Abstract

We have observed cyclotron resonance in a high-mobility GaAsAlGaAs two-dimensional electron gas by using the techniques of terahertz time-domain spectroscopy combined with magnetic fields. From this, we calculate the real and imaginary parts of the diagonal elements of the magnetoconductivity tensor, which in turn allows us to extract the concentration, effective mass, and scattering time of the electrons in the sample. We demonstrate the utility of ultrafast terahertz spectroscopy, which can recover the true linewidth of cyclotron resonance in a high-mobility (>106cm2V1s1) sample without being affected by the saturation effect.

© 2007 Optical Society of America

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  1. E. D. Palik and J. K. Furdyna, Rep. Prog. Phys. 33, 1193 (1970).
    [Crossref]
  2. J. G. Mavroides, in Optical Properties of Solids, F.Abeles, ed. (North-Holland, 1972), pp. 351-528.
  3. B. D. McCombe and R. J. Wagner, in Advances in Electronics and Electron Physics, L.Marton, ed. (Academic, 1975), Vol. 37, pp. 1-78.
    [Crossref]
  4. A. Petrou and B. D. McCombe, in Landau Level Spectroscopy, G.Landwehr and E.I.Rashba, eds. (Elsevier Science, 1991), pp. 679-775.
  5. R. J. Nicholas, in Handbook on Semiconductors, Vol. 2 "Optical Properties," M.Balkanski, ed. (Elsevier, 1994), pp. 385-461.
  6. J. Kono, in Methods in Materials Research, E.N.Kaufmann, ed. (Wiley, 2001), Unit 9b.2.
  7. S. A. Crooker, Rev. Sci. Instrum. 73, 3258 (2002).
    [Crossref]
  8. M. C. Nuss and J. Orenstein, in Millimeter and Submillimeter Wave Spectroscopy of Solids, G.Grüner, ed. (Springer-Verlag, 1998), pp. 7-50.
    [Crossref]
  9. D.M.Mittleman, ed., Sensing with Terahertz Radiation (Springer, 2003).
  10. D. Some and A. V. Nurmikko, Appl. Phys. Lett. 65, 3377 (1994).
    [Crossref]
  11. H. Harde, S. Keiding, and D. Grischkowsky, Phys. Rev. Lett. 66, 1834 (1991).
    [Crossref] [PubMed]
  12. J. N. Heyman, R. Kersting, and K. Unterrainer, Appl. Phys. Lett. 72, 644 (1998).
    [Crossref]
  13. D. Du and D. Grischkowsky, Phys. Rev. Lett. 93, 196804 (2004).
    [Crossref]
  14. M. J. Chou and D. C. Tsui, Phys. Rev. B 37, 848 (1988).
    [Crossref]
  15. S. A. Studenikin, M. Potemski, A. Sachrajda, M. Hillke, P. Pfeiffer, and K. W. West, Phys. Rev. B 71, 245313 (2005).
    [Crossref]
  16. L. Allen and J. H. Eberly, Optical Resonance and Two-Level Atoms (Dover, 1987).

2005 (1)

S. A. Studenikin, M. Potemski, A. Sachrajda, M. Hillke, P. Pfeiffer, and K. W. West, Phys. Rev. B 71, 245313 (2005).
[Crossref]

2004 (1)

D. Du and D. Grischkowsky, Phys. Rev. Lett. 93, 196804 (2004).
[Crossref]

2003 (1)

D.M.Mittleman, ed., Sensing with Terahertz Radiation (Springer, 2003).

2002 (1)

S. A. Crooker, Rev. Sci. Instrum. 73, 3258 (2002).
[Crossref]

2001 (1)

J. Kono, in Methods in Materials Research, E.N.Kaufmann, ed. (Wiley, 2001), Unit 9b.2.

1998 (2)

M. C. Nuss and J. Orenstein, in Millimeter and Submillimeter Wave Spectroscopy of Solids, G.Grüner, ed. (Springer-Verlag, 1998), pp. 7-50.
[Crossref]

J. N. Heyman, R. Kersting, and K. Unterrainer, Appl. Phys. Lett. 72, 644 (1998).
[Crossref]

1994 (2)

D. Some and A. V. Nurmikko, Appl. Phys. Lett. 65, 3377 (1994).
[Crossref]

R. J. Nicholas, in Handbook on Semiconductors, Vol. 2 "Optical Properties," M.Balkanski, ed. (Elsevier, 1994), pp. 385-461.

1991 (2)

A. Petrou and B. D. McCombe, in Landau Level Spectroscopy, G.Landwehr and E.I.Rashba, eds. (Elsevier Science, 1991), pp. 679-775.

H. Harde, S. Keiding, and D. Grischkowsky, Phys. Rev. Lett. 66, 1834 (1991).
[Crossref] [PubMed]

1988 (1)

M. J. Chou and D. C. Tsui, Phys. Rev. B 37, 848 (1988).
[Crossref]

1987 (1)

L. Allen and J. H. Eberly, Optical Resonance and Two-Level Atoms (Dover, 1987).

1975 (1)

B. D. McCombe and R. J. Wagner, in Advances in Electronics and Electron Physics, L.Marton, ed. (Academic, 1975), Vol. 37, pp. 1-78.
[Crossref]

1972 (1)

J. G. Mavroides, in Optical Properties of Solids, F.Abeles, ed. (North-Holland, 1972), pp. 351-528.

1970 (1)

E. D. Palik and J. K. Furdyna, Rep. Prog. Phys. 33, 1193 (1970).
[Crossref]

Allen, L.

L. Allen and J. H. Eberly, Optical Resonance and Two-Level Atoms (Dover, 1987).

Chou, M. J.

M. J. Chou and D. C. Tsui, Phys. Rev. B 37, 848 (1988).
[Crossref]

Crooker, S. A.

S. A. Crooker, Rev. Sci. Instrum. 73, 3258 (2002).
[Crossref]

Du, D.

D. Du and D. Grischkowsky, Phys. Rev. Lett. 93, 196804 (2004).
[Crossref]

Eberly, J. H.

L. Allen and J. H. Eberly, Optical Resonance and Two-Level Atoms (Dover, 1987).

Furdyna, J. K.

E. D. Palik and J. K. Furdyna, Rep. Prog. Phys. 33, 1193 (1970).
[Crossref]

Grischkowsky, D.

D. Du and D. Grischkowsky, Phys. Rev. Lett. 93, 196804 (2004).
[Crossref]

H. Harde, S. Keiding, and D. Grischkowsky, Phys. Rev. Lett. 66, 1834 (1991).
[Crossref] [PubMed]

Harde, H.

H. Harde, S. Keiding, and D. Grischkowsky, Phys. Rev. Lett. 66, 1834 (1991).
[Crossref] [PubMed]

Heyman, J. N.

J. N. Heyman, R. Kersting, and K. Unterrainer, Appl. Phys. Lett. 72, 644 (1998).
[Crossref]

Hillke, M.

S. A. Studenikin, M. Potemski, A. Sachrajda, M. Hillke, P. Pfeiffer, and K. W. West, Phys. Rev. B 71, 245313 (2005).
[Crossref]

Keiding, S.

H. Harde, S. Keiding, and D. Grischkowsky, Phys. Rev. Lett. 66, 1834 (1991).
[Crossref] [PubMed]

Kersting, R.

J. N. Heyman, R. Kersting, and K. Unterrainer, Appl. Phys. Lett. 72, 644 (1998).
[Crossref]

Kono, J.

J. Kono, in Methods in Materials Research, E.N.Kaufmann, ed. (Wiley, 2001), Unit 9b.2.

Mavroides, J. G.

J. G. Mavroides, in Optical Properties of Solids, F.Abeles, ed. (North-Holland, 1972), pp. 351-528.

McCombe, B. D.

A. Petrou and B. D. McCombe, in Landau Level Spectroscopy, G.Landwehr and E.I.Rashba, eds. (Elsevier Science, 1991), pp. 679-775.

B. D. McCombe and R. J. Wagner, in Advances in Electronics and Electron Physics, L.Marton, ed. (Academic, 1975), Vol. 37, pp. 1-78.
[Crossref]

Nicholas, R. J.

R. J. Nicholas, in Handbook on Semiconductors, Vol. 2 "Optical Properties," M.Balkanski, ed. (Elsevier, 1994), pp. 385-461.

Nurmikko, A. V.

D. Some and A. V. Nurmikko, Appl. Phys. Lett. 65, 3377 (1994).
[Crossref]

Nuss, M. C.

M. C. Nuss and J. Orenstein, in Millimeter and Submillimeter Wave Spectroscopy of Solids, G.Grüner, ed. (Springer-Verlag, 1998), pp. 7-50.
[Crossref]

Orenstein, J.

M. C. Nuss and J. Orenstein, in Millimeter and Submillimeter Wave Spectroscopy of Solids, G.Grüner, ed. (Springer-Verlag, 1998), pp. 7-50.
[Crossref]

Palik, E. D.

E. D. Palik and J. K. Furdyna, Rep. Prog. Phys. 33, 1193 (1970).
[Crossref]

Petrou, A.

A. Petrou and B. D. McCombe, in Landau Level Spectroscopy, G.Landwehr and E.I.Rashba, eds. (Elsevier Science, 1991), pp. 679-775.

Pfeiffer, P.

S. A. Studenikin, M. Potemski, A. Sachrajda, M. Hillke, P. Pfeiffer, and K. W. West, Phys. Rev. B 71, 245313 (2005).
[Crossref]

Potemski, M.

S. A. Studenikin, M. Potemski, A. Sachrajda, M. Hillke, P. Pfeiffer, and K. W. West, Phys. Rev. B 71, 245313 (2005).
[Crossref]

Sachrajda, A.

S. A. Studenikin, M. Potemski, A. Sachrajda, M. Hillke, P. Pfeiffer, and K. W. West, Phys. Rev. B 71, 245313 (2005).
[Crossref]

Some, D.

D. Some and A. V. Nurmikko, Appl. Phys. Lett. 65, 3377 (1994).
[Crossref]

Studenikin, S. A.

S. A. Studenikin, M. Potemski, A. Sachrajda, M. Hillke, P. Pfeiffer, and K. W. West, Phys. Rev. B 71, 245313 (2005).
[Crossref]

Tsui, D. C.

M. J. Chou and D. C. Tsui, Phys. Rev. B 37, 848 (1988).
[Crossref]

Unterrainer, K.

J. N. Heyman, R. Kersting, and K. Unterrainer, Appl. Phys. Lett. 72, 644 (1998).
[Crossref]

Wagner, R. J.

B. D. McCombe and R. J. Wagner, in Advances in Electronics and Electron Physics, L.Marton, ed. (Academic, 1975), Vol. 37, pp. 1-78.
[Crossref]

West, K. W.

S. A. Studenikin, M. Potemski, A. Sachrajda, M. Hillke, P. Pfeiffer, and K. W. West, Phys. Rev. B 71, 245313 (2005).
[Crossref]

Appl. Phys. Lett. (2)

D. Some and A. V. Nurmikko, Appl. Phys. Lett. 65, 3377 (1994).
[Crossref]

J. N. Heyman, R. Kersting, and K. Unterrainer, Appl. Phys. Lett. 72, 644 (1998).
[Crossref]

Phys. Rev. B (2)

M. J. Chou and D. C. Tsui, Phys. Rev. B 37, 848 (1988).
[Crossref]

S. A. Studenikin, M. Potemski, A. Sachrajda, M. Hillke, P. Pfeiffer, and K. W. West, Phys. Rev. B 71, 245313 (2005).
[Crossref]

Phys. Rev. Lett. (2)

D. Du and D. Grischkowsky, Phys. Rev. Lett. 93, 196804 (2004).
[Crossref]

H. Harde, S. Keiding, and D. Grischkowsky, Phys. Rev. Lett. 66, 1834 (1991).
[Crossref] [PubMed]

Rep. Prog. Phys. (1)

E. D. Palik and J. K. Furdyna, Rep. Prog. Phys. 33, 1193 (1970).
[Crossref]

Rev. Sci. Instrum. (1)

S. A. Crooker, Rev. Sci. Instrum. 73, 3258 (2002).
[Crossref]

Other (8)

M. C. Nuss and J. Orenstein, in Millimeter and Submillimeter Wave Spectroscopy of Solids, G.Grüner, ed. (Springer-Verlag, 1998), pp. 7-50.
[Crossref]

D.M.Mittleman, ed., Sensing with Terahertz Radiation (Springer, 2003).

J. G. Mavroides, in Optical Properties of Solids, F.Abeles, ed. (North-Holland, 1972), pp. 351-528.

B. D. McCombe and R. J. Wagner, in Advances in Electronics and Electron Physics, L.Marton, ed. (Academic, 1975), Vol. 37, pp. 1-78.
[Crossref]

A. Petrou and B. D. McCombe, in Landau Level Spectroscopy, G.Landwehr and E.I.Rashba, eds. (Elsevier Science, 1991), pp. 679-775.

R. J. Nicholas, in Handbook on Semiconductors, Vol. 2 "Optical Properties," M.Balkanski, ed. (Elsevier, 1994), pp. 385-461.

J. Kono, in Methods in Materials Research, E.N.Kaufmann, ed. (Wiley, 2001), Unit 9b.2.

L. Allen and J. H. Eberly, Optical Resonance and Two-Level Atoms (Dover, 1987).

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Figures (3)

Fig. 1
Fig. 1

THz waveforms transmitted through a high-mobility 2DEG at (a) 0 T and at (b) 1.28 T at 2 K . The cyclotron oscillations induced by the magnetic field (c) are isolated by subtracting (a) from (b).

Fig. 2
Fig. 2

(a) TD cyclotron oscillations in a high-mobility 2DEG from 0.7 to 1.4 T at 2 K . Traces are vertically offset for clarity. (b) Landau-quantized 2DEG.

Fig. 3
Fig. 3

(a) Amplitude of the transformed electric fields at 0 and 1.28 T . (b) Magnitude of the complex transmission coefficient at 1.28 T . (c) Phase of the transmission coefficient. (d) Real ( σ x x ) and imaginary ( σ x x ) parts of the magnetoconductivity tensor element σ x x at 1.28 T . The σ x x trace is vertically offset.

Equations (3)

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T x x ( ν , B ) = E ( ν , B ) E ( ν , 0 ) = 2 Y 2 Y + σ x x ( ν , B ) ,
σ x x = σ x x + i σ x x = σ 0 1 + 2 π i ( ν ν c ) τ .
Δ E = e B m * = h ν c ,

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