Abstract

Quality factor enhancement due to mode coupling is observed in a three-dimensional microdisk resonator. The microdisk, which is vertically sandwiched between air and a substrate, with a radius of 1μm, a thickness of 0.2μm, and a refractive index of 3.4, is considered in a finite-difference time-domain (FDTD) numerical simulation. The mode quality factor of the fundamental mode HE71 decreases with an increase of the refractive index of the substrate, nsub, from 2.0 to 3.17. However, the mode quality factor of the first-order mode HE72 reaches a peak value at nsub=2.7 because of the mode coupling between the fundamental and the first-order modes. The variation of mode field distributions due to the mode coupling is also observed. This mechanism may be used to realize high-quality-factor modes in microdisks with high-refractive-index substrates.

© 2006 Optical Society of America

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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef]

2005 (1)

Q. Chen, Y.-Z. Huang, W.-H. Guo, and L.-J. Yu, IEEE J. Quantum Electron. 41, 997 (2005).
[CrossRef]

2001 (1)

W. H. Guo, W. J. Li, and Y. Z. Huang, IEEE Microw. Wirel. Compon. Lett. 11, 223 (2001).
[CrossRef]

1998 (1)

R. P. Wang and M.-M. Dumitreschu, IEEE J. Quantum Electron. 34, 1933 (1998).
[CrossRef]

1997 (1)

J. Y. Duboz, J. Phys. I 7, 1693 (1997).
[CrossRef]

1996 (2)

N. C. Frateschi and A. F. J. Levi, J. Appl. Phys. 80, 644 (1996).
[CrossRef]

B.-J. Li and P.-L. Liu, IEEE J. Quantum Electron. 32, 1583 (1996).
[CrossRef]

1994 (1)

M. K. Chin, D. Y. Chu, and S.-T. Ho, J. Appl. Phys. 75, 3302 (1994).
[CrossRef]

1992 (2)

S. L. McCall, A. F. J. Levi, R. E. Slusher, S. J. Pearton, and R. A. Logan, Appl. Phys. Lett. 60, 289 (1992).
[CrossRef]

C. Weisbuch, M. Nishioka, A. Ishikawa, and Y. Arakawa, Phys. Rev. Lett. 69, 3314 (1992).
[CrossRef] [PubMed]

1991 (1)

H. A. Huas and W. P. Huang, Proc. IEEE 79, 1505 (1991).
[CrossRef]

1990 (1)

Y. Zhu, D. J. Gauthier, S. E. Morin, Q. Wu, H. J. Carmichael, and T. W. Mossberg, Phys. Rev. Lett. 64, 2499 (1990).
[CrossRef] [PubMed]

Arakawa, Y.

C. Weisbuch, M. Nishioka, A. Ishikawa, and Y. Arakawa, Phys. Rev. Lett. 69, 3314 (1992).
[CrossRef] [PubMed]

Carmichael, H. J.

Y. Zhu, D. J. Gauthier, S. E. Morin, Q. Wu, H. J. Carmichael, and T. W. Mossberg, Phys. Rev. Lett. 64, 2499 (1990).
[CrossRef] [PubMed]

Chen, Q.

Q. Chen, Y.-Z. Huang, W.-H. Guo, and L.-J. Yu, IEEE J. Quantum Electron. 41, 997 (2005).
[CrossRef]

Chin, M. K.

M. K. Chin, D. Y. Chu, and S.-T. Ho, J. Appl. Phys. 75, 3302 (1994).
[CrossRef]

Chu, D. Y.

M. K. Chin, D. Y. Chu, and S.-T. Ho, J. Appl. Phys. 75, 3302 (1994).
[CrossRef]

Duboz, J. Y.

J. Y. Duboz, J. Phys. I 7, 1693 (1997).
[CrossRef]

Dumitreschu, M.-M.

R. P. Wang and M.-M. Dumitreschu, IEEE J. Quantum Electron. 34, 1933 (1998).
[CrossRef]

Frateschi, N. C.

N. C. Frateschi and A. F. J. Levi, J. Appl. Phys. 80, 644 (1996).
[CrossRef]

Gauthier, D. J.

Y. Zhu, D. J. Gauthier, S. E. Morin, Q. Wu, H. J. Carmichael, and T. W. Mossberg, Phys. Rev. Lett. 64, 2499 (1990).
[CrossRef] [PubMed]

Guo, W. H.

W. H. Guo, W. J. Li, and Y. Z. Huang, IEEE Microw. Wirel. Compon. Lett. 11, 223 (2001).
[CrossRef]

Guo, W.-H.

Q. Chen, Y.-Z. Huang, W.-H. Guo, and L.-J. Yu, IEEE J. Quantum Electron. 41, 997 (2005).
[CrossRef]

Ho, S.-T.

M. K. Chin, D. Y. Chu, and S.-T. Ho, J. Appl. Phys. 75, 3302 (1994).
[CrossRef]

Huang, W. P.

H. A. Huas and W. P. Huang, Proc. IEEE 79, 1505 (1991).
[CrossRef]

Huang, Y. Z.

W. H. Guo, W. J. Li, and Y. Z. Huang, IEEE Microw. Wirel. Compon. Lett. 11, 223 (2001).
[CrossRef]

Huang, Y.-Z.

Q. Chen, Y.-Z. Huang, W.-H. Guo, and L.-J. Yu, IEEE J. Quantum Electron. 41, 997 (2005).
[CrossRef]

Huas, H. A.

H. A. Huas and W. P. Huang, Proc. IEEE 79, 1505 (1991).
[CrossRef]

Ishikawa, A.

C. Weisbuch, M. Nishioka, A. Ishikawa, and Y. Arakawa, Phys. Rev. Lett. 69, 3314 (1992).
[CrossRef] [PubMed]

Levi, A. F. J.

N. C. Frateschi and A. F. J. Levi, J. Appl. Phys. 80, 644 (1996).
[CrossRef]

S. L. McCall, A. F. J. Levi, R. E. Slusher, S. J. Pearton, and R. A. Logan, Appl. Phys. Lett. 60, 289 (1992).
[CrossRef]

Li, B.-J.

B.-J. Li and P.-L. Liu, IEEE J. Quantum Electron. 32, 1583 (1996).
[CrossRef]

Li, W. J.

W. H. Guo, W. J. Li, and Y. Z. Huang, IEEE Microw. Wirel. Compon. Lett. 11, 223 (2001).
[CrossRef]

Liu, P.-L.

B.-J. Li and P.-L. Liu, IEEE J. Quantum Electron. 32, 1583 (1996).
[CrossRef]

Logan, R. A.

S. L. McCall, A. F. J. Levi, R. E. Slusher, S. J. Pearton, and R. A. Logan, Appl. Phys. Lett. 60, 289 (1992).
[CrossRef]

McCall, S. L.

S. L. McCall, A. F. J. Levi, R. E. Slusher, S. J. Pearton, and R. A. Logan, Appl. Phys. Lett. 60, 289 (1992).
[CrossRef]

Morin, S. E.

Y. Zhu, D. J. Gauthier, S. E. Morin, Q. Wu, H. J. Carmichael, and T. W. Mossberg, Phys. Rev. Lett. 64, 2499 (1990).
[CrossRef] [PubMed]

Mossberg, T. W.

Y. Zhu, D. J. Gauthier, S. E. Morin, Q. Wu, H. J. Carmichael, and T. W. Mossberg, Phys. Rev. Lett. 64, 2499 (1990).
[CrossRef] [PubMed]

Nishioka, M.

C. Weisbuch, M. Nishioka, A. Ishikawa, and Y. Arakawa, Phys. Rev. Lett. 69, 3314 (1992).
[CrossRef] [PubMed]

Pearton, S. J.

S. L. McCall, A. F. J. Levi, R. E. Slusher, S. J. Pearton, and R. A. Logan, Appl. Phys. Lett. 60, 289 (1992).
[CrossRef]

Slusher, R. E.

S. L. McCall, A. F. J. Levi, R. E. Slusher, S. J. Pearton, and R. A. Logan, Appl. Phys. Lett. 60, 289 (1992).
[CrossRef]

Wang, R. P.

R. P. Wang and M.-M. Dumitreschu, IEEE J. Quantum Electron. 34, 1933 (1998).
[CrossRef]

Weisbuch, C.

C. Weisbuch, M. Nishioka, A. Ishikawa, and Y. Arakawa, Phys. Rev. Lett. 69, 3314 (1992).
[CrossRef] [PubMed]

Wu, Q.

Y. Zhu, D. J. Gauthier, S. E. Morin, Q. Wu, H. J. Carmichael, and T. W. Mossberg, Phys. Rev. Lett. 64, 2499 (1990).
[CrossRef] [PubMed]

Yu, L.-J.

Q. Chen, Y.-Z. Huang, W.-H. Guo, and L.-J. Yu, IEEE J. Quantum Electron. 41, 997 (2005).
[CrossRef]

Zhu, Y.

Y. Zhu, D. J. Gauthier, S. E. Morin, Q. Wu, H. J. Carmichael, and T. W. Mossberg, Phys. Rev. Lett. 64, 2499 (1990).
[CrossRef] [PubMed]

Appl. Phys. Lett. (1)

S. L. McCall, A. F. J. Levi, R. E. Slusher, S. J. Pearton, and R. A. Logan, Appl. Phys. Lett. 60, 289 (1992).
[CrossRef]

IEEE J. Quantum Electron. (3)

Q. Chen, Y.-Z. Huang, W.-H. Guo, and L.-J. Yu, IEEE J. Quantum Electron. 41, 997 (2005).
[CrossRef]

B.-J. Li and P.-L. Liu, IEEE J. Quantum Electron. 32, 1583 (1996).
[CrossRef]

R. P. Wang and M.-M. Dumitreschu, IEEE J. Quantum Electron. 34, 1933 (1998).
[CrossRef]

IEEE Microw. Wirel. Compon. Lett. (1)

W. H. Guo, W. J. Li, and Y. Z. Huang, IEEE Microw. Wirel. Compon. Lett. 11, 223 (2001).
[CrossRef]

J. Appl. Phys. (2)

M. K. Chin, D. Y. Chu, and S.-T. Ho, J. Appl. Phys. 75, 3302 (1994).
[CrossRef]

N. C. Frateschi and A. F. J. Levi, J. Appl. Phys. 80, 644 (1996).
[CrossRef]

J. Phys. I (1)

J. Y. Duboz, J. Phys. I 7, 1693 (1997).
[CrossRef]

Phys. Rev. Lett. (2)

Y. Zhu, D. J. Gauthier, S. E. Morin, Q. Wu, H. J. Carmichael, and T. W. Mossberg, Phys. Rev. Lett. 64, 2499 (1990).
[CrossRef] [PubMed]

C. Weisbuch, M. Nishioka, A. Ishikawa, and Y. Arakawa, Phys. Rev. Lett. 69, 3314 (1992).
[CrossRef] [PubMed]

Proc. IEEE (1)

H. A. Huas and W. P. Huang, Proc. IEEE 79, 1505 (1991).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Cross section of a microdisk with infinite substrate and the calculation region.

Fig. 2
Fig. 2

Variation of the mode wavelength λ and quality factor Q as functions of the refractive index of the substrate n sub for the HE 71 and HE 72 modes for a microdisk with R = 1.0 μ m .

Fig. 3
Fig. 3

Field distributions of H z in the vertical and horizontal directions for a microdisk with R = 1.0 μ m . (a) H z in the z direction for the HE 71 mode at R = 0.84 μ m ; (b) H z in the r direction for the HE 71 mode at z = 6.1 μ m ; (c) H z in the z direction for the HE 72 mode at R = 0.84 μ m ; (d) H z in the r direction for the HE 72 mode at z = 6.1 μ m .

Fig. 4
Fig. 4

Variation of the mode wavelength λ and quality factor Q as functions of the refractive index of the substrate n sub for (top) the HE 6 , 1 and HE 6 , 2 modes for a microdisk with r = 1.0 μ m , and (bottom) the HE 7 , 1 and HE 7 , 2 modes for a microdisk with r = 1.2 μ m .

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