Abstract

Microstructures of composite materials can exhibit properties significantly different from their individual constitution. By utilizing these unique characteristics, we design diffractive optical elements to demonstrate transmission-only polarizers for telecommunications. The transmittance and the extinction ratio of the proposed structure are >95% and >40dB at 14701910nm wavelengths, respectively. The average reflectance for random polarization is less than 1% at 13501580nm. The methods are applicable to diffractive optics, e.g., in the ultraviolet and visible spectrum.

© 2006 Optical Society of America

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[CrossRef] [PubMed]

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[CrossRef] [PubMed]

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[CrossRef]

S. Noda, M. Yokoyama, M. Imada, A. Chutinan, and M. Mochizuki, Science 293, 1123 (2001).
[CrossRef] [PubMed]

J. Lu and M. J. Kushner, J. Vac. Sci. Technol. A 19, 2652 (2001).
[CrossRef]

2000

M. F. Weber, C. A. Stover, L. R. Gilbert, T. J. Nevitt, and A. J. Ouderkirk, Science 287, 2451 (2000).
[CrossRef] [PubMed]

X. Deng and R. T. Chen, Opt. Lett. 25, 1046 (2000).
[CrossRef]

1999

1998

1997

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[CrossRef] [PubMed]

H. Kikuta, H. Yoshida, and K. Iwata, Opt. Rev. 2, 92 (1995).
[CrossRef]

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J. W. Lutze, Y. Y. Shacham-Diamand, and J. P. Krusius, J. Micromech. Microeng. 1, 46 (1991).
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Arnold, R.

Astilean, S.

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[CrossRef] [PubMed]

Bennett, J. M.

J. M. Bennett, in Handbook of Optics, 2nd ed., M.Bass, ed. (McGraw-Hill, 1995), Vol. 2, Chap. 3, pp. 3.1-3.70.

Bouchitté, G.

Brasher, J. D.

Butler, M. A.

Cambril, E.

Chang, H. T.

Chavel, P.

Chen, D.

Chen, L.

Chen, R. T.

X. Deng and R. T. Chen, in Proc. SPIE 4292, 17 (2001).
[CrossRef]

X. Deng and R. T. Chen, Opt. Lett. 25, 1046 (2000).
[CrossRef]

Chen, Y.

Chen, Y. S.

Chutinan, A.

S. Noda, M. Yokoyama, M. Imada, A. Chutinan, and M. Mochizuki, Science 293, 1123 (2001).
[CrossRef] [PubMed]

Craighead, H. G.

Deng, J.

J. Wang, P. Sciortino, J. Deng, X. Deng, F. Liu, R. Varghese, A. Nikolov, and A. Graham, IEEE Photon. Technol. Lett. 17, 396 (2005).
[CrossRef]

J. Wang, W. Zhang, X. Deng, J. Deng, F. Liu, P. Sciortino, and L. Chen, Opt. Lett. 30, 195 (2005).
[CrossRef] [PubMed]

Deng, X.

Fainman, Y.

Felbacq, D.

Ford, J. E.

Gilbert, L. R.

M. F. Weber, C. A. Stover, L. R. Gilbert, T. J. Nevitt, and A. J. Ouderkirk, Science 287, 2451 (2000).
[CrossRef] [PubMed]

Glaser, T.

Gordon, R. G.

D. Hausmann, J. Becker, S. Wang, and R. G. Gordon, Science 298, 402 (2002).
[CrossRef] [PubMed]

Graham, A.

J. Wang, P. Sciortino, J. Deng, X. Deng, F. Liu, R. Varghese, A. Nikolov, and A. Graham, IEEE Photon. Technol. Lett. 17, 396 (2005).
[CrossRef]

Grann, E. B.

Haidner, H.

Hausmann, D.

D. Hausmann, J. Becker, S. Wang, and R. G. Gordon, Science 298, 402 (2002).
[CrossRef] [PubMed]

Hong, C.-S.

Ignatiev, A.

Imada, M.

S. Noda, M. Yokoyama, M. Imada, A. Chutinan, and M. Mochizuki, Science 293, 1123 (2001).
[CrossRef] [PubMed]

Iwata, K.

H. Kikuta, H. Yoshida, and K. Iwata, Opt. Rev. 2, 92 (1995).
[CrossRef]

Johnson, E. G.

Kawakami, S.

K. Shiraishi, T. Sato, and S. Kawakami, Appl. Phys. Lett. 58, 211 (1991).
[CrossRef]

K. Shiraishi and S. Kawakami, Opt. Lett. 15, 516 (1990).
[CrossRef] [PubMed]

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H. Kikuta, H. Yoshida, and K. Iwata, Opt. Rev. 2, 92 (1995).
[CrossRef]

Kim, H.

Kipfer, P.

Kirk, A.

Kleemann, B. H.

Kravitz, S. H.

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J. W. Lutze, Y. Y. Shacham-Diamand, and J. P. Krusius, J. Micromech. Microeng. 1, 46 (1991).
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Launois, H.

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Levy, U.

Li, Y.-P.

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Liu, X.

Lopez, A. G.

Lu, J.

J. Lu and M. J. Kushner, J. Vac. Sci. Technol. A 19, 2652 (2001).
[CrossRef]

Lu, W. C.

Lutze, J. W.

J. W. Lutze, Y. Y. Shacham-Diamand, and J. P. Krusius, J. Micromech. Microeng. 1, 46 (1991).
[CrossRef]

Mait, J. N.

Mirotznik, M. S.

Mochizuki, M.

S. Noda, M. Yokoyama, M. Imada, A. Chutinan, and M. Mochizuki, Science 293, 1123 (2001).
[CrossRef] [PubMed]

Moharam, M. G.

Morlion, B.

Nevitt, T. J.

M. F. Weber, C. A. Stover, L. R. Gilbert, T. J. Nevitt, and A. J. Ouderkirk, Science 287, 2451 (2000).
[CrossRef] [PubMed]

Nieuborg, N.

Nikolov, A.

J. Wang, P. Sciortino, J. Deng, X. Deng, F. Liu, R. Varghese, A. Nikolov, and A. Graham, IEEE Photon. Technol. Lett. 17, 396 (2005).
[CrossRef]

J. Wang, X. Deng, R. Vaghese, A. Nikolov, P. Sciortino, F. Liu, and L. Chen, Opt. Lett. 30, 1864 (2005).
[CrossRef] [PubMed]

Noda, S.

S. Noda, M. Yokoyama, M. Imada, A. Chutinan, and M. Mochizuki, Science 293, 1123 (2001).
[CrossRef] [PubMed]

Ouderkirk, A. J.

M. F. Weber, C. A. Stover, L. R. Gilbert, T. J. Nevitt, and A. J. Ouderkirk, Science 287, 2451 (2000).
[CrossRef] [PubMed]

Pommet, D. A.

Prather, D. W.

Pustai, D. M.

Ricco, A. J.

Ruoff, J.

Sato, T.

K. Shiraishi, T. Sato, and S. Kawakami, Appl. Phys. Lett. 58, 211 (1991).
[CrossRef]

Schrter, S.

Sciortino, P.

Shacham-Diamand, Y. Y.

J. W. Lutze, Y. Y. Shacham-Diamand, and J. P. Krusius, J. Micromech. Microeng. 1, 46 (1991).
[CrossRef]

Shiraishi, K.

K. Shiraishi, T. Sato, and S. Kawakami, Appl. Phys. Lett. 58, 211 (1991).
[CrossRef]

K. Shiraishi and S. Kawakami, Opt. Lett. 15, 516 (1990).
[CrossRef] [PubMed]

Sinclair, M. B.

Stork, W.

Stover, C. A.

M. F. Weber, C. A. Stover, L. R. Gilbert, T. J. Nevitt, and A. J. Ouderkirk, Science 287, 2451 (2000).
[CrossRef] [PubMed]

Streibl, N.

Thienpont, H.

Tsai, C.

Tyan, R.-C.

Vaghese, R.

Varghese, R.

J. Wang, P. Sciortino, J. Deng, X. Deng, F. Liu, R. Varghese, A. Nikolov, and A. Graham, IEEE Photon. Technol. Lett. 17, 396 (2005).
[CrossRef]

Veretennicoff, I.

Wang, J.

Wang, S.

D. Hausmann, J. Becker, S. Wang, and R. G. Gordon, Science 298, 402 (2002).
[CrossRef] [PubMed]

Wang, Z.

Weber, M. F.

M. F. Weber, C. A. Stover, L. R. Gilbert, T. J. Nevitt, and A. J. Ouderkirk, Science 287, 2451 (2000).
[CrossRef] [PubMed]

Wu, N. J.

Xu, F.

Yariv, A.

Yeh, P.

Yokoyama, M.

S. Noda, M. Yokoyama, M. Imada, A. Chutinan, and M. Mochizuki, Science 293, 1123 (2001).
[CrossRef] [PubMed]

Yoshida, H.

H. Kikuta, H. Yoshida, and K. Iwata, Opt. Rev. 2, 92 (1995).
[CrossRef]

Zhan, Q.

Zhang, W.

Zhang, Y.

Zhao, Y.

Zubrzycki, W. J.

Appl. Opt.

Appl. Phys. Lett.

K. Shiraishi, T. Sato, and S. Kawakami, Appl. Phys. Lett. 58, 211 (1991).
[CrossRef]

IEEE Photon. Technol. Lett.

J. Wang, P. Sciortino, J. Deng, X. Deng, F. Liu, R. Varghese, A. Nikolov, and A. Graham, IEEE Photon. Technol. Lett. 17, 396 (2005).
[CrossRef]

J. Micromech. Microeng.

J. W. Lutze, Y. Y. Shacham-Diamand, and J. P. Krusius, J. Micromech. Microeng. 1, 46 (1991).
[CrossRef]

J. Opt. Soc. Am.

J. Opt. Soc. Am. A

J. Vac. Sci. Technol. A

J. Lu and M. J. Kushner, J. Vac. Sci. Technol. A 19, 2652 (2001).
[CrossRef]

Opt. Express

Opt. Lett.

W. Stork, N. Streibl, H. Haidner, and P. Kipfer, Opt. Lett. 16, 1921 (1991).
[CrossRef] [PubMed]

X. Deng and R. T. Chen, Opt. Lett. 25, 1046 (2000).
[CrossRef]

F. Xu, R.-C. Tyan, Y. Fainman, and J. E. Ford, Opt. Lett. 21, 516 (1996).
[CrossRef] [PubMed]

E. G. Johnson and J. D. Brasher, Opt. Lett. 21, 1271 (1996).
[CrossRef] [PubMed]

J. Wang, W. Zhang, X. Deng, J. Deng, F. Liu, P. Sciortino, and L. Chen, Opt. Lett. 30, 195 (2005).
[CrossRef] [PubMed]

Y. Zhao, Q. Zhan, Y. Zhang, and Y.-P. Li, Opt. Lett. 30, 848 (2005).
[CrossRef] [PubMed]

D. Felbacq and G. Bouchitté, Opt. Lett. 30, 1189 (2005).
[CrossRef] [PubMed]

B. H. Kleemann, J. Ruoff, and R. Arnold, Opt. Lett. 30, 1617 (2005).
[CrossRef] [PubMed]

J. Wang, X. Deng, R. Vaghese, A. Nikolov, P. Sciortino, F. Liu, and L. Chen, Opt. Lett. 30, 1864 (2005).
[CrossRef] [PubMed]

X. Deng, F. Liu, J. Wang, P. Sciortino, Jr., L. Chen, and X. Liu, Opt. Lett. 30, 2614 (2005).
[CrossRef] [PubMed]

K. Shiraishi and S. Kawakami, Opt. Lett. 15, 516 (1990).
[CrossRef] [PubMed]

J. R. Leger, D. Chen, and Z. Wang, Opt. Lett. 19, 108 (1994).
[CrossRef] [PubMed]

S. Liu and Y. Chen, Opt. Lett. 20, 1832 (1995).
[CrossRef] [PubMed]

M. B. Sinclair, M. A. Butler, S. H. Kravitz, W. J. Zubrzycki, and A. J. Ricco, Opt. Lett. 22, 1036 (1997).
[CrossRef] [PubMed]

S. Q. Liu, Y. S. Chen, N. J. Wu, and A. Ignatiev, Opt. Lett. 22, 1518 (1997).
[CrossRef]

A. G. Lopez and H. G. Craighead, Opt. Lett. 23, 1627 (1998).
[CrossRef]

T. Glaser, S. Schrter, and H. Bartelt, Opt. Lett. 23, 1933 (1998).
[CrossRef]

Opt. Rev.

H. Kikuta, H. Yoshida, and K. Iwata, Opt. Rev. 2, 92 (1995).
[CrossRef]

Proc. SPIE

X. Deng and R. T. Chen, in Proc. SPIE 4292, 17 (2001).
[CrossRef]

Science

M. F. Weber, C. A. Stover, L. R. Gilbert, T. J. Nevitt, and A. J. Ouderkirk, Science 287, 2451 (2000).
[CrossRef] [PubMed]

S. Noda, M. Yokoyama, M. Imada, A. Chutinan, and M. Mochizuki, Science 293, 1123 (2001).
[CrossRef] [PubMed]

D. Hausmann, J. Becker, S. Wang, and R. G. Gordon, Science 298, 402 (2002).
[CrossRef] [PubMed]

Other

J. M. Bennett, in Handbook of Optics, 2nd ed., M.Bass, ed. (McGraw-Hill, 1995), Vol. 2, Chap. 3, pp. 3.1-3.70.

E.D.Palik and G.Ghosh, eds., Electronic Handbook of Optical Constants of Solids (Academic, 1999).

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Figures (3)

Fig. 1
Fig. 1

(Color online) Schematic cross section of the multilayer DOE based on MCMs. The thickness of each layer is listed to the left of the structure, and its function is labeled on the right side. The DOE of period Λ D x consists of two layers: a second WGP ( W D x of each period) and the planarization layer.

Fig. 2
Fig. 2

(Color online) Simulated reflectance spectra of an optimized multilayer DOE. Rs, Rp, Ra, reflectance of the TE, TM, and random polarized electromagnetic radiation, respectively. Rs(iWGP), TE reflectance of the structure in Fig. 1 but with t D = t I = 0 . Ra(n500), same as Ra except n = 500 .

Fig. 3
Fig. 3

(Color online) Simulated transmittance, extinction ratio, and total nonabsorbed efficiency of the optimized antireflective polarizers. Tp, Pm, Et, transmittance, total efficiency, and extinction ratio of TM polarized electromagnetic radiation, respectively. Tp(iWGP), Pm(iWGP), Et(iWGP), TM transmittance, total efficiency, and extinction ratio, respectively, for the same structure except t D = t I = 0 . Tp(n500), same as Tp except n = 500 .

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