Abstract

Recording of multiplexed microholographic gratings with improved recording volume for high density optical data storage is proposed and demonstrated. By using a hybrid diffractive–refractive objective lens with extended depth of focus, we have achieved a recording beam size of approximately 1μm and a focal depth of 20μm. Multiple gratings corresponding to spectral lines within the 400650nm spectral band have been successfully multiplexed in a single recording spot or pit of size 1.25μm on a DuPont photopolymer film using a white light source along with narrowband filters or dispersion elements, thus demonstrating the storage of multiple bits in a single pit. Simultaneous readout of multiple bits in a single storage pit is accomplished with a microspectrometer-type readout head using a white light source.

© 2006 Optical Society of America

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References

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  1. S. Orlic, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, in Proc. SPIE 4459, 323 (2002).
    [CrossRef]
  2. S. Orlic, S. Ulm, and H. J. Eichler, J. Opt. A, Pure Appl. Opt. 3, 72 (2001).
    [CrossRef]
  3. H. J. Eichler, P. Kuemmel, S. Orlic, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
    [CrossRef]
  4. A. Wappelt, J. Findeisen, P. Kuemmel, S. Orlic, R. Schulz, and H. J. Eichler, in Proc. SPIE 3490, 362 (1998).
    [CrossRef]
  5. A. Flores, M. Wang, and J. Yang, Appl. Opt. 43, 5618 (2004).
    [CrossRef] [PubMed]

2004 (1)

2002 (1)

S. Orlic, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, in Proc. SPIE 4459, 323 (2002).
[CrossRef]

2001 (1)

S. Orlic, S. Ulm, and H. J. Eichler, J. Opt. A, Pure Appl. Opt. 3, 72 (2001).
[CrossRef]

1998 (2)

H. J. Eichler, P. Kuemmel, S. Orlic, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

A. Wappelt, J. Findeisen, P. Kuemmel, S. Orlic, R. Schulz, and H. J. Eichler, in Proc. SPIE 3490, 362 (1998).
[CrossRef]

Eichler, H. J.

S. Orlic, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, in Proc. SPIE 4459, 323 (2002).
[CrossRef]

S. Orlic, S. Ulm, and H. J. Eichler, J. Opt. A, Pure Appl. Opt. 3, 72 (2001).
[CrossRef]

A. Wappelt, J. Findeisen, P. Kuemmel, S. Orlic, R. Schulz, and H. J. Eichler, in Proc. SPIE 3490, 362 (1998).
[CrossRef]

H. J. Eichler, P. Kuemmel, S. Orlic, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

Findeisen, J.

A. Wappelt, J. Findeisen, P. Kuemmel, S. Orlic, R. Schulz, and H. J. Eichler, in Proc. SPIE 3490, 362 (1998).
[CrossRef]

Flores, A.

Kuemmel, P.

H. J. Eichler, P. Kuemmel, S. Orlic, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

A. Wappelt, J. Findeisen, P. Kuemmel, S. Orlic, R. Schulz, and H. J. Eichler, in Proc. SPIE 3490, 362 (1998).
[CrossRef]

Mueller, C.

S. Orlic, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, in Proc. SPIE 4459, 323 (2002).
[CrossRef]

Orlic, S.

S. Orlic, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, in Proc. SPIE 4459, 323 (2002).
[CrossRef]

S. Orlic, S. Ulm, and H. J. Eichler, J. Opt. A, Pure Appl. Opt. 3, 72 (2001).
[CrossRef]

A. Wappelt, J. Findeisen, P. Kuemmel, S. Orlic, R. Schulz, and H. J. Eichler, in Proc. SPIE 3490, 362 (1998).
[CrossRef]

H. J. Eichler, P. Kuemmel, S. Orlic, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

Schoen, R.

S. Orlic, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, in Proc. SPIE 4459, 323 (2002).
[CrossRef]

Schulz, R.

A. Wappelt, J. Findeisen, P. Kuemmel, S. Orlic, R. Schulz, and H. J. Eichler, in Proc. SPIE 3490, 362 (1998).
[CrossRef]

Trefzer, M.

S. Orlic, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, in Proc. SPIE 4459, 323 (2002).
[CrossRef]

Ulm, S.

S. Orlic, S. Ulm, and H. J. Eichler, J. Opt. A, Pure Appl. Opt. 3, 72 (2001).
[CrossRef]

Wang, M.

Wappelt, A.

H. J. Eichler, P. Kuemmel, S. Orlic, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

A. Wappelt, J. Findeisen, P. Kuemmel, S. Orlic, R. Schulz, and H. J. Eichler, in Proc. SPIE 3490, 362 (1998).
[CrossRef]

Yang, J.

Appl. Opt. (1)

IEEE J. Sel. Top. Quantum Electron. (1)

H. J. Eichler, P. Kuemmel, S. Orlic, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

J. Opt. A, Pure Appl. Opt. (1)

S. Orlic, S. Ulm, and H. J. Eichler, J. Opt. A, Pure Appl. Opt. 3, 72 (2001).
[CrossRef]

Proc. SPIE (2)

S. Orlic, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, in Proc. SPIE 4459, 323 (2002).
[CrossRef]

A. Wappelt, J. Findeisen, P. Kuemmel, S. Orlic, R. Schulz, and H. J. Eichler, in Proc. SPIE 3490, 362 (1998).
[CrossRef]

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Figures (5)

Fig. 1
Fig. 1

Schematic of the proposed high density multiple bits per pit recording and/or readout architecture.

Fig. 2
Fig. 2

Readout reflectance curve from a single recording pit with four gratings simultaneously recorded by using four laser lines.

Fig. 3
Fig. 3

Examples of reflectance curves from each grating recorded using different spectral lines.

Fig. 4
Fig. 4

Readout reflectance curve obtained by overlapping 14 selected, single-grating reflectance curves.

Fig. 5
Fig. 5

Reflectance spectrum of sequentially recorded multiple gratings in one storage pit.

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