Abstract

A novel and simple phase-shifting point-diffraction interferometer using a z-cut lithium niobate wafer is proposed. The pinhole is realized by an optical lithography process, aluminum deposition, and subsequent lift-off on the surface of the wafer. The phase shifting is obtained by inducing the electro-optic effect along the z crystal axis. We demonstrate experimentally the possibility of retrieving an aberrated wavefront.

© 2006 Optical Society of America

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References

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2006 (2)

2005 (1)

2002 (1)

2000 (2)

1999 (1)

1996 (2)

1994 (2)

C. R. Mercer and K. Creath, Opt. Lett. 19, 916 (1994).
[Crossref] [PubMed]

H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[Crossref]

1986 (1)

A. K. Aggarwal and S. K. Kaura, J. Opt. 17, 135 (1986).
[Crossref]

1984 (1)

1978 (1)

Acosta, E.

Aggarwal, A. K.

A. K. Aggarwal and S. K. Kaura, J. Opt. 17, 135 (1986).
[Crossref]

Alfieri, D.

Attwood, D.

Battaglia, D. J.

Blendowske, R.

Bokar, J.

Bokor, J.

Chamadoira, S.

Chang, C.

Creath, K.

de Angelis, M.

De Natale, P.

De Nicola, S.

Ferraro, P.

Finizio, A.

Goldberg, K. A.

Grilli, S.

Guardalben, M. J.

Hayslett, C. R.

Jain, N.

Kadono, H.

H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[Crossref]

Kaura, S. K.

A. K. Aggarwal and S. K. Kaura, J. Opt. 17, 135 (1986).
[Crossref]

Koliopoulos, C. L.

Kwon, O.

Kwon, O. Y.

Lee, S. H.

Malacara, D.

D. Malacara, in Optical Shop Testing, D.Malacara, ed. (Wiley, 1991), pp. 51-86.

Mantravadi, M. V.

M. V. Mantravadi, in Optical Shop Testing, D.Malacara, ed. (Wiley, l991), pp. 123-159.

Marshall, K. L.

Medecki, H.

Mercer, C. R.

Naulleau, P. P.

Naulleau, R.

Neal, R. M.

Ning, L.

Ogusu, M.

H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[Crossref]

Oldham, W.

Paturzo, M.

Piao, F.

Pierattini, G.

Sansone, L.

Shagam, R.

Tejnil, E.

Toyooka, S.

H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[Crossref]

Wyant, J. C.

Appl. Opt. (5)

J. Opt. (1)

A. K. Aggarwal and S. K. Kaura, J. Opt. 17, 135 (1986).
[Crossref]

J. Opt. Soc. Am. A (1)

Opt. Commun. (2)

S. De Nicola and P. Ferraro, Opt. Commun. 185, 285 (2000).
[Crossref]

H. Kadono, M. Ogusu, and S. Toyooka, Opt. Commun. 110, 391 (1994).
[Crossref]

Opt. Lett. (5)

Other (2)

D. Malacara, in Optical Shop Testing, D.Malacara, ed. (Wiley, 1991), pp. 51-86.

M. V. Mantravadi, in Optical Shop Testing, D.Malacara, ed. (Wiley, l991), pp. 123-159.

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Figures (4)

Fig. 1
Fig. 1

(a) Schematic of the pinhole fabrication process, (b) optical microscope image of the resist dot, and (c) subsequent aluminum opening structure obtained on the LN surface.

Fig. 2
Fig. 2

Scheme of the optical setup of the PDI interferometer: L i , lenses; PDI-LN, point-diffraction interferometer; CCD, camera.

Fig. 3
Fig. 3

Interference fringes obtained focusing a He Ne laser onto the PDI-LN acquired at different values of the applied voltage. Phases of the images (a), (b), (c), (d), shifted 0.15 rad , consecutively.

Fig. 4
Fig. 4

Phase map of the wavefront calculated with a Carré phase-shift algorithm.

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