Abstract

Differential-phase-shift quantum key distribution (DPS-QKD) with an extended degree of freedom of measurement is proposed. Extending the degree of freedom makes it possible to strengthen the DPS-QKD scheme against intercept-and-resend attacks. The feasibility of this idea is experimentally demonstrated.

© 2006 Optical Society of America

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References

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  1. K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. Lett. 89, 037902 (2002).
    [CrossRef] [PubMed]
  2. K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. A 68, 022317 (2003).
    [CrossRef]
  3. K. Inoue and T. Honjo, Phys. Rev. A 71, 042305 (2005).
    [CrossRef]
  4. T. Honjo, K. Inoue, and H. Takahashi, Opt. Lett. 29, 2797 (2004).
    [CrossRef] [PubMed]
  5. N. Lutkenhaus, Phys. Rev. A 61, 052304 (2000).
    [CrossRef]
  6. A. Himeno, K. Kato, and T. Miya, IEEE J. Sel. Top. Quantum Electron. 4, 913 (1998).
    [CrossRef]
  7. Y. Inoue, H. Takahashi, S. Ando, T. Sawada, A. Himeno, and M. Kawachi, J. Lightwave Technol. 15, 1947 (1997).
    [CrossRef]

2005 (1)

K. Inoue and T. Honjo, Phys. Rev. A 71, 042305 (2005).
[CrossRef]

2004 (1)

2003 (1)

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. A 68, 022317 (2003).
[CrossRef]

2002 (1)

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. Lett. 89, 037902 (2002).
[CrossRef] [PubMed]

2000 (1)

N. Lutkenhaus, Phys. Rev. A 61, 052304 (2000).
[CrossRef]

1998 (1)

A. Himeno, K. Kato, and T. Miya, IEEE J. Sel. Top. Quantum Electron. 4, 913 (1998).
[CrossRef]

1997 (1)

Y. Inoue, H. Takahashi, S. Ando, T. Sawada, A. Himeno, and M. Kawachi, J. Lightwave Technol. 15, 1947 (1997).
[CrossRef]

Ando, S.

Y. Inoue, H. Takahashi, S. Ando, T. Sawada, A. Himeno, and M. Kawachi, J. Lightwave Technol. 15, 1947 (1997).
[CrossRef]

Himeno, A.

A. Himeno, K. Kato, and T. Miya, IEEE J. Sel. Top. Quantum Electron. 4, 913 (1998).
[CrossRef]

Y. Inoue, H. Takahashi, S. Ando, T. Sawada, A. Himeno, and M. Kawachi, J. Lightwave Technol. 15, 1947 (1997).
[CrossRef]

Honjo, T.

Inoue, K.

K. Inoue and T. Honjo, Phys. Rev. A 71, 042305 (2005).
[CrossRef]

T. Honjo, K. Inoue, and H. Takahashi, Opt. Lett. 29, 2797 (2004).
[CrossRef] [PubMed]

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. A 68, 022317 (2003).
[CrossRef]

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. Lett. 89, 037902 (2002).
[CrossRef] [PubMed]

Inoue, Y.

Y. Inoue, H. Takahashi, S. Ando, T. Sawada, A. Himeno, and M. Kawachi, J. Lightwave Technol. 15, 1947 (1997).
[CrossRef]

Kato, K.

A. Himeno, K. Kato, and T. Miya, IEEE J. Sel. Top. Quantum Electron. 4, 913 (1998).
[CrossRef]

Kawachi, M.

Y. Inoue, H. Takahashi, S. Ando, T. Sawada, A. Himeno, and M. Kawachi, J. Lightwave Technol. 15, 1947 (1997).
[CrossRef]

Lutkenhaus, N.

N. Lutkenhaus, Phys. Rev. A 61, 052304 (2000).
[CrossRef]

Miya, T.

A. Himeno, K. Kato, and T. Miya, IEEE J. Sel. Top. Quantum Electron. 4, 913 (1998).
[CrossRef]

Sawada, T.

Y. Inoue, H. Takahashi, S. Ando, T. Sawada, A. Himeno, and M. Kawachi, J. Lightwave Technol. 15, 1947 (1997).
[CrossRef]

Takahashi, H.

T. Honjo, K. Inoue, and H. Takahashi, Opt. Lett. 29, 2797 (2004).
[CrossRef] [PubMed]

Y. Inoue, H. Takahashi, S. Ando, T. Sawada, A. Himeno, and M. Kawachi, J. Lightwave Technol. 15, 1947 (1997).
[CrossRef]

Waks, E.

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. A 68, 022317 (2003).
[CrossRef]

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. Lett. 89, 037902 (2002).
[CrossRef] [PubMed]

Yamamoto, Y.

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. A 68, 022317 (2003).
[CrossRef]

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. Lett. 89, 037902 (2002).
[CrossRef] [PubMed]

IEEE J. Sel. Top. Quantum Electron. (1)

A. Himeno, K. Kato, and T. Miya, IEEE J. Sel. Top. Quantum Electron. 4, 913 (1998).
[CrossRef]

J. Lightwave Technol. (1)

Y. Inoue, H. Takahashi, S. Ando, T. Sawada, A. Himeno, and M. Kawachi, J. Lightwave Technol. 15, 1947 (1997).
[CrossRef]

Opt. Lett. (1)

Phys. Rev. A (3)

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. A 68, 022317 (2003).
[CrossRef]

K. Inoue and T. Honjo, Phys. Rev. A 71, 042305 (2005).
[CrossRef]

N. Lutkenhaus, Phys. Rev. A 61, 052304 (2000).
[CrossRef]

Phys. Rev. Lett. (1)

K. Inoue, E. Waks, and Y. Yamamoto, Phys. Rev. Lett. 89, 037902 (2002).
[CrossRef] [PubMed]

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Figures (3)

Fig. 1
Fig. 1

Error probability against intercept and resend attack.

Fig. 2
Fig. 2

Extinction ratio as a function of temperature. PLC Mach–Zehnder interferometers path-length differences of (a) 20 and (b) 40 cm . Pol., polarization.

Fig. 3
Fig. 3

Experimental setup: LD, laser diode; IM, intensity modulator; PG, pulse generator; PPG, pulse pattern generator; PM, phase modulator; ATT, attenuator; PLC MZI 1, PLC Mach–Zehnder interferometer with a path-length difference of 20 cm ; PLC MZI 2, PLC Mach–Zehnder interferometer with a path-length difference of 40 cm ; DET, photon detector; TIA, time interval analyzer.

Equations (1)

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e = 1 2 ( 1 1 2 n ) .

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