Abstract

We discuss a self-imaging phenomenon in a multimode interference (MMI) coupler. From experiment, different self-images, which are undefined in MMI theory, are observed. These undefined self-images are named "extraneous self-images" (Ex_SIs) for convenience. To estimate the applicability of the Ex_SIs, the characteristics of both the single self-image (0 dB self-image, 0 dB SI), which is defined in MMI theory, and the Ex_SI are compared and analyzed through simulation and experiment. The results show that the Ex_SI has an imaging period that is the same as the 0 dB SI and that the excess loss and the extinction ratio of the Ex_SI improve more than that of the 0 dB SI as the imaging period increases.

© 2007 Optical Society of America

PDF Article

References

  • View by:
  • |
  • |
  • |

  1. L. B. Soldano and E. C. M. Pennings, J. Lightwave Technol. 13, 615 (1995).
    [CrossRef]
  2. E. C. M. Pennings, R. van Roijen, B. H. Verbeek, R. J. Deri, and L. B. Soldano, in Conference Proceedings, IEEE Lasers and Electro-Optics Society Annual Meeting (IEEE, 1993), p. 193.
  3. J. K. Hong, S. S. Lee, and D. W. Shin, J. Korean Phys. Soc. 45, 84 (2004).
  4. L. J. Harrison, T. J. Tayag, G. J. Simonis, M. Stead, G. W. Euliss, and R. P. Leavitt, IEEE Photon. Technol. Lett. 12, 657 (2000).
  5. D. G. Rabus and M. Hamacher, IEEE Photon. Technol. Lett. 13, 812 (2001).
    [CrossRef]
  6. K. C. Lin and W. Y. Lee, Electron. Lett. 32, 1259 (1996).
    [CrossRef]
  7. B. Li, S. J. Chua, C. W. Leitz, and E. A. Fitzgerald, Opt. Eng. 41, 723 (2002).
    [CrossRef]
  8. A. Himeno, H. Terui, and M. Kobayashi, J. Lightwave Technol. 6, 41 (1988).
    [CrossRef]
  9. R. Ulrich and G. Ankele, Appl. Phys. Lett. 27, 337 (1975).
    [CrossRef]
  10. C. R. Pollock, Fundamentals of Optoelectronics (Richard D. Irwin, 1995), pp. 49-72, 555-557.

2004 (1)

J. K. Hong, S. S. Lee, and D. W. Shin, J. Korean Phys. Soc. 45, 84 (2004).

2002 (1)

B. Li, S. J. Chua, C. W. Leitz, and E. A. Fitzgerald, Opt. Eng. 41, 723 (2002).
[CrossRef]

2001 (1)

D. G. Rabus and M. Hamacher, IEEE Photon. Technol. Lett. 13, 812 (2001).
[CrossRef]

2000 (1)

L. J. Harrison, T. J. Tayag, G. J. Simonis, M. Stead, G. W. Euliss, and R. P. Leavitt, IEEE Photon. Technol. Lett. 12, 657 (2000).

1996 (1)

K. C. Lin and W. Y. Lee, Electron. Lett. 32, 1259 (1996).
[CrossRef]

1995 (1)

L. B. Soldano and E. C. M. Pennings, J. Lightwave Technol. 13, 615 (1995).
[CrossRef]

1988 (1)

A. Himeno, H. Terui, and M. Kobayashi, J. Lightwave Technol. 6, 41 (1988).
[CrossRef]

1975 (1)

R. Ulrich and G. Ankele, Appl. Phys. Lett. 27, 337 (1975).
[CrossRef]

Ankele, G.

R. Ulrich and G. Ankele, Appl. Phys. Lett. 27, 337 (1975).
[CrossRef]

Chua, S. J.

B. Li, S. J. Chua, C. W. Leitz, and E. A. Fitzgerald, Opt. Eng. 41, 723 (2002).
[CrossRef]

Deri, R. J.

E. C. M. Pennings, R. van Roijen, B. H. Verbeek, R. J. Deri, and L. B. Soldano, in Conference Proceedings, IEEE Lasers and Electro-Optics Society Annual Meeting (IEEE, 1993), p. 193.

Euliss, G. W.

L. J. Harrison, T. J. Tayag, G. J. Simonis, M. Stead, G. W. Euliss, and R. P. Leavitt, IEEE Photon. Technol. Lett. 12, 657 (2000).

Fitzgerald, E. A.

B. Li, S. J. Chua, C. W. Leitz, and E. A. Fitzgerald, Opt. Eng. 41, 723 (2002).
[CrossRef]

Hamacher, M.

D. G. Rabus and M. Hamacher, IEEE Photon. Technol. Lett. 13, 812 (2001).
[CrossRef]

Harrison, L. J.

L. J. Harrison, T. J. Tayag, G. J. Simonis, M. Stead, G. W. Euliss, and R. P. Leavitt, IEEE Photon. Technol. Lett. 12, 657 (2000).

Himeno, A.

A. Himeno, H. Terui, and M. Kobayashi, J. Lightwave Technol. 6, 41 (1988).
[CrossRef]

Hong, J. K.

J. K. Hong, S. S. Lee, and D. W. Shin, J. Korean Phys. Soc. 45, 84 (2004).

Kobayashi, M.

A. Himeno, H. Terui, and M. Kobayashi, J. Lightwave Technol. 6, 41 (1988).
[CrossRef]

Leavitt, R. P.

L. J. Harrison, T. J. Tayag, G. J. Simonis, M. Stead, G. W. Euliss, and R. P. Leavitt, IEEE Photon. Technol. Lett. 12, 657 (2000).

Lee, S. S.

J. K. Hong, S. S. Lee, and D. W. Shin, J. Korean Phys. Soc. 45, 84 (2004).

Lee, W. Y.

K. C. Lin and W. Y. Lee, Electron. Lett. 32, 1259 (1996).
[CrossRef]

Leitz, C. W.

B. Li, S. J. Chua, C. W. Leitz, and E. A. Fitzgerald, Opt. Eng. 41, 723 (2002).
[CrossRef]

Li, B.

B. Li, S. J. Chua, C. W. Leitz, and E. A. Fitzgerald, Opt. Eng. 41, 723 (2002).
[CrossRef]

Lin, K. C.

K. C. Lin and W. Y. Lee, Electron. Lett. 32, 1259 (1996).
[CrossRef]

Pennings, E. C. M.

L. B. Soldano and E. C. M. Pennings, J. Lightwave Technol. 13, 615 (1995).
[CrossRef]

E. C. M. Pennings, R. van Roijen, B. H. Verbeek, R. J. Deri, and L. B. Soldano, in Conference Proceedings, IEEE Lasers and Electro-Optics Society Annual Meeting (IEEE, 1993), p. 193.

Pollock, C. R.

C. R. Pollock, Fundamentals of Optoelectronics (Richard D. Irwin, 1995), pp. 49-72, 555-557.

Rabus, D. G.

D. G. Rabus and M. Hamacher, IEEE Photon. Technol. Lett. 13, 812 (2001).
[CrossRef]

Shin, D. W.

J. K. Hong, S. S. Lee, and D. W. Shin, J. Korean Phys. Soc. 45, 84 (2004).

Simonis, G. J.

L. J. Harrison, T. J. Tayag, G. J. Simonis, M. Stead, G. W. Euliss, and R. P. Leavitt, IEEE Photon. Technol. Lett. 12, 657 (2000).

Soldano, L. B.

L. B. Soldano and E. C. M. Pennings, J. Lightwave Technol. 13, 615 (1995).
[CrossRef]

E. C. M. Pennings, R. van Roijen, B. H. Verbeek, R. J. Deri, and L. B. Soldano, in Conference Proceedings, IEEE Lasers and Electro-Optics Society Annual Meeting (IEEE, 1993), p. 193.

Stead, M.

L. J. Harrison, T. J. Tayag, G. J. Simonis, M. Stead, G. W. Euliss, and R. P. Leavitt, IEEE Photon. Technol. Lett. 12, 657 (2000).

Tayag, T. J.

L. J. Harrison, T. J. Tayag, G. J. Simonis, M. Stead, G. W. Euliss, and R. P. Leavitt, IEEE Photon. Technol. Lett. 12, 657 (2000).

Terui, H.

A. Himeno, H. Terui, and M. Kobayashi, J. Lightwave Technol. 6, 41 (1988).
[CrossRef]

Ulrich, R.

R. Ulrich and G. Ankele, Appl. Phys. Lett. 27, 337 (1975).
[CrossRef]

van Roijen, R.

E. C. M. Pennings, R. van Roijen, B. H. Verbeek, R. J. Deri, and L. B. Soldano, in Conference Proceedings, IEEE Lasers and Electro-Optics Society Annual Meeting (IEEE, 1993), p. 193.

Verbeek, B. H.

E. C. M. Pennings, R. van Roijen, B. H. Verbeek, R. J. Deri, and L. B. Soldano, in Conference Proceedings, IEEE Lasers and Electro-Optics Society Annual Meeting (IEEE, 1993), p. 193.

Appl. Phys. Lett. (1)

R. Ulrich and G. Ankele, Appl. Phys. Lett. 27, 337 (1975).
[CrossRef]

Electron. Lett. (1)

K. C. Lin and W. Y. Lee, Electron. Lett. 32, 1259 (1996).
[CrossRef]

IEEE Photon. Technol. Lett. (2)

L. J. Harrison, T. J. Tayag, G. J. Simonis, M. Stead, G. W. Euliss, and R. P. Leavitt, IEEE Photon. Technol. Lett. 12, 657 (2000).

D. G. Rabus and M. Hamacher, IEEE Photon. Technol. Lett. 13, 812 (2001).
[CrossRef]

J. Korean Phys. Soc. (1)

J. K. Hong, S. S. Lee, and D. W. Shin, J. Korean Phys. Soc. 45, 84 (2004).

J. Lightwave Technol. (2)

A. Himeno, H. Terui, and M. Kobayashi, J. Lightwave Technol. 6, 41 (1988).
[CrossRef]

L. B. Soldano and E. C. M. Pennings, J. Lightwave Technol. 13, 615 (1995).
[CrossRef]

Opt. Eng. (1)

B. Li, S. J. Chua, C. W. Leitz, and E. A. Fitzgerald, Opt. Eng. 41, 723 (2002).
[CrossRef]

Other (2)

E. C. M. Pennings, R. van Roijen, B. H. Verbeek, R. J. Deri, and L. B. Soldano, in Conference Proceedings, IEEE Lasers and Electro-Optics Society Annual Meeting (IEEE, 1993), p. 193.

C. R. Pollock, Fundamentals of Optoelectronics (Richard D. Irwin, 1995), pp. 49-72, 555-557.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Metrics