Abstract

We present two methods for three-dimensional particle metrology from a single two-dimensional view. The techniques are based on wavefront sensing where the three-dimensional location of a particle is encoded into a single image plane. The first technique is based on multiplanar imaging, and the second produces three-dimensional location information via anamorphic distortion of the recorded images. Preliminary results show that an uncertainty of 8μm in depth can be obtained for low-particle density over a thin plane, and an uncertainty of 30μm for higher particle density over a 10mm deep volume.

© 2006 Optical Society of America

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