Abstract

We demonstrate a means of creating a digital image by using a two-axis tilt micromirror to scan a scene. For each different orientation we extract a single gray scale value from the mirror and combine them to form a single composite image. This allows one to choose the distribution of the samples, and so in principle a variable resolution image could be created. We demonstrate this ability to control resolution and projection by constructing a voltage table that compensates for the nonlinear response of the mirrors to the applied voltage.

© 2007 Optical Society of America

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  13. V. Nasis, R. Hicks, and T. Kurzweg, Proc. SPIE 6114, 61140N (2006).
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    [CrossRef]
  15. T. Nakao and A. Kashitani, in Proceedings of the IEEE International Conference on Image Processing (IEEE, 2001), p. 1045.
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    [CrossRef] [PubMed]

2006 (1)

M. Levoy, IEEE Comput. 39, 46 (2006).
[CrossRef]

2005 (1)

2004 (1)

M. Aggarwal and N. Ahuja, Int. J. Comput. Vis. 58, 7 (2004).
[CrossRef]

2003 (1)

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

2001 (1)

D. Bishop, C. R. Giles, and S. Das, Sci. Am. 248, 88 (2001).
[CrossRef]

1998 (1)

L. Hornbeck, Tex. Instrum. Tech. J. 15, 7 (1998).

1995 (1)

Aggarwal, M.

M. Aggarwal and N. Ahuja, Int. J. Comput. Vis. 58, 7 (2004).
[CrossRef]

Ahuja, N.

M. Aggarwal and N. Ahuja, Int. J. Comput. Vis. 58, 7 (2004).
[CrossRef]

Aksyuk, V. A.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Arney, S.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Baraniuk, R.

D. Takhar, J. Laska, M. Wakin, M. Duarte, D. Baron, S. Sarvotham, K. Kelly, and R. Baraniuk, Proc. SPIE 6065, 606509 (2006).

Baron, D.

D. Takhar, J. Laska, M. Wakin, M. Duarte, D. Baron, S. Sarvotham, K. Kelly, and R. Baraniuk, Proc. SPIE 6065, 606509 (2006).

Basavanhally, N. R.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Bishop, D.

D. Bishop, C. R. Giles, and S. Das, Sci. Am. 248, 88 (2001).
[CrossRef]

Bolle, C. A.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Boult, T.

S. Nayar, V. Branzoi, and T. Boult, in Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (IEEE, 2004), p. 436.
[CrossRef]

Branzoi, V.

S. Nayar, V. Branzoi, and T. Boult, in Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (IEEE, 2004), p. 436.
[CrossRef]

Cathey, W. T.

Chan, H. B.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Das, S.

D. Bishop, C. R. Giles, and S. Das, Sci. Am. 248, 88 (2001).
[CrossRef]

Dickensheets, D.

B. Gogoi, H. Urey, and D. Dickensheets, eds., Proc. SPIE 6114 (2006).

Dowski, E. R.

Duarte, M.

D. Takhar, J. Laska, M. Wakin, M. Duarte, D. Baron, S. Sarvotham, K. Kelly, and R. Baraniuk, Proc. SPIE 6065, 606509 (2006).

Frahm, R. E.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Gasparyan, A.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Gates, J. V.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Giles, C. R.

D. Bishop, C. R. Giles, and S. Das, Sci. Am. 248, 88 (2001).
[CrossRef]

Gogoi, B.

B. Gogoi, H. Urey, and D. Dickensheets, eds., Proc. SPIE 6114 (2006).

Haueis, M.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Hicks, R.

R. Hicks and R. Perline, Appl. Opt. 44, 6108 (2005).
[CrossRef] [PubMed]

V. Nasis, R. Hicks, and T. Kurzweg, Proc. SPIE 6114, 61140N (2006).

Hornbeck, L.

L. Hornbeck, Tex. Instrum. Tech. J. 15, 7 (1998).

Kahn, J.

L. Zhou, M. Last, V. Milanovic, J. Kahn, and K. Pister, in Proceedings of the Eurosensors 2003, Guimaraes, Portugal (2003).

Kashitani, A.

T. Nakao and A. Kashitani, in Proceedings of the IEEE International Conference on Image Processing (IEEE, 2001), p. 1045.

Kelly, K.

D. Takhar, J. Laska, M. Wakin, M. Duarte, D. Baron, S. Sarvotham, K. Kelly, and R. Baraniuk, Proc. SPIE 6065, 606509 (2006).

Kim, J.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Kolodner, P. R.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Kraus, J. S.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Kropp, A.

A. Kropp, N. Master, and S. Teller, in Proceedings of the IEEE Workshop on Omnidirectional Vision (IEEE, 2000), p. 47.
[CrossRef]

Kumar, B.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Kurzweg, T.

V. Nasis, R. Hicks, and T. Kurzweg, Proc. SPIE 6114, 61140N (2006).

Laska, J.

D. Takhar, J. Laska, M. Wakin, M. Duarte, D. Baron, S. Sarvotham, K. Kelly, and R. Baraniuk, Proc. SPIE 6065, 606509 (2006).

Last, M.

L. Zhou, M. Last, V. Milanovic, J. Kahn, and K. Pister, in Proceedings of the Eurosensors 2003, Guimaraes, Portugal (2003).

Levoy, M.

M. Levoy, IEEE Comput. 39, 46 (2006).
[CrossRef]

Lichtenwalner, C. P.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Lieuwen, D. F.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Lifton, V.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Master, N.

A. Kropp, N. Master, and S. Teller, in Proceedings of the IEEE Workshop on Omnidirectional Vision (IEEE, 2000), p. 47.
[CrossRef]

Mertz, L.

L. Mertz and N. O. Young, in Proceedings of the International Conference on Optical Instrumentation Techniques, K.J.Habell, ed. (Chapman and Hall, 1961), p. 305.

Milanovic, V.

L. Zhou, M. Last, V. Milanovic, J. Kahn, and K. Pister, in Proceedings of the Eurosensors 2003, Guimaraes, Portugal (2003).

Nakao, T.

T. Nakao and A. Kashitani, in Proceedings of the IEEE International Conference on Image Processing (IEEE, 2001), p. 1045.

Nasis, V.

V. Nasis, R. Hicks, and T. Kurzweg, Proc. SPIE 6114, 61140N (2006).

Nayar, S.

A. Zomet and S. Nayar, in Proceedings of the 2006 IEEE Computer Society Conference on Computer Vision Pattern Recognition (IEEE, 2006), p. 339.

S. Nayar, V. Branzoi, and T. Boult, in Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (IEEE, 2004), p. 436.
[CrossRef]

Neilson, D. T.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Nuzman, C. J.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Papazian, A. R.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Pardo, F.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Perline, R.

Pister, K.

L. Zhou, M. Last, V. Milanovic, J. Kahn, and K. Pister, in Proceedings of the Eurosensors 2003, Guimaraes, Portugal (2003).

Ramsey, D. A.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Ryf, R.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Sarvotham, S.

D. Takhar, J. Laska, M. Wakin, M. Duarte, D. Baron, S. Sarvotham, K. Kelly, and R. Baraniuk, Proc. SPIE 6065, 606509 (2006).

Shea, H. R.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Simon, M. E.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Takhar, D.

D. Takhar, J. Laska, M. Wakin, M. Duarte, D. Baron, S. Sarvotham, K. Kelly, and R. Baraniuk, Proc. SPIE 6065, 606509 (2006).

Teller, S.

A. Kropp, N. Master, and S. Teller, in Proceedings of the IEEE Workshop on Omnidirectional Vision (IEEE, 2000), p. 47.
[CrossRef]

Urey, H.

B. Gogoi, H. Urey, and D. Dickensheets, eds., Proc. SPIE 6114 (2006).

Wakin, M.

D. Takhar, J. Laska, M. Wakin, M. Duarte, D. Baron, S. Sarvotham, K. Kelly, and R. Baraniuk, Proc. SPIE 6065, 606509 (2006).

Weiss, A.

J. Kim, C. J. Nuzman, B. Kumar, D. F. Lieuwen, J. S. Kraus, A. Weiss, C. P. Lichtenwalner, A. R. Papazian, R. E. Frahm, N. R. Basavanhally, D. A. Ramsey, V. A. Aksyuk, F. Pardo, M. E. Simon, V. Lifton, H. B. Chan, M. Haueis, A. Gasparyan, H. R. Shea, S. Arney, C. A. Bolle, P. R. Kolodner, R. Ryf, D. T. Neilson, and J. V. Gates, IEEE Photonics Technol. Lett. 11, 1537 (2003).
[CrossRef]

Young, N. O.

L. Mertz and N. O. Young, in Proceedings of the International Conference on Optical Instrumentation Techniques, K.J.Habell, ed. (Chapman and Hall, 1961), p. 305.

Zhou, L.

L. Zhou, M. Last, V. Milanovic, J. Kahn, and K. Pister, in Proceedings of the Eurosensors 2003, Guimaraes, Portugal (2003).

Zomet, A.

A. Zomet and S. Nayar, in Proceedings of the 2006 IEEE Computer Society Conference on Computer Vision Pattern Recognition (IEEE, 2006), p. 339.

Appl. Opt. (2)

IEEE Comput. (1)

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Figures (3)

Fig. 1
Fig. 1

Fundamental unit of our test pattern. A checkerboard pattern was chosen to allow for calibration. The two different size checkers illustrated that the resolution of the device was between 0.5 and 0.025 mm .

Fig. 2
Fig. 2

Relationship between the camera, the array, and the test pattern.

Fig. 3
Fig. 3

Image, 160 × 160 , created by scanning the test pattern with a single mirror and uniformly spaced voltages. B, Image, 129 × 129 , obtained by using a nonlinear voltage table. C, Fisheye distortion can be introduced by transforming the voltage table in a radial manner. D, Pincushion distortion introduced by transforming the voltage table appropriately.

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