2007).
[CrossRef]

Tijero, J. M. G.

L. Borruel, H. Ordriozola, J. M. G. Tijero, I. Esquivias, S. Sujecki, and E. C. Larkins, Opt. Quantum Electron. 40, 175 (2008).
[CrossRef]

Tränkle, G.

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, and W. G. Kaenders, Proc. SPIE 6485, 648516 (2007).
[CrossRef]

Tsuchiya, M.

Y. Uchiyama and M. Tsuchiya, in Technical Digest Series of CLEO/Pacific Rim '99 (IEEE, 1999), paper CTuM17.

Uchiyama, Y.

Y. Uchiyama and M. Tsuchiya, in Technical Digest Series of CLEO/Pacific Rim '99 (IEEE, 1999), paper CTuM17.

Wallenstein, R.

Welzel, H.

L. Borruel, S. Sujecki, J. Wykes, H. Welzel, E. C. Larkins, and I. Esquivias, in Proceedings of the Fourth International Conference on Numerical Simulation of Optoelectronic Devices (IEEE, 2004), p. 9.
[CrossRef]

Wenzel, H.

M. Zorn, H. Wenzel, U. Zeimer, B. Sumpf, G. Erbert, and M. Weyers, J. Cryst. Growth 298, 667 (2007).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

Weyers, M.

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

M. Zorn, H. Wenzel, U. Zeimer, B. Sumpf, G. Erbert, and M. Weyers, J. Cryst. Growth 298, 667 (2007).
[CrossRef]

Wykes, J.

L. Borruel, S. Sujecki, J. Wykes, H. Welzel, E. C. Larkins, and I. Esquivias, in Proceedings of the Fourth International Conference on Numerical Simulation of Optoelectronic Devices (IEEE, 2004), p. 9.
[CrossRef]

Zeimer, U.

M. Zorn, H. Wenzel, U. Zeimer, B. Sumpf, G. Erbert, and M. Weyers, J. Cryst. Growth 298, 667 (2007).
[CrossRef]

Zelinski, M.

B. Pezeshki, M. Hagberg, B. Lu, M. Zelinski, S. Zou, and E. Kolev, Proc. SPIE 3947, 80 (2000).
[CrossRef]

Zorn, M.

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

M. Zorn, H. Wenzel, U. Zeimer, B. Sumpf, G. Erbert, and M. Weyers, J. Cryst. Growth 298, 667 (2007).
[CrossRef]

Zou, S.

B. Pezeshki, M. Hagberg, B. Lu, M. Zelinski, S. Zou, and E. Kolev, Proc. SPIE 3947, 80 (2000).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron. (1)

G. J. Steckman, W. Liu, R. Platz, D. Schröder, Ch. Moser, and F. Havermeyer, IEEE J. Sel. Top. Quantum Electron. 13, 672 (2007).
[CrossRef]

IEEE Photon. Technol. Lett. (1)

B. Sumpf, M. Zorn, M. Maiwald, R. Staske, J. Fricke, P. Ressel, G. Erbert, M. Weyers, and G. Tränkle, IEEE Photon. Technol. Lett. 20, 575 (2008).
[CrossRef]

J. Cryst. Growth (1)

M. Zorn, H. Wenzel, U. Zeimer, B. Sumpf, G. Erbert, and M. Weyers, J. Cryst. Growth 298, 667 (2007).
[CrossRef]

Opt. Lett. (2)

Opt. Quantum Electron. (1)

L. Borruel, H. Ordriozola, J. M. G. Tijero, I. Esquivias, S. Sujecki, and E. C. Larkins, Opt. Quantum Electron. 40, 175 (2008).
[CrossRef]

Proc. SPIE (5)

B. Pezeshki, M. Hagberg, B. Lu, M. Zelinski, S. Zou, and E. Kolev, Proc. SPIE 3947, 80 (2000).
[CrossRef]

R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, and W. G. Kaenders, Proc. SPIE 6485, 648516 (2007).
[CrossRef]

B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Häring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. Weyers, M. Zorn, and G. Tränkle, Proc. SPIE 6485, 648517 (2007).
[CrossRef]

L. B. Glebov, Proc. SPIE 6216, 621601 (2006).
[CrossRef]

O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, and P. M. Petersen, Proc. SPIE 6456, 6456A0 (2007).

Other (6)

ISO 11146 Lasers and laser-related equipment--test methods for laser beam parameters--beam width, divergence, angle and beam propagation factor (1999).

L. Borruel, S. Sujecki, J. Wykes, H. Welzel, E. C. Larkins, and I. Esquivias, in Proceedings of the Fourth International Conference on Numerical Simulation of Optoelectronic Devices (IEEE, 2004), p. 9.
[CrossRef]

A. R. Adams, E. P. O'Reilly, and M. Silver, in Semiconductor Lasers I: Fundamentals, E.Kapon ed. (Academic, 1999), p. 167.

R. L. McCreery, in Raman Spectroscopy for Chemical Analysis, Chemical Analysis (Wiley, 2000), Vol. 157, p. 128.

R. Grunwald, H. Schoennagel, and A. Bärwolff, in Technical Digest Series of CLEO'99 (IEEE, 1999), paper CWF32.

Y. Uchiyama and M. Tsuchiya, in Technical Digest Series of CLEO/Pacific Rim '99 (IEEE, 1999), paper CTuM17.

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Figures (4)

Fig. 1
Fig. 1

MECL configuration based on TPG, FAC, SAC, and RBG is prepared on an AlN micro-optical bench and CCP.

Fig. 2
Fig. 2

Power-current characteristics of MECLs at 15 ° C .

Fig. 3
Fig. 3

Spectral behavior of MECLs at 15 ° C . (a) Comparison of ASE and lasing spectra for 3° MECL. (b) Center wavelength of MECL emission spectra versus optical power in pulse operation. (c) Spectral width of MECLs in pulse mode.

Fig. 4
Fig. 4

Lateral beam propagation ratios M 1 e 2 2 of MECLs at 15 ° C in pulse mode.

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