Abstract

Evanescent field perturbation of an integrated microring resonator is examined as a means of achieving high-fidelity reversible tuning of photonic microcavities over large wavelength ranges. A 1.7% wavelength tuning is achieved through the use of a novel silica fiber probe that provides access to the evanescent field of an air-clad high-index-contrast ring resonator. As the microring is perturbed, the probe-ring distance is found through simultaneous nanometric distance calibration and force measurements. Experimental results agree well with theoretical tuning. Possible microelectromechanical systems implementation of this effect is discussed, as well as avenues for improvement of the tuning range.

© 2006 Optical Society of America

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  1. P. Heimala, P. Katila, J. Aarnio, and A. Heinamaki, J. Low Temp. Phys. 14, 2260 (1996).
  2. D. Geuzebroek, E. Klein, H. Kelderman, N. Baker, and A. Driessen, IEEE Photon. Technol. Lett. 17, 336 (2005).
  3. H. M. H. Chong and R. M. De La Rue, IEEE Photon. Technol. Lett. 16, 1528 (2004).
    [CrossRef]
  4. T. Barwicz, M. A. Popovic, P. T. Rakich, M. R. Watts, H. A. Haus, E. P. Ippen, and H. I. Smith, Opt. Express 12, 1437 (2004).
    [CrossRef]
  5. W. M. van Spengen, R. Puers, and I. De Wolf, J. Micromech. Microeng. 12, 702 (2002).
    [CrossRef]
  6. G. N. Nielson, D. Seneviratne, F. Lopez-Royo, P. T. Rakich, H. L. Tuller, and G. Barbastathis, IEEE Photon. Technol. Lett. 17, 1190 (2005).
  7. G. N. Nielson, ''Micro-opto-mechanical switching and tuning for integrated optical systems,'' Ph.D. thesis (MIT Archives, 2004).
  8. D. Sarid, Scanning Force Microscopy with Applications to Electric, Magnetic, and Atomic Forces (Oxford U. Press, 1994).
  9. R. S. Tucker, D. Baney, W. Sorin, and C. Flory, IEEE J. Sel. Top. Quantum Electron. 8, 88 (2002).
    [CrossRef]

2005

D. Geuzebroek, E. Klein, H. Kelderman, N. Baker, and A. Driessen, IEEE Photon. Technol. Lett. 17, 336 (2005).

G. N. Nielson, D. Seneviratne, F. Lopez-Royo, P. T. Rakich, H. L. Tuller, and G. Barbastathis, IEEE Photon. Technol. Lett. 17, 1190 (2005).

2004

G. N. Nielson, ''Micro-opto-mechanical switching and tuning for integrated optical systems,'' Ph.D. thesis (MIT Archives, 2004).

H. M. H. Chong and R. M. De La Rue, IEEE Photon. Technol. Lett. 16, 1528 (2004).
[CrossRef]

T. Barwicz, M. A. Popovic, P. T. Rakich, M. R. Watts, H. A. Haus, E. P. Ippen, and H. I. Smith, Opt. Express 12, 1437 (2004).
[CrossRef]

2002

R. S. Tucker, D. Baney, W. Sorin, and C. Flory, IEEE J. Sel. Top. Quantum Electron. 8, 88 (2002).
[CrossRef]

W. M. van Spengen, R. Puers, and I. De Wolf, J. Micromech. Microeng. 12, 702 (2002).
[CrossRef]

1996

P. Heimala, P. Katila, J. Aarnio, and A. Heinamaki, J. Low Temp. Phys. 14, 2260 (1996).

1994

D. Sarid, Scanning Force Microscopy with Applications to Electric, Magnetic, and Atomic Forces (Oxford U. Press, 1994).

Aarnio, J.

P. Heimala, P. Katila, J. Aarnio, and A. Heinamaki, J. Low Temp. Phys. 14, 2260 (1996).

Baker, N.

D. Geuzebroek, E. Klein, H. Kelderman, N. Baker, and A. Driessen, IEEE Photon. Technol. Lett. 17, 336 (2005).

Baney, D.

R. S. Tucker, D. Baney, W. Sorin, and C. Flory, IEEE J. Sel. Top. Quantum Electron. 8, 88 (2002).
[CrossRef]

Barbastathis, G.

G. N. Nielson, D. Seneviratne, F. Lopez-Royo, P. T. Rakich, H. L. Tuller, and G. Barbastathis, IEEE Photon. Technol. Lett. 17, 1190 (2005).

Barwicz, T.

Chong, H. M. H.

H. M. H. Chong and R. M. De La Rue, IEEE Photon. Technol. Lett. 16, 1528 (2004).
[CrossRef]

De La Rue, R. M.

H. M. H. Chong and R. M. De La Rue, IEEE Photon. Technol. Lett. 16, 1528 (2004).
[CrossRef]

De Wolf, I.

W. M. van Spengen, R. Puers, and I. De Wolf, J. Micromech. Microeng. 12, 702 (2002).
[CrossRef]

Driessen, A.

D. Geuzebroek, E. Klein, H. Kelderman, N. Baker, and A. Driessen, IEEE Photon. Technol. Lett. 17, 336 (2005).

Flory, C.

R. S. Tucker, D. Baney, W. Sorin, and C. Flory, IEEE J. Sel. Top. Quantum Electron. 8, 88 (2002).
[CrossRef]

Geuzebroek, D.

D. Geuzebroek, E. Klein, H. Kelderman, N. Baker, and A. Driessen, IEEE Photon. Technol. Lett. 17, 336 (2005).

Haus, H. A.

Heimala, P.

P. Heimala, P. Katila, J. Aarnio, and A. Heinamaki, J. Low Temp. Phys. 14, 2260 (1996).

Heinamaki, A.

P. Heimala, P. Katila, J. Aarnio, and A. Heinamaki, J. Low Temp. Phys. 14, 2260 (1996).

Ippen, E. P.

Katila, P.

P. Heimala, P. Katila, J. Aarnio, and A. Heinamaki, J. Low Temp. Phys. 14, 2260 (1996).

Kelderman, H.

D. Geuzebroek, E. Klein, H. Kelderman, N. Baker, and A. Driessen, IEEE Photon. Technol. Lett. 17, 336 (2005).

Klein, E.

D. Geuzebroek, E. Klein, H. Kelderman, N. Baker, and A. Driessen, IEEE Photon. Technol. Lett. 17, 336 (2005).

Lopez-Royo, F.

G. N. Nielson, D. Seneviratne, F. Lopez-Royo, P. T. Rakich, H. L. Tuller, and G. Barbastathis, IEEE Photon. Technol. Lett. 17, 1190 (2005).

Nielson, G. N.

G. N. Nielson, D. Seneviratne, F. Lopez-Royo, P. T. Rakich, H. L. Tuller, and G. Barbastathis, IEEE Photon. Technol. Lett. 17, 1190 (2005).

G. N. Nielson, ''Micro-opto-mechanical switching and tuning for integrated optical systems,'' Ph.D. thesis (MIT Archives, 2004).

Popovic, M. A.

Puers, R.

W. M. van Spengen, R. Puers, and I. De Wolf, J. Micromech. Microeng. 12, 702 (2002).
[CrossRef]

Rakich, P. T.

G. N. Nielson, D. Seneviratne, F. Lopez-Royo, P. T. Rakich, H. L. Tuller, and G. Barbastathis, IEEE Photon. Technol. Lett. 17, 1190 (2005).

T. Barwicz, M. A. Popovic, P. T. Rakich, M. R. Watts, H. A. Haus, E. P. Ippen, and H. I. Smith, Opt. Express 12, 1437 (2004).
[CrossRef]

Sarid, D.

D. Sarid, Scanning Force Microscopy with Applications to Electric, Magnetic, and Atomic Forces (Oxford U. Press, 1994).

Seneviratne, D.

G. N. Nielson, D. Seneviratne, F. Lopez-Royo, P. T. Rakich, H. L. Tuller, and G. Barbastathis, IEEE Photon. Technol. Lett. 17, 1190 (2005).

Smith, H. I.

Sorin, W.

R. S. Tucker, D. Baney, W. Sorin, and C. Flory, IEEE J. Sel. Top. Quantum Electron. 8, 88 (2002).
[CrossRef]

Tucker, R. S.

R. S. Tucker, D. Baney, W. Sorin, and C. Flory, IEEE J. Sel. Top. Quantum Electron. 8, 88 (2002).
[CrossRef]

Tuller, H. L.

G. N. Nielson, D. Seneviratne, F. Lopez-Royo, P. T. Rakich, H. L. Tuller, and G. Barbastathis, IEEE Photon. Technol. Lett. 17, 1190 (2005).

van Spengen, W. M.

W. M. van Spengen, R. Puers, and I. De Wolf, J. Micromech. Microeng. 12, 702 (2002).
[CrossRef]

Watts, M. R.

IEEE J. Sel. Top. Quantum Electron.

R. S. Tucker, D. Baney, W. Sorin, and C. Flory, IEEE J. Sel. Top. Quantum Electron. 8, 88 (2002).
[CrossRef]

IEEE Photon. Technol. Lett.

D. Geuzebroek, E. Klein, H. Kelderman, N. Baker, and A. Driessen, IEEE Photon. Technol. Lett. 17, 336 (2005).

H. M. H. Chong and R. M. De La Rue, IEEE Photon. Technol. Lett. 16, 1528 (2004).
[CrossRef]

G. N. Nielson, D. Seneviratne, F. Lopez-Royo, P. T. Rakich, H. L. Tuller, and G. Barbastathis, IEEE Photon. Technol. Lett. 17, 1190 (2005).

J. Low Temp. Phys.

P. Heimala, P. Katila, J. Aarnio, and A. Heinamaki, J. Low Temp. Phys. 14, 2260 (1996).

J. Micromech. Microeng.

W. M. van Spengen, R. Puers, and I. De Wolf, J. Micromech. Microeng. 12, 702 (2002).
[CrossRef]

Opt. Express

Other

G. N. Nielson, ''Micro-opto-mechanical switching and tuning for integrated optical systems,'' Ph.D. thesis (MIT Archives, 2004).

D. Sarid, Scanning Force Microscopy with Applications to Electric, Magnetic, and Atomic Forces (Oxford U. Press, 1994).

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