Abstract

It has previously been reported that a peak at the spectral position of the second harmonic of an excitation laser can be generated in an inversion-symmetric medium in the regime of extreme nonlinear optics and that this peak may be exploited to measure the carrier-envelope phase of the excitation pulse. Here we revisit this phenomenon with regard to reverse engineering the carrier-envelope phase and demonstrate that the thin-film thickness and the incident field can have a drastic influence on pulse propagation, and so the reverse engineering would likely fail.

© 2006 Optical Society of America

Full Article  |  PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription