Abstract

A yellow-emitting Tb3Al5O12:Ce3+ (TAG:Ce) phosphor was coated on blue light-emitting diodes (LEDs) to obtain white LEDs (WLEDs). Since TAG:Ce showed 90% of the brightness of Y3Al5O12:Ce3+ (YAG:Ce), it was expected that TAG:Ce-based WLEDs showed 90% of brightness of YAG:Ce-based ones. However, the TAG:Ce-based WLED showed 74% of the brightness of YAG:Ce-based one. Considering the density and size of the phosphors, the higher density and larger size of TAG:Ce induced a great deal of sedimentation of TAG:Ce particles in an epoxy resin. It is believed that this is one of main reasons for the reduced optical power of the TAG:Ce-based WLED compared to that of the WLED expected from the brightness of TAG:Ce.

© 2008 Optical Society of America

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H. S. Jang and D. Y. Jeon, Appl. Phys. Lett. 90, 041906 (2007).
[CrossRef]

H. S. Jang and D. Y. Jeon, Opt. Lett. 32, 3444 (2007).
[CrossRef] [PubMed]

H. S. Jang, W. B. Im, D. C. Lee, D. Y. Jeon, and S. S. Kim, J. Lumin. 126, 371 (2007).
[CrossRef]

H. S. Jang, J. H. Kang, Y.-H. Won, S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 90, 071908 (2007).
[CrossRef]

2006 (1)

Y.-H. Won, H. S. Jang, W. B. Im, J. S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 89, 231909 (2006).
[CrossRef]

2005 (1)

H. Luo, J. K. Kim, E. F. Schubert, J. Cho, C. Sone, and Y. Park, Appl. Phys. Lett. 86, 243505 (2005).
[CrossRef]

2004 (1)

2003 (1)

M. Yamada, T. Naitou, K. Izuno, H. Tamaki, Y. Murazaki, M. Kameshima, and T. Mukai, Jpn. J. Appl. Phys. 42, L20 (2003).
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2002 (1)

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Arik, M.

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Becker, C.

M. Arik, S. Weaver, C. Becker, M. Hsing, and A. Srivastava, Proceedings of American Society of Mechanical Engineers International Electronic Packaging Technical Conference and Exhibition (American Society of Mechanical Engineers, 2003), InterPack2003-35015.
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Cho, J.

H. Luo, J. K. Kim, E. F. Schubert, J. Cho, C. Sone, and Y. Park, Appl. Phys. Lett. 86, 243505 (2005).
[CrossRef]

Hirosaki, N.

Hsing, M.

M. Arik, S. Weaver, C. Becker, M. Hsing, and A. Srivastava, Proceedings of American Society of Mechanical Engineers International Electronic Packaging Technical Conference and Exhibition (American Society of Mechanical Engineers, 2003), InterPack2003-35015.
[PubMed]

Im, W. B.

H. S. Jang, W. B. Im, D. C. Lee, D. Y. Jeon, and S. S. Kim, J. Lumin. 126, 371 (2007).
[CrossRef]

Y.-H. Won, H. S. Jang, W. B. Im, J. S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 89, 231909 (2006).
[CrossRef]

Izuno, K.

M. Yamada, T. Naitou, K. Izuno, H. Tamaki, Y. Murazaki, M. Kameshima, and T. Mukai, Jpn. J. Appl. Phys. 42, L20 (2003).
[CrossRef]

Jang, H. S.

H. S. Jang, W. B. Im, D. C. Lee, D. Y. Jeon, and S. S. Kim, J. Lumin. 126, 371 (2007).
[CrossRef]

H. S. Jang and D. Y. Jeon, Opt. Lett. 32, 3444 (2007).
[CrossRef] [PubMed]

H. S. Jang and D. Y. Jeon, Appl. Phys. Lett. 90, 041906 (2007).
[CrossRef]

H. S. Jang, J. H. Kang, Y.-H. Won, S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 90, 071908 (2007).
[CrossRef]

Y.-H. Won, H. S. Jang, W. B. Im, J. S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 89, 231909 (2006).
[CrossRef]

Jeon, D. Y.

H. S. Jang and D. Y. Jeon, Opt. Lett. 32, 3444 (2007).
[CrossRef] [PubMed]

H. S. Jang and D. Y. Jeon, Appl. Phys. Lett. 90, 041906 (2007).
[CrossRef]

H. S. Jang, W. B. Im, D. C. Lee, D. Y. Jeon, and S. S. Kim, J. Lumin. 126, 371 (2007).
[CrossRef]

H. S. Jang, J. H. Kang, Y.-H. Won, S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 90, 071908 (2007).
[CrossRef]

Y.-H. Won, H. S. Jang, W. B. Im, J. S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 89, 231909 (2006).
[CrossRef]

Kameshima, M.

M. Yamada, T. Naitou, K. Izuno, H. Tamaki, Y. Murazaki, M. Kameshima, and T. Mukai, Jpn. J. Appl. Phys. 42, L20 (2003).
[CrossRef]

Kang, J. H.

H. S. Jang, J. H. Kang, Y.-H. Won, S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 90, 071908 (2007).
[CrossRef]

Kim, J. K.

H. Luo, J. K. Kim, E. F. Schubert, J. Cho, C. Sone, and Y. Park, Appl. Phys. Lett. 86, 243505 (2005).
[CrossRef]

Kim, S. S.

H. S. Jang, W. B. Im, D. C. Lee, D. Y. Jeon, and S. S. Kim, J. Lumin. 126, 371 (2007).
[CrossRef]

Kimura, N.

Krames, M. R.

R. Mueller-Mach, G. O. Mueller, M. R. Krames, and T. Trottier, IEEE J. Sel. Top. Quantum Electron. 8, 339 (2002).
[CrossRef]

Lee, D. C.

H. S. Jang, W. B. Im, D. C. Lee, D. Y. Jeon, and S. S. Kim, J. Lumin. 126, 371 (2007).
[CrossRef]

Lee, J. S.

Y.-H. Won, H. S. Jang, W. B. Im, J. S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 89, 231909 (2006).
[CrossRef]

Lee, S.

H. S. Jang, J. H. Kang, Y.-H. Won, S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 90, 071908 (2007).
[CrossRef]

Luo, H.

H. Luo, J. K. Kim, E. F. Schubert, J. Cho, C. Sone, and Y. Park, Appl. Phys. Lett. 86, 243505 (2005).
[CrossRef]

Mueller, G. O.

R. Mueller-Mach, G. O. Mueller, M. R. Krames, and T. Trottier, IEEE J. Sel. Top. Quantum Electron. 8, 339 (2002).
[CrossRef]

Mueller-Mach, R.

R. Mueller-Mach, G. O. Mueller, M. R. Krames, and T. Trottier, IEEE J. Sel. Top. Quantum Electron. 8, 339 (2002).
[CrossRef]

Mukai, T.

M. Yamada, T. Naitou, K. Izuno, H. Tamaki, Y. Murazaki, M. Kameshima, and T. Mukai, Jpn. J. Appl. Phys. 42, L20 (2003).
[CrossRef]

Murazaki, Y.

M. Yamada, T. Naitou, K. Izuno, H. Tamaki, Y. Murazaki, M. Kameshima, and T. Mukai, Jpn. J. Appl. Phys. 42, L20 (2003).
[CrossRef]

Naitou, T.

M. Yamada, T. Naitou, K. Izuno, H. Tamaki, Y. Murazaki, M. Kameshima, and T. Mukai, Jpn. J. Appl. Phys. 42, L20 (2003).
[CrossRef]

Ohashi, M.

Omichi, K.

Park, Y.

H. Luo, J. K. Kim, E. F. Schubert, J. Cho, C. Sone, and Y. Park, Appl. Phys. Lett. 86, 243505 (2005).
[CrossRef]

Sakuma, K.

Schubert, E. F.

H. Luo, J. K. Kim, E. F. Schubert, J. Cho, C. Sone, and Y. Park, Appl. Phys. Lett. 86, 243505 (2005).
[CrossRef]

Sone, C.

H. Luo, J. K. Kim, E. F. Schubert, J. Cho, C. Sone, and Y. Park, Appl. Phys. Lett. 86, 243505 (2005).
[CrossRef]

Srivastava, A.

M. Arik, S. Weaver, C. Becker, M. Hsing, and A. Srivastava, Proceedings of American Society of Mechanical Engineers International Electronic Packaging Technical Conference and Exhibition (American Society of Mechanical Engineers, 2003), InterPack2003-35015.
[PubMed]

Suehiro, T.

Tamaki, H.

M. Yamada, T. Naitou, K. Izuno, H. Tamaki, Y. Murazaki, M. Kameshima, and T. Mukai, Jpn. J. Appl. Phys. 42, L20 (2003).
[CrossRef]

Tanaka, D.

Trottier, T.

R. Mueller-Mach, G. O. Mueller, M. R. Krames, and T. Trottier, IEEE J. Sel. Top. Quantum Electron. 8, 339 (2002).
[CrossRef]

Weaver, S.

M. Arik, S. Weaver, C. Becker, M. Hsing, and A. Srivastava, Proceedings of American Society of Mechanical Engineers International Electronic Packaging Technical Conference and Exhibition (American Society of Mechanical Engineers, 2003), InterPack2003-35015.
[PubMed]

Won, Y.-H.

H. S. Jang, J. H. Kang, Y.-H. Won, S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 90, 071908 (2007).
[CrossRef]

Y.-H. Won, H. S. Jang, W. B. Im, J. S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 89, 231909 (2006).
[CrossRef]

Xie, R.-J.

Yamada, M.

M. Yamada, T. Naitou, K. Izuno, H. Tamaki, Y. Murazaki, M. Kameshima, and T. Mukai, Jpn. J. Appl. Phys. 42, L20 (2003).
[CrossRef]

Yamamoto, Y.

Appl. Phys. Lett. (4)

H. S. Jang and D. Y. Jeon, Appl. Phys. Lett. 90, 041906 (2007).
[CrossRef]

Y.-H. Won, H. S. Jang, W. B. Im, J. S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 89, 231909 (2006).
[CrossRef]

H. S. Jang, J. H. Kang, Y.-H. Won, S. Lee, and D. Y. Jeon, Appl. Phys. Lett. 90, 071908 (2007).
[CrossRef]

H. Luo, J. K. Kim, E. F. Schubert, J. Cho, C. Sone, and Y. Park, Appl. Phys. Lett. 86, 243505 (2005).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron. (1)

R. Mueller-Mach, G. O. Mueller, M. R. Krames, and T. Trottier, IEEE J. Sel. Top. Quantum Electron. 8, 339 (2002).
[CrossRef]

J. Lumin. (1)

H. S. Jang, W. B. Im, D. C. Lee, D. Y. Jeon, and S. S. Kim, J. Lumin. 126, 371 (2007).
[CrossRef]

Jpn. J. Appl. Phys. (1)

M. Yamada, T. Naitou, K. Izuno, H. Tamaki, Y. Murazaki, M. Kameshima, and T. Mukai, Jpn. J. Appl. Phys. 42, L20 (2003).
[CrossRef]

Opt. Lett. (2)

Other (2)

M. Arik, S. Weaver, C. Becker, M. Hsing, and A. Srivastava, Proceedings of American Society of Mechanical Engineers International Electronic Packaging Technical Conference and Exhibition (American Society of Mechanical Engineers, 2003), InterPack2003-35015.
[PubMed]

http://en.wikipedia.org/wiki/Buoyancy.

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Figures (4)

Fig. 1
Fig. 1

Schematic diagrams of particle distribution in transparent resin: (a) dispersed distribution, (b) local distribution, (c) remote distribution.

Fig. 2
Fig. 2

(a) PL spectra of TAG:Ce and YAG:Ce and (b) EL spectra of TAG-WLED and YAG-WLED.

Fig. 3
Fig. 3

Cross-sectional SEM images of (a) TAG-WLED and (b) YAG-WLED.

Fig. 4
Fig. 4

Sedimentation profiles ( Δ T and Δ BS ) of (a) TAG:Ce and (b) YAG:Ce in the epoxy.

Tables (1)

Tables Icon

Table 1 Physical Properties of TAG:Ce and YAG:Ce

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

F Buo = ρ E V g ,
F T = M T g + F T Buo = ρ T V T g ρ E V T g = ( ρ T ρ E ) V T g ,
F Y = M Y g + F Y Buo = ( ρ Y ρ E ) V Y g .

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