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Tamper resistance in optical excitation transfer based on optical near-field interactions

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Abstract

We present tamper resistance in optical excitation transfer via optical near-field interactions based on the energy dissipation process occurring locally in nanometric devices such as quantum dots. A theoretical comparison with electrical systems is also shown, focusing on the required environmental conditions. Numerical simulations based on virtual photon models demonstrate high tamper resistance.

© 2007 Optical Society of America

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