Abstract

Second-harmonic generation in 60GeS220Ga2S320KBr chalcohalide glass was investigated by the thermal poling method. A large second-order nonlinear susceptibility, as high as 7.0pmV, was obtained in a poled sample by Maker fringe analysis. We believe this to be the first time that a clear second-harmonic wave was observed in chalcohalide glasses containing large amount of alkali ions (6.25 at. %). Such observation is of great potential use in all optical waveguide devices.

© 2006 Optical Society of America

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X. Wang, S. Gu, Ji. Yu, X. Zhao, and H. Tao, Mater. Chem. Phys. 83, 284 (2004).
[CrossRef]

G. Senthil Murugan, T. Suzuki, and Y. Ohishi, Appl. Phys. Lett. 85, 3405 (2004).
[CrossRef]

2003

P. Thamboon and D. M. Krol, J. Appl. Phys. 93, 32 (2003).
[CrossRef]

2001

2000

1998

M. Qiu, F. Pi, and G. Orriols, Appl. Phys. Lett. 73, 3040 (1998).
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T. Fujiwara, M. Takahashi, and A. J. Ikushima, Appl. Phys. Lett. 71, 1032 (1997).
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P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

D. A. Kleinman, Phys. Rev. 126, 1977 (1962).
[CrossRef]

Asobe, M.

M. Asobe, Opt. Fiber Technol. 3, 142(1997).
[CrossRef]

Bahae, M. S.

M. S. Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Brueck, S. R. J.

Dussauze, M.

Fargin, E.

Fujiwara, T.

T. Fujiwara, M. Takahashi, and A. J. Ikushima, Appl. Phys. Lett. 71, 1032 (1997).
[CrossRef]

Gan, F.

Gu, S.

X. Wang, S. Gu, Ji. Yu, X. Zhao, and H. Tao, Mater. Chem. Phys. 83, 284 (2004).
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Guignard, M.

Hagan, D. J.

M. S. Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Hirao, K.

Ikushima, A. J.

T. Fujiwara, M. Takahashi, and A. J. Ikushima, Appl. Phys. Lett. 71, 1032 (1997).
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Kamal, A.

Kazansky, P. G.

Kleinman, D. A.

D. A. Kleinman, Phys. Rev. 126, 1977 (1962).
[CrossRef]

Krol, D. M.

P. Thamboon and D. M. Krol, J. Appl. Phys. 93, 32 (2003).
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Kudlinski, A.

Lahaye, M.

Lawandy, N. M.

N. M. Lawandy and M. D. Selker, Opt. Commun. 77, 339 (1990).
[CrossRef]

Liu, Q.

Maker, P. D.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Martinelli, G.

Mukherjee, N.

Myers, R. A.

Narazaki, A.

Nazabal, V.

Nisenoff, M.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Ohishi, Y.

G. Senthil Murugan, T. Suzuki, and Y. Ohishi, Appl. Phys. Lett. 85, 3405 (2004).
[CrossRef]

Orriols, G.

M. Qiu, F. Pi, and G. Orriols, Appl. Phys. Lett. 73, 3040 (1998).
[CrossRef]

Pi, F.

M. Qiu, F. Pi, and G. Orriols, Appl. Phys. Lett. 73, 3040 (1998).
[CrossRef]

Qiu, M.

M. Qiu, F. Pi, and G. Orriols, Appl. Phys. Lett. 73, 3040 (1998).
[CrossRef]

Quiquempois, Y.

Russell, P. St. J.

Said, A. A.

M. S. Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Savage, C. M.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Selker, M. D.

N. M. Lawandy and M. D. Selker, Opt. Commun. 77, 339 (1990).
[CrossRef]

Senthil Murugan, G.

G. Senthil Murugan, T. Suzuki, and Y. Ohishi, Appl. Phys. Lett. 85, 3405 (2004).
[CrossRef]

Smektala, F.

Suzuki, T.

G. Senthil Murugan, T. Suzuki, and Y. Ohishi, Appl. Phys. Lett. 85, 3405 (2004).
[CrossRef]

Takahashi, M.

T. Fujiwara, M. Takahashi, and A. J. Ikushima, Appl. Phys. Lett. 71, 1032 (1997).
[CrossRef]

Tanaka, K.

Tao, H.

X. Wang, S. Gu, Ji. Yu, X. Zhao, and H. Tao, Mater. Chem. Phys. 83, 284 (2004).
[CrossRef]

Terhune, R. W.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Thamboon, P.

P. Thamboon and D. M. Krol, J. Appl. Phys. 93, 32 (2003).
[CrossRef]

P. Thamboon, "Creation of a second-order susceptibility in phosphate glasses," UMI No. 3108038, Degree Dissertation (University of California, 2003)

Van Stryland, E. W.

M. S. Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Wang, X.

X. Wang, S. Gu, Ji. Yu, X. Zhao, and H. Tao, Mater. Chem. Phys. 83, 284 (2004).
[CrossRef]

Wei, T. H.

M. S. Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

Yu, Ji.

X. Wang, S. Gu, Ji. Yu, X. Zhao, and H. Tao, Mater. Chem. Phys. 83, 284 (2004).
[CrossRef]

Zeghlache, H.

Zhao, X.

X. Wang, S. Gu, Ji. Yu, X. Zhao, and H. Tao, Mater. Chem. Phys. 83, 284 (2004).
[CrossRef]

Q. Liu, F. Gan, X. Zhao, K. Tanaka, A. Narazaki, and K. Hirao, Opt. Lett. 26, 1347 (2001).
[CrossRef]

Appl. Phys. Lett.

G. Senthil Murugan, T. Suzuki, and Y. Ohishi, Appl. Phys. Lett. 85, 3405 (2004).
[CrossRef]

M. Qiu, F. Pi, and G. Orriols, Appl. Phys. Lett. 73, 3040 (1998).
[CrossRef]

T. Fujiwara, M. Takahashi, and A. J. Ikushima, Appl. Phys. Lett. 71, 1032 (1997).
[CrossRef]

A. Kudlinski, Y. Quiquempois, and G. Martinelli, Appl. Phys. Lett. 86, 161909 (2005).
[CrossRef]

IEEE J. Quantum Electron.

M. S. Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
[CrossRef]

J. Appl. Phys.

P. Thamboon and D. M. Krol, J. Appl. Phys. 93, 32 (2003).
[CrossRef]

Mater. Chem. Phys.

X. Wang, S. Gu, Ji. Yu, X. Zhao, and H. Tao, Mater. Chem. Phys. 83, 284 (2004).
[CrossRef]

Opt. Commun.

N. M. Lawandy and M. D. Selker, Opt. Commun. 77, 339 (1990).
[CrossRef]

Opt. Express

Opt. Fiber Technol.

M. Asobe, Opt. Fiber Technol. 3, 142(1997).
[CrossRef]

Opt. Lett.

Phys. Rev.

D. A. Kleinman, Phys. Rev. 126, 1977 (1962).
[CrossRef]

Phys. Rev. Lett.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Other

P. Thamboon, "Creation of a second-order susceptibility in phosphate glasses," UMI No. 3108038, Degree Dissertation (University of California, 2003)

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Figures (2)

Fig. 1
Fig. 1

Maker fringe patterns of samples. A, samples poled at 240 ° C and 280 ° C . B, samples poled at 180 ° C with modified and normal poling methods. In both cases, the solid curve represents a theoretical fit; points represent experimental data.

Fig. 2
Fig. 2

Diagrammatic view of the modified thermal poling method. The solid steplike line denotes the applied voltage.

Tables (2)

Tables Icon

Table 1 Measured Properties of 60 GeS 2 20 Ga 2 S 3 20 KBr Glass

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Table 2 Comparison of Nonlinear Parameters of Different SON Glasses

Equations (3)

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d eff = d 33 [ 2 sin θ w cos θ w cos θ 2 w + ( cos 2 θ w + 3 sin 2 θ w ) sin θ 2 w ] 3 ,
p 2 w = C d eff t w 4 t 2 w r ( θ ) p w 2 sin 2 φ ( n w 2 n 2 w 2 ) 2 ,
Φ = 2 π L λ ( n w cos θ w n 2 w cos θ 2 w ) ,

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