Abstract

A second-harmonic interferometer based on a CW Nd:YAG laser is presented. The versatile device measures the line-integrated dispersion at the fundamental and second-harmonic wavelengths. A temporal resolution of 1.25μs with sensitivity of 1.3mrad and a temporal resolution of 10μs with sensitivity of 0.3mrad are demonstrated for a laser power of 0.6W. For a laser power of only 150mW a temporal resolution of 10μs with sensitivity of 1mrad is reported.

© 2007 Optical Society of America

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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]

2006 (2)

P. Bagryansky, A. Khilchenko, A. Kvashnin, A. Solomakhin, H. Koslowsky, and T. Team, Rev. Sci. Instrum. 77, 053501 (2006).
[CrossRef]

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

2004 (1)

2000 (1)

V. Licht and H. Bluhm, Rev. Sci. Instrum. 71, 2710 (2000).
[CrossRef]

1996 (1)

1994 (2)

H. Matsumoto and L. Zeng, Opt. Commun. 104, 241 (1994).
[CrossRef]

K. Birch and M. Downs, Metrologia 31, 315 (1994).
[CrossRef]

1993 (2)

V. Drachev, Opt. Spectrosc. 75, 278 (1993).

V. Drachev, Y. Krasnikov, and P. Bagryansky, Rev. Sci. Instrum. 64, 1010 (1993).
[CrossRef]

1986 (1)

1981 (1)

K. Alum, Y. Koval'chuk, and G. Ostrovskaya, Sov. Tech. Phys. Lett. 7, 581 (1981).

1980 (1)

Al-Jumaily, G.

Alum, K.

K. Alum, Y. Koval'chuk, and G. Ostrovskaya, Sov. Tech. Phys. Lett. 7, 581 (1981).

Bagryansky, P.

P. Bagryansky, A. Khilchenko, A. Kvashnin, A. Solomakhin, H. Koslowsky, and T. Team, Rev. Sci. Instrum. 77, 053501 (2006).
[CrossRef]

V. Drachev, Y. Krasnikov, and P. Bagryansky, Rev. Sci. Instrum. 64, 1010 (1993).
[CrossRef]

Birch, K.

K. Birch and M. Downs, Metrologia 31, 315 (1994).
[CrossRef]

Bitz, G.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Bluhm, H.

V. Licht and H. Bluhm, Rev. Sci. Instrum. 71, 2710 (2000).
[CrossRef]

Borsutzky, A.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Burdack, P.

Downs, M.

K. Birch and M. Downs, Metrologia 31, 315 (1994).
[CrossRef]

Drachev, V.

V. Drachev, Y. Krasnikov, and P. Bagryansky, Rev. Sci. Instrum. 64, 1010 (1993).
[CrossRef]

V. Drachev, Opt. Spectrosc. 75, 278 (1993).

Eimerl, D.

Fallnich, C.

Freitag, I.

Friess, L.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Hopf, F.

Hunnekuhl, M.

Khilchenko, A.

P. Bagryansky, A. Khilchenko, A. Kvashnin, A. Solomakhin, H. Koslowsky, and T. Team, Rev. Sci. Instrum. 77, 053501 (2006).
[CrossRef]

Koslowsky, H.

P. Bagryansky, A. Khilchenko, A. Kvashnin, A. Solomakhin, H. Koslowsky, and T. Team, Rev. Sci. Instrum. 77, 053501 (2006).
[CrossRef]

Koval'chuk, Y.

K. Alum, Y. Koval'chuk, and G. Ostrovskaya, Sov. Tech. Phys. Lett. 7, 581 (1981).

Krasnikov, Y.

V. Drachev, Y. Krasnikov, and P. Bagryansky, Rev. Sci. Instrum. 64, 1010 (1993).
[CrossRef]

Kvashnin, A.

P. Bagryansky, A. Khilchenko, A. Kvashnin, A. Solomakhin, H. Koslowsky, and T. Team, Rev. Sci. Instrum. 77, 053501 (2006).
[CrossRef]

L'Huillier, J.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Licht, V.

V. Licht and H. Bluhm, Rev. Sci. Instrum. 71, 2710 (2000).
[CrossRef]

Matsumoto, H.

H. Matsumoto and L. Zeng, Appl. Opt. 35, 2179 (1996).
[CrossRef] [PubMed]

H. Matsumoto and L. Zeng, Opt. Commun. 104, 241 (1994).
[CrossRef]

of Menar, P. V.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Ostrovskaya, G.

K. Alum, Y. Koval'chuk, and G. Ostrovskaya, Sov. Tech. Phys. Lett. 7, 581 (1981).

Rytz, D.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Salva, T.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Solomakhin, A.

P. Bagryansky, A. Khilchenko, A. Kvashnin, A. Solomakhin, H. Koslowsky, and T. Team, Rev. Sci. Instrum. 77, 053501 (2006).
[CrossRef]

Team, T.

P. Bagryansky, A. Khilchenko, A. Kvashnin, A. Solomakhin, H. Koslowsky, and T. Team, Rev. Sci. Instrum. 77, 053501 (2006).
[CrossRef]

Tomita, A.

Tröbs, M.

Velasko, S.

Vernay, S.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Wallenstein, R.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Wesemann, V.

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Zeng, L.

H. Matsumoto and L. Zeng, Appl. Opt. 35, 2179 (1996).
[CrossRef] [PubMed]

H. Matsumoto and L. Zeng, Opt. Commun. 104, 241 (1994).
[CrossRef]

Appl. Opt. (2)

Appl. Phys. B (1)

V. Wesemann, J. L'Huillier, L. Friess, P. V. of Menar, G. Bitz, A. Borsutzky, R. Wallenstein, T. Salva, S. Vernay, and D. Rytz, Appl. Phys. B 84, 453 (2006).
[CrossRef]

Metrologia (1)

K. Birch and M. Downs, Metrologia 31, 315 (1994).
[CrossRef]

Opt. Commun. (1)

H. Matsumoto and L. Zeng, Opt. Commun. 104, 241 (1994).
[CrossRef]

Opt. Express (1)

Opt. Lett. (1)

Opt. Spectrosc. (1)

V. Drachev, Opt. Spectrosc. 75, 278 (1993).

Rev. Sci. Instrum. (3)

V. Licht and H. Bluhm, Rev. Sci. Instrum. 71, 2710 (2000).
[CrossRef]

V. Drachev, Y. Krasnikov, and P. Bagryansky, Rev. Sci. Instrum. 64, 1010 (1993).
[CrossRef]

P. Bagryansky, A. Khilchenko, A. Kvashnin, A. Solomakhin, H. Koslowsky, and T. Team, Rev. Sci. Instrum. 77, 053501 (2006).
[CrossRef]

Sov. Tech. Phys. Lett. (1)

K. Alum, Y. Koval'chuk, and G. Ostrovskaya, Sov. Tech. Phys. Lett. 7, 581 (1981).

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Figures (3)

Fig. 1
Fig. 1

Schematic of the SHI: OI, optical isolator; M, mirror; L, lens; λ 2 , half-wave plate; BIBO, nonlinear crystal; DW, dual-wavelength wave plate; C, compensator; HS, harmonic separator; BD, beam dump; PBS, polarizing beam splitter; D, light detector; F, filter; V , V + , detector signal.

Fig. 2
Fig. 2

Calibration of the SHI: R measured as a function of the absolute pressure in the cell. The inset shows the linear dependence of R for low pressure, measured with a differential pressure gauge.

Fig. 3
Fig. 3

Measured phase with a vibrating tilted window in different configurations: solid curve, fast- 0.6 W ; dashed curve, high- 0.6 W . The curves are shifted in time for better visualization.

Tables (1)

Tables Icon

Table 1 Sensitivity of the SHI for Different Configurations and Laser Powers

Equations (2)

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V ± = α ± P 0 2 2 [ β 1 + β 2 ± 2 β 1 β 2 cos ( Δ ϕ + ϕ 0 ) ] ,
R V + V V + + V = α ± V sin ( Δ ϕ + Δ ϕ 0 ) 1 ± α V sin ( Δ ϕ + Δ ϕ 0 ) ,

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