Abstract

A second-harmonic interferometer using 25ps pluses is presented, achieving a sensitivity of 9×1010m in measuring line-integrated dispersion between 1064 and 532nm. Using the same laser source, a third-harmonic interferometer is demonstrated for the first time to our knowledge, achieving a sensitivity of 7×109m in measuring line-integrated dispersion between 1064 and 355nm. The prospect for the development and use of high-harmonic interferometry is discussed.

© 2008 Optical Society of America

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