Abstract

We present a Shack–Hartmann wavefront sensor (SHWS) based on a cylindrical microlens array as a device for measuring highly aberrated wavefronts. Instead of the typical spot pattern created by a conventional SHWS, two orthogonal line patterns are detected on a CCD and are superimposed. A processing algorithm uses the continuity of the focal line to extend the dynamic range of measurement by localizing the line, even if it leaves the CCD area confined by the corresponding microcylinder. The measurement of a wavefront from a progressive addition lens with an 80λ peak-to-valley value reveals the capabilities of the sensor.

© 2007 Optical Society of America

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References

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R. R. Rammage, D. R. Neal, and R. J. Copland, Proc. SPIE 4779, 161 (2002).
[CrossRef]

N. Lindlein and J. Pfund, Opt. Eng. 41, 529 (2002).
[CrossRef]

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D. R. Neal, D. J. Armstrong, and W. T. Turner, Proc. SPIE 2993, 211 (1997).
[CrossRef]

1996

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Armstrong, D. J.

D. R. Neal, D. J. Armstrong, and W. T. Turner, Proc. SPIE 2993, 211 (1997).
[CrossRef]

Chernyshov, A.

Copland, R. J.

R. R. Rammage, D. R. Neal, and R. J. Copland, Proc. SPIE 4779, 161 (2002).
[CrossRef]

Descour, M. R.

DeVore, S. L.

D. Malacara and S. L. DeVore, Optical Shop Testing (Wiley, 1992), p. 461.

Fontanella, J. C.

Helmcke, J.

Jeong, T. M.

Jitsuno, T.

Lee, J.

Lindlein, N.

N. Lindlein and J. Pfund, Opt. Eng. 41, 529 (2002).
[CrossRef]

Malacara, D.

D. Malacara and S. L. DeVore, Optical Shop Testing (Wiley, 1992), p. 461.

Menon, M.

Nakai, S.

Nakatsuka, M.

Neal, D. R.

R. R. Rammage, D. R. Neal, and R. J. Copland, Proc. SPIE 4779, 161 (2002).
[CrossRef]

D. R. Neal, D. J. Armstrong, and W. T. Turner, Proc. SPIE 2993, 211 (1997).
[CrossRef]

Osten, W.

L. Seifert, H. J. Tiziani, and W. Osten, Opt. Commun. 245, 255 (2005).
[CrossRef]

Pfund, J.

Primot, J.

Rammage, R. R.

R. R. Rammage, D. R. Neal, and R. J. Copland, Proc. SPIE 4779, 161 (2002).
[CrossRef]

Riehle, F.

Rousset, G.

Seifert, L.

L. Seifert, H. J. Tiziani, and W. Osten, Opt. Commun. 245, 255 (2005).
[CrossRef]

Shack, R. V.

Sterr, U.

Tiziani, H. J.

L. Seifert, H. J. Tiziani, and W. Osten, Opt. Commun. 245, 255 (2005).
[CrossRef]

Turner, W. T.

D. R. Neal, D. J. Armstrong, and W. T. Turner, Proc. SPIE 2993, 211 (1997).
[CrossRef]

Yoon, G.

Yoon, G. Y.

Appl. Opt.

J. Opt. Soc. Am. A

Opt. Commun.

L. Seifert, H. J. Tiziani, and W. Osten, Opt. Commun. 245, 255 (2005).
[CrossRef]

Opt. Eng.

N. Lindlein and J. Pfund, Opt. Eng. 41, 529 (2002).
[CrossRef]

Proc. SPIE

R. R. Rammage, D. R. Neal, and R. J. Copland, Proc. SPIE 4779, 161 (2002).
[CrossRef]

D. R. Neal, D. J. Armstrong, and W. T. Turner, Proc. SPIE 2993, 211 (1997).
[CrossRef]

Other

D. Malacara and S. L. DeVore, Optical Shop Testing (Wiley, 1992), p. 461.

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Figures (3)

Fig. 1
Fig. 1

Example to illustrate the detected patterns of a complex wavefront with (a) a conventional SHWS with spherical microlenses that has an uncertainty on the localization of spots a5 and A5, b5 and B?, and g5 and G5; and (b) our sensor based on an array of microcylinders from which all the data are unequivocally localized.

Fig. 2
Fig. 2

Scheme of the setup to test an object by transmission with the cylindrical microlens array sensor.

Fig. 3
Fig. 3

PAL measured with the sensor: (a) intersection of the line patterns in the x and y directions recorded by the CCD, (b) reconstruction of the wavefront transmitted by the PAL.

Equations (3)

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u ( X , Y ) = W x = M ( ρ x , ABERR ( X , Y ) ρ x , REF ( X , Y ) ) p _ x f ,
v ( X , Y ) = W y = M ( ρ y , ABERR ( X , Y ) ρ y , REF ( X , Y ) ) p _ y f ,
rms wavefront error = ( rms slope error ) d N ,

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