Abstract

We investigate the reflection of a TM-polarized light beam from a Kretschmann configuration with a Kerr nonlinear dielectric. It is found that there exists a hysteretic response between the lateral shift of the reflected beam and the intensity of the incident beam. In contrast to the lower switch threshold, the higher switch threshold of optical bistability is more sensitive to the variations of the angle of incidence and the thickness of metal film. It is also found that the peak value of the lateral shift is strongly dependent on the thickness of metal film.

© 2008 Optical Society of America

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2007 (4)

2006 (2)

X. Yin and L. Hesselink, Appl. Phys. Lett. 89, 261108 (2006).
[CrossRef]

M. Peccianti, A. Dyadyusha, M. Kaczmarek, and G. Assanto, Nat. Phys. 2, 737 (2006).
[CrossRef]

2005 (1)

X. Yin, L. Hesselink, Z. Liu, N. Fang, and X. Zhang, Appl. Phys. Lett. 85, 372 (2005).
[CrossRef]

2003 (1)

I. V. Shadrivov, A. A. Zharov, and Y. S. Kivshar, Appl. Phys. Lett. 83, 2713 (2003).
[CrossRef]

1995 (1)

O. Emile, T. Galstyan, A. Le Floch, and F. Bretenaker, Phys. Rev. Lett. 75, 1511 (1995).
[CrossRef] [PubMed]

1986 (1)

1985 (1)

1984 (2)

1983 (1)

1981 (1)

1971 (1)

E. Kretschmann, Z. Physik 241, 313 (1971).
[CrossRef]

1948 (1)

K. V. Artmann, Ann. Phys. 2, 87 (1948).
[CrossRef]

1947 (1)

F. Goos and H. Hächen, Ann. Phys. 1, 333 (1947).
[CrossRef]

Agarwal, G. S.

Artmann, K. V.

K. V. Artmann, Ann. Phys. 2, 87 (1948).
[CrossRef]

Assanto, G.

M. Peccianti, A. Dyadyusha, M. Kaczmarek, and G. Assanto, Nat. Phys. 2, 737 (2006).
[CrossRef]

Bretenaker, F.

O. Emile, T. Galstyan, A. Le Floch, and F. Bretenaker, Phys. Rev. Lett. 75, 1511 (1995).
[CrossRef] [PubMed]

Cao, Z.

Chen, L.

Chen, X.

Y. Yan, X. Chen, and C.-F. Li, Phys. Lett. A 361, 178 (2007).
[CrossRef]

P. Hou, Y. Chen, X. Chen, J. Shi, and Q. Wang, Phys. Rev. A 75, 045802 (2007).
[CrossRef]

Chen, Y.

P. Hou, Y. Chen, X. Chen, J. Shi, and Q. Wang, Phys. Rev. A 75, 045802 (2007).
[CrossRef]

Deck, R. T.

Dyadyusha, A.

M. Peccianti, A. Dyadyusha, M. Kaczmarek, and G. Assanto, Nat. Phys. 2, 737 (2006).
[CrossRef]

Emile, O.

O. Emile, T. Galstyan, A. Le Floch, and F. Bretenaker, Phys. Rev. Lett. 75, 1511 (1995).
[CrossRef] [PubMed]

Fang, N.

X. Yin, L. Hesselink, Z. Liu, N. Fang, and X. Zhang, Appl. Phys. Lett. 85, 372 (2005).
[CrossRef]

Gabitov, I. R.

Galstyan, T.

O. Emile, T. Galstyan, A. Le Floch, and F. Bretenaker, Phys. Rev. Lett. 75, 1511 (1995).
[CrossRef] [PubMed]

Goos, F.

F. Goos and H. Hächen, Ann. Phys. 1, 333 (1947).
[CrossRef]

Gupta, S. D.

Hächen, H.

F. Goos and H. Hächen, Ann. Phys. 1, 333 (1947).
[CrossRef]

Hesselink, L.

X. Yin and L. Hesselink, Appl. Phys. Lett. 89, 261108 (2006).
[CrossRef]

X. Yin, L. Hesselink, Z. Liu, N. Fang, and X. Zhang, Appl. Phys. Lett. 85, 372 (2005).
[CrossRef]

Hou, P.

P. Hou, Y. Chen, X. Chen, J. Shi, and Q. Wang, Phys. Rev. A 75, 045802 (2007).
[CrossRef]

Kaczmarek, M.

M. Peccianti, A. Dyadyusha, M. Kaczmarek, and G. Assanto, Nat. Phys. 2, 737 (2006).
[CrossRef]

Kivshar, Y. S.

I. V. Shadrivov, A. A. Zharov, and Y. S. Kivshar, Appl. Phys. Lett. 83, 2713 (2003).
[CrossRef]

Kretschmann, E.

E. Kretschmann, Z. Physik 241, 313 (1971).
[CrossRef]

Le Floch, A.

O. Emile, T. Galstyan, A. Le Floch, and F. Bretenaker, Phys. Rev. Lett. 75, 1511 (1995).
[CrossRef] [PubMed]

Li, C.-F.

Y. Yan, X. Chen, and C.-F. Li, Phys. Lett. A 361, 178 (2007).
[CrossRef]

Li, H.

Litchinitser, N. M.

Liu, Z.

X. Yin, L. Hesselink, Z. Liu, N. Fang, and X. Zhang, Appl. Phys. Lett. 85, 372 (2005).
[CrossRef]

Maimistov, A. I.

Montemayor, V. J.

Ou, F.

Peccianti, M.

M. Peccianti, A. Dyadyusha, M. Kaczmarek, and G. Assanto, Nat. Phys. 2, 737 (2006).
[CrossRef]

Qiao, H.

Seaton, C. T.

Shadrivov, I. V.

I. V. Shadrivov, A. A. Zharov, and Y. S. Kivshar, Appl. Phys. Lett. 83, 2713 (2003).
[CrossRef]

Shah, V.

Shalaev, V. M.

Shen, Q.

Shi, J.

P. Hou, Y. Chen, X. Chen, J. Shi, and Q. Wang, Phys. Rev. A 75, 045802 (2007).
[CrossRef]

Simon, H. J.

Stegeman, G. I.

Tamir, T.

Wang, Q.

P. Hou, Y. Chen, X. Chen, J. Shi, and Q. Wang, Phys. Rev. A 75, 045802 (2007).
[CrossRef]

Wysin, G. M.

Yan, Y.

Y. Yan, X. Chen, and C.-F. Li, Phys. Lett. A 361, 178 (2007).
[CrossRef]

Yin, X.

X. Yin and L. Hesselink, Appl. Phys. Lett. 89, 261108 (2006).
[CrossRef]

X. Yin, L. Hesselink, Z. Liu, N. Fang, and X. Zhang, Appl. Phys. Lett. 85, 372 (2005).
[CrossRef]

Zhang, X.

X. Yin, L. Hesselink, Z. Liu, N. Fang, and X. Zhang, Appl. Phys. Lett. 85, 372 (2005).
[CrossRef]

Zharov, A. A.

I. V. Shadrivov, A. A. Zharov, and Y. S. Kivshar, Appl. Phys. Lett. 83, 2713 (2003).
[CrossRef]

Ann. Phys. (2)

F. Goos and H. Hächen, Ann. Phys. 1, 333 (1947).
[CrossRef]

K. V. Artmann, Ann. Phys. 2, 87 (1948).
[CrossRef]

Appl. Phys. Lett. (3)

X. Yin, L. Hesselink, Z. Liu, N. Fang, and X. Zhang, Appl. Phys. Lett. 85, 372 (2005).
[CrossRef]

I. V. Shadrivov, A. A. Zharov, and Y. S. Kivshar, Appl. Phys. Lett. 83, 2713 (2003).
[CrossRef]

X. Yin and L. Hesselink, Appl. Phys. Lett. 89, 261108 (2006).
[CrossRef]

J. Opt. Soc. Am. (1)

J. Opt. Soc. Am. B (3)

Nat. Phys. (1)

M. Peccianti, A. Dyadyusha, M. Kaczmarek, and G. Assanto, Nat. Phys. 2, 737 (2006).
[CrossRef]

Opt. Lett. (4)

Phys. Lett. A (1)

Y. Yan, X. Chen, and C.-F. Li, Phys. Lett. A 361, 178 (2007).
[CrossRef]

Phys. Rev. A (1)

P. Hou, Y. Chen, X. Chen, J. Shi, and Q. Wang, Phys. Rev. A 75, 045802 (2007).
[CrossRef]

Phys. Rev. Lett. (1)

O. Emile, T. Galstyan, A. Le Floch, and F. Bretenaker, Phys. Rev. Lett. 75, 1511 (1995).
[CrossRef] [PubMed]

Z. Physik (1)

E. Kretschmann, Z. Physik 241, 313 (1971).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Kretschmann configuration for surface-plasmon excitation at interface with Kerr nonlinear dielectric. The lateral shift S is the displacement between the reflected beam (ray r) and the path predicted by geometric optics (dashed arrow).

Fig. 2
Fig. 2

Dependence of the reflectivity R (solid curve) and the phase shift ϕ r (dashed–dotted curve) on the input intensity I 0 for θ = 57.82 ° and d = 58 nm . Other parameters are mentioned in the text.

Fig. 3
Fig. 3

GH shift S versus I 0 with different thickness of silver film d at a fixed incidence angle. Other parameters are mentioned in the text.

Fig. 4
Fig. 4

GH shift S versus the input intensity I 0 with different angles of incidence when d is fixed. Other parameters are mentioned in the text.

Equations (8)

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d 2 H 3 d z 2 + k 0 2 ( ε 3 l ε 1 sin 2 θ + α H 3 2 ) H 3 = 0 ,
H 3 = ( 2 α ) 1 2 q cosh [ q k 0 ( z d ) + κ ] exp i ( C + k x x ω t ) ,
k 3 z e i k 0 q tanh ( κ ) ,
r = r 12 + r 23 exp ( 2 i k 2 z d ) 1 + r 12 r 23 exp ( 2 i k 2 z d ) ,
t = t 12 t 23 exp ( i k 2 z d ) 1 + r 12 r 23 exp ( 2 i k 2 z d ) ,
I 0 = 1 2 ε 1 ε 0 c H 3 d 2 t 2 .
S = 1 ε 1 k 0 d ϕ r d θ ,
d opt = λ ( ε r ε 3 e ) 1 2 4 π ε r ln 4 ε r 2 Im [ r 12 ( θ SPR ) ] ε i ( ε r + ε 3 e ) ,

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