Abstract

Sensitive temperature-induced line shifts of the near-band-edge emission from ZnO:Ga and ZnO:Zn are investigated for two-dimensional (2D) thermometry with nanosecond time resolution. Spectral and temporal concerns for 2D measurements and the feasibility for utilizing the line shifts for temperature measurements using a spectral ratio are investigated. Owing to the high temperature sensitivity, a precision of 1% at 800K is reported for spectral ratio measurements. The technique is demonstrated by 2D measurements of the liquid temperature of burning methanol droplets.

© 2008 Optical Society of America

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  1. S. W. Allison and G. T. Gillies, Rev. Sci. Instrum. 68, 2615 (1997).
    [CrossRef]
  2. D. J. Bizzak and M. K. Chyu, Rev. Sci. Instrum. 65, 102 (1994).
    [CrossRef]
  3. A. Omrane, F. Ossler, and M. Aldén, Proc. Combust. Inst. 29, 2653 (2003).
    [CrossRef]
  4. A. L. Fischer, Photonics Spectra 40, 95 (2006).
  5. J. Antony and Y. Qiang, Nanotechnology (to be published).
  6. T. O. K. Kishimoto, S. Tachibana, H. Sannomiya, and K. Nomoto, in 28th IEEE Power Systems Conference (IEEE, 2000), p. 754.
  7. M. C. Jeong, B. Y. Oh, O. H. Nam, T. Kim, and J. M. Myoung, Nanotechnology 17, 526 (2006).
    [CrossRef]
  8. T. Batsch, B. Bengtson, and M. Moszynski, Nucl. Instrum. Methods 125, 443 (1975).
    [CrossRef]
  9. S. E. Derenzo, M. J. Weber, and M. K. Klintenberg, Nucl. Instrum. Methods 486, 214 (2002).
    [CrossRef]
  10. W. Lehmann, Solid-State Electron. 9, 1107 (1966).
    [CrossRef]
  11. Z. S. Liu, X. P. Jing, H. W. Song, and L. B. Fan, Acta Phys.-Chim. Sin. 22, 1383 (2006).
    [CrossRef]
  12. Y. Zhang, B. X. Lin, X. K. Sun, and Z. X. Fu, Appl. Phys. Lett. 86, 131910 (2005).
    [CrossRef]
  13. S. B. S. Roy, Bull. Mater. Sci. 25, 513 (2002).
    [CrossRef]
  14. J. P. A. J. vanBeeck and M. L. Riethmuller, Part. Part. Syst. Charact. 14, 186 (1997).
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    [CrossRef]
  16. A. Omrane, G. Juhlin, M. Aldén, J. Josefsson, and J. Engström, in SAE Annual Conference (Society of Automotive Engineers, 2004), paper 2004-01-0609.

2006 (4)

A. L. Fischer, Photonics Spectra 40, 95 (2006).

M. C. Jeong, B. Y. Oh, O. H. Nam, T. Kim, and J. M. Myoung, Nanotechnology 17, 526 (2006).
[CrossRef]

Z. S. Liu, X. P. Jing, H. W. Song, and L. B. Fan, Acta Phys.-Chim. Sin. 22, 1383 (2006).
[CrossRef]

C. Maqua, G. Castanet, F. Lemoine, and N. Doue, Exp. Fluids 40, 786 (2006).
[CrossRef]

2005 (1)

Y. Zhang, B. X. Lin, X. K. Sun, and Z. X. Fu, Appl. Phys. Lett. 86, 131910 (2005).
[CrossRef]

2003 (1)

A. Omrane, F. Ossler, and M. Aldén, Proc. Combust. Inst. 29, 2653 (2003).
[CrossRef]

2002 (2)

S. E. Derenzo, M. J. Weber, and M. K. Klintenberg, Nucl. Instrum. Methods 486, 214 (2002).
[CrossRef]

S. B. S. Roy, Bull. Mater. Sci. 25, 513 (2002).
[CrossRef]

1997 (2)

J. P. A. J. vanBeeck and M. L. Riethmuller, Part. Part. Syst. Charact. 14, 186 (1997).

S. W. Allison and G. T. Gillies, Rev. Sci. Instrum. 68, 2615 (1997).
[CrossRef]

1994 (1)

D. J. Bizzak and M. K. Chyu, Rev. Sci. Instrum. 65, 102 (1994).
[CrossRef]

1975 (1)

T. Batsch, B. Bengtson, and M. Moszynski, Nucl. Instrum. Methods 125, 443 (1975).
[CrossRef]

1966 (1)

W. Lehmann, Solid-State Electron. 9, 1107 (1966).
[CrossRef]

Aldén, M.

A. Omrane, F. Ossler, and M. Aldén, Proc. Combust. Inst. 29, 2653 (2003).
[CrossRef]

A. Omrane, G. Juhlin, M. Aldén, J. Josefsson, and J. Engström, in SAE Annual Conference (Society of Automotive Engineers, 2004), paper 2004-01-0609.

Allison, S. W.

S. W. Allison and G. T. Gillies, Rev. Sci. Instrum. 68, 2615 (1997).
[CrossRef]

Antony, J.

J. Antony and Y. Qiang, Nanotechnology (to be published).

Batsch, T.

T. Batsch, B. Bengtson, and M. Moszynski, Nucl. Instrum. Methods 125, 443 (1975).
[CrossRef]

Bengtson, B.

T. Batsch, B. Bengtson, and M. Moszynski, Nucl. Instrum. Methods 125, 443 (1975).
[CrossRef]

Bizzak, D. J.

D. J. Bizzak and M. K. Chyu, Rev. Sci. Instrum. 65, 102 (1994).
[CrossRef]

Castanet, G.

C. Maqua, G. Castanet, F. Lemoine, and N. Doue, Exp. Fluids 40, 786 (2006).
[CrossRef]

Chyu, M. K.

D. J. Bizzak and M. K. Chyu, Rev. Sci. Instrum. 65, 102 (1994).
[CrossRef]

Derenzo, S. E.

S. E. Derenzo, M. J. Weber, and M. K. Klintenberg, Nucl. Instrum. Methods 486, 214 (2002).
[CrossRef]

Doue, N.

C. Maqua, G. Castanet, F. Lemoine, and N. Doue, Exp. Fluids 40, 786 (2006).
[CrossRef]

Engström, J.

A. Omrane, G. Juhlin, M. Aldén, J. Josefsson, and J. Engström, in SAE Annual Conference (Society of Automotive Engineers, 2004), paper 2004-01-0609.

Fan, L. B.

Z. S. Liu, X. P. Jing, H. W. Song, and L. B. Fan, Acta Phys.-Chim. Sin. 22, 1383 (2006).
[CrossRef]

Fischer, A. L.

A. L. Fischer, Photonics Spectra 40, 95 (2006).

Fu, Z. X.

Y. Zhang, B. X. Lin, X. K. Sun, and Z. X. Fu, Appl. Phys. Lett. 86, 131910 (2005).
[CrossRef]

Gillies, G. T.

S. W. Allison and G. T. Gillies, Rev. Sci. Instrum. 68, 2615 (1997).
[CrossRef]

Jeong, M. C.

M. C. Jeong, B. Y. Oh, O. H. Nam, T. Kim, and J. M. Myoung, Nanotechnology 17, 526 (2006).
[CrossRef]

Jing, X. P.

Z. S. Liu, X. P. Jing, H. W. Song, and L. B. Fan, Acta Phys.-Chim. Sin. 22, 1383 (2006).
[CrossRef]

Josefsson, J.

A. Omrane, G. Juhlin, M. Aldén, J. Josefsson, and J. Engström, in SAE Annual Conference (Society of Automotive Engineers, 2004), paper 2004-01-0609.

Juhlin, G.

A. Omrane, G. Juhlin, M. Aldén, J. Josefsson, and J. Engström, in SAE Annual Conference (Society of Automotive Engineers, 2004), paper 2004-01-0609.

Kim, T.

M. C. Jeong, B. Y. Oh, O. H. Nam, T. Kim, and J. M. Myoung, Nanotechnology 17, 526 (2006).
[CrossRef]

Kishimoto, T. O. K.

T. O. K. Kishimoto, S. Tachibana, H. Sannomiya, and K. Nomoto, in 28th IEEE Power Systems Conference (IEEE, 2000), p. 754.

Klintenberg, M. K.

S. E. Derenzo, M. J. Weber, and M. K. Klintenberg, Nucl. Instrum. Methods 486, 214 (2002).
[CrossRef]

Lehmann, W.

W. Lehmann, Solid-State Electron. 9, 1107 (1966).
[CrossRef]

Lemoine, F.

C. Maqua, G. Castanet, F. Lemoine, and N. Doue, Exp. Fluids 40, 786 (2006).
[CrossRef]

Lin, B. X.

Y. Zhang, B. X. Lin, X. K. Sun, and Z. X. Fu, Appl. Phys. Lett. 86, 131910 (2005).
[CrossRef]

Liu, Z. S.

Z. S. Liu, X. P. Jing, H. W. Song, and L. B. Fan, Acta Phys.-Chim. Sin. 22, 1383 (2006).
[CrossRef]

Maqua, C.

C. Maqua, G. Castanet, F. Lemoine, and N. Doue, Exp. Fluids 40, 786 (2006).
[CrossRef]

Moszynski, M.

T. Batsch, B. Bengtson, and M. Moszynski, Nucl. Instrum. Methods 125, 443 (1975).
[CrossRef]

Myoung, J. M.

M. C. Jeong, B. Y. Oh, O. H. Nam, T. Kim, and J. M. Myoung, Nanotechnology 17, 526 (2006).
[CrossRef]

Nam, O. H.

M. C. Jeong, B. Y. Oh, O. H. Nam, T. Kim, and J. M. Myoung, Nanotechnology 17, 526 (2006).
[CrossRef]

Nomoto, K.

T. O. K. Kishimoto, S. Tachibana, H. Sannomiya, and K. Nomoto, in 28th IEEE Power Systems Conference (IEEE, 2000), p. 754.

Oh, B. Y.

M. C. Jeong, B. Y. Oh, O. H. Nam, T. Kim, and J. M. Myoung, Nanotechnology 17, 526 (2006).
[CrossRef]

Omrane, A.

A. Omrane, F. Ossler, and M. Aldén, Proc. Combust. Inst. 29, 2653 (2003).
[CrossRef]

A. Omrane, G. Juhlin, M. Aldén, J. Josefsson, and J. Engström, in SAE Annual Conference (Society of Automotive Engineers, 2004), paper 2004-01-0609.

Ossler, F.

A. Omrane, F. Ossler, and M. Aldén, Proc. Combust. Inst. 29, 2653 (2003).
[CrossRef]

Qiang, Y.

J. Antony and Y. Qiang, Nanotechnology (to be published).

Riethmuller, M. L.

J. P. A. J. vanBeeck and M. L. Riethmuller, Part. Part. Syst. Charact. 14, 186 (1997).

Roy, S. B. S.

S. B. S. Roy, Bull. Mater. Sci. 25, 513 (2002).
[CrossRef]

Sannomiya, H.

T. O. K. Kishimoto, S. Tachibana, H. Sannomiya, and K. Nomoto, in 28th IEEE Power Systems Conference (IEEE, 2000), p. 754.

Song, H. W.

Z. S. Liu, X. P. Jing, H. W. Song, and L. B. Fan, Acta Phys.-Chim. Sin. 22, 1383 (2006).
[CrossRef]

Sun, X. K.

Y. Zhang, B. X. Lin, X. K. Sun, and Z. X. Fu, Appl. Phys. Lett. 86, 131910 (2005).
[CrossRef]

Tachibana, S.

T. O. K. Kishimoto, S. Tachibana, H. Sannomiya, and K. Nomoto, in 28th IEEE Power Systems Conference (IEEE, 2000), p. 754.

vanBeeck, J. P. A. J.

J. P. A. J. vanBeeck and M. L. Riethmuller, Part. Part. Syst. Charact. 14, 186 (1997).

Weber, M. J.

S. E. Derenzo, M. J. Weber, and M. K. Klintenberg, Nucl. Instrum. Methods 486, 214 (2002).
[CrossRef]

Zhang, Y.

Y. Zhang, B. X. Lin, X. K. Sun, and Z. X. Fu, Appl. Phys. Lett. 86, 131910 (2005).
[CrossRef]

Acta Phys.-Chim. Sin. (1)

Z. S. Liu, X. P. Jing, H. W. Song, and L. B. Fan, Acta Phys.-Chim. Sin. 22, 1383 (2006).
[CrossRef]

Appl. Phys. Lett. (1)

Y. Zhang, B. X. Lin, X. K. Sun, and Z. X. Fu, Appl. Phys. Lett. 86, 131910 (2005).
[CrossRef]

Bull. Mater. Sci. (1)

S. B. S. Roy, Bull. Mater. Sci. 25, 513 (2002).
[CrossRef]

Exp. Fluids (1)

C. Maqua, G. Castanet, F. Lemoine, and N. Doue, Exp. Fluids 40, 786 (2006).
[CrossRef]

Nanotechnology (1)

M. C. Jeong, B. Y. Oh, O. H. Nam, T. Kim, and J. M. Myoung, Nanotechnology 17, 526 (2006).
[CrossRef]

Nucl. Instrum. Methods (2)

T. Batsch, B. Bengtson, and M. Moszynski, Nucl. Instrum. Methods 125, 443 (1975).
[CrossRef]

S. E. Derenzo, M. J. Weber, and M. K. Klintenberg, Nucl. Instrum. Methods 486, 214 (2002).
[CrossRef]

Part. Part. Syst. Charact. (1)

J. P. A. J. vanBeeck and M. L. Riethmuller, Part. Part. Syst. Charact. 14, 186 (1997).

Photonics Spectra (1)

A. L. Fischer, Photonics Spectra 40, 95 (2006).

Proc. Combust. Inst. (1)

A. Omrane, F. Ossler, and M. Aldén, Proc. Combust. Inst. 29, 2653 (2003).
[CrossRef]

Rev. Sci. Instrum. (2)

S. W. Allison and G. T. Gillies, Rev. Sci. Instrum. 68, 2615 (1997).
[CrossRef]

D. J. Bizzak and M. K. Chyu, Rev. Sci. Instrum. 65, 102 (1994).
[CrossRef]

Solid-State Electron. (1)

W. Lehmann, Solid-State Electron. 9, 1107 (1966).
[CrossRef]

Other (3)

J. Antony and Y. Qiang, Nanotechnology (to be published).

T. O. K. Kishimoto, S. Tachibana, H. Sannomiya, and K. Nomoto, in 28th IEEE Power Systems Conference (IEEE, 2000), p. 754.

A. Omrane, G. Juhlin, M. Aldén, J. Josefsson, and J. Engström, in SAE Annual Conference (Society of Automotive Engineers, 2004), paper 2004-01-0609.

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Figures (4)

Fig. 1
Fig. 1

Normalized ZnO : Ga spectra. As the temperature increases, the UV-emission line is increasingly redshifted. The emission peak position is plotted as a function of temperature on the right axis.

Fig. 2
Fig. 2

Normalized ZnO : Zn spectra. As the temperature increases, the UV-emission line is increasingly redshifted. The small green emission peak around 510 nm is visible at low temperatures. The emission peak position is plotted as a function of temperature on the right axis.

Fig. 3
Fig. 3

Temperature sensitivity calibration of ZnO : Zn and ZnO : Ga using the ratio between a 390 ± 5 nm interference filter and either an edge long-pass filter or a glass absorption high-pass filter (GG).

Fig. 4
Fig. 4

(a) Falling burning methanol droplet photographed with an ICCD camera. (b) Temperature image of a falling burning methanol droplet taken in the middle of the Bunsen burner. The camera exposure time is 10 ns .

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