Abstract

We present a new method for measuring the spectral phase of ultrashort pulses that utilizes spectral shearing interferometry with zero delay. Unlike conventional spectral phase interferometry for direct electric-field reconstruction, which encodes phase as a sensitively calibrated fringe in the spectral domain, two-dimensional spectral shearing interferometry robustly encodes phase along a second dimension. This greatly reduces demands on the spectrometer and allows for complex phase spectra to be measured over extremely large bandwidths, potentially exceeding 1.5 octaves.

© 2006 Optical Society of America

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  1. C. Iaconis and I. Walmsley, IEEE J. Quantum Electron. 35, 501 (1999).
    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
  13. NanoLayers GmbH, www.nanolayers.de, Venteon UltraBroad.

2005 (1)

2004 (3)

2003 (1)

2002 (2)

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

C. Dorrer and I. Walmsley, Appl. Phys. B 74, S209 (2002).
[CrossRef]

2001 (1)

J. Chung and A. Weiner, IEEE J. Sel. Top. Quantum Electron. 7, 656 (2001).
[CrossRef]

2000 (1)

L. Gallmann, D. Sutter, N. Matuschek, G. Steinmeyer, and U. Keller, Appl. Phys. B 70, S67 (2000).

1999 (2)

1993 (1)

D. Kane and R. Trebino, IEEE J. Quantum Electron. 29, 571 (1993).
[CrossRef]

Anderson, M.

Baum, P.

Chung, J.

J. Chung and A. Weiner, IEEE J. Sel. Top. Quantum Electron. 7, 656 (2001).
[CrossRef]

Dorrer, C.

Gallmann, L.

L. Gallmann, D. Sutter, N. Matuschek, G. Steinmeyer, and U. Keller, Appl. Phys. B 70, S67 (2000).

Hirasawa, M.

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Iaconis, C.

C. Iaconis and I. Walmsley, IEEE J. Quantum Electron. 35, 501 (1999).
[CrossRef]

Jasapara, J.

Jensen, S.

Kane, D.

D. Kane and R. Trebino, IEEE J. Quantum Electron. 29, 571 (1993).
[CrossRef]

Karasawa, N.

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Keller, U.

L. Gallmann, D. Sutter, N. Matuschek, G. Steinmeyer, and U. Keller, Appl. Phys. B 70, S67 (2000).

Kosik, E.

Kusaka, S.

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Li, L.

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Lockbrunner, S.

Matuschek, N.

L. Gallmann, D. Sutter, N. Matuschek, G. Steinmeyer, and U. Keller, Appl. Phys. B 70, S67 (2000).

Morita, R.

K. Yamane, Z. Zhang, K. Oka, R. Morita, and M. Yamashita, Opt. Lett. 28, 2258 (2003).
[CrossRef] [PubMed]

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Nakagawa, N.

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Nicholson, J.

Oka, K.

Omenetto, F.

Radunksy, A.

Riedle, E.

Rudolph, W.

Seifert, B.

Steinmeyer, G.

L. Gallmann, D. Sutter, N. Matuschek, G. Steinmeyer, and U. Keller, Appl. Phys. B 70, S67 (2000).

Stolz, H.

Suguro, A.

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Sutter, D.

L. Gallmann, D. Sutter, N. Matuschek, G. Steinmeyer, and U. Keller, Appl. Phys. B 70, S67 (2000).

Tasche, M.

Taylor, A.

Trebino, R.

D. Kane and R. Trebino, IEEE J. Quantum Electron. 29, 571 (1993).
[CrossRef]

Walmsley, I.

E. Kosik, A. Radunksy, I. Walmsley, and C. Dorrer, Opt. Lett. 30, 326 (2005).
[CrossRef] [PubMed]

C. Dorrer and I. Walmsley, Appl. Phys. B 74, S209 (2002).
[CrossRef]

C. Iaconis and I. Walmsley, IEEE J. Quantum Electron. 35, 501 (1999).
[CrossRef]

Weiner, A.

J. Chung and A. Weiner, IEEE J. Sel. Top. Quantum Electron. 7, 656 (2001).
[CrossRef]

Yamane, K.

K. Yamane, Z. Zhang, K. Oka, R. Morita, and M. Yamashita, Opt. Lett. 28, 2258 (2003).
[CrossRef] [PubMed]

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Yamashita, M.

K. Yamane, Z. Zhang, K. Oka, R. Morita, and M. Yamashita, Opt. Lett. 28, 2258 (2003).
[CrossRef] [PubMed]

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Zhang, Z.

Appl. Opt. (1)

Appl. Phys. B (2)

L. Gallmann, D. Sutter, N. Matuschek, G. Steinmeyer, and U. Keller, Appl. Phys. B 70, S67 (2000).

C. Dorrer and I. Walmsley, Appl. Phys. B 74, S209 (2002).
[CrossRef]

IEEE J. Quantum Electron. (2)

C. Iaconis and I. Walmsley, IEEE J. Quantum Electron. 35, 501 (1999).
[CrossRef]

D. Kane and R. Trebino, IEEE J. Quantum Electron. 29, 571 (1993).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron. (1)

J. Chung and A. Weiner, IEEE J. Sel. Top. Quantum Electron. 7, 656 (2001).
[CrossRef]

J. Opt. Soc. Am. B (1)

Meas. Sci. Technol. (1)

R. Morita, M. Hirasawa, N. Karasawa, S. Kusaka, N. Nakagawa, K. Yamane, L. Li, A. Suguro, and M. Yamashita, Meas. Sci. Technol. 13, 1710 (2002).
[CrossRef]

Opt. Lett. (4)

Other (1)

NanoLayers GmbH, www.nanolayers.de, Venteon UltraBroad.

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Figures (3)

Fig. 1
Fig. 1

Schematic of 2DSI optics: SF, SF10 glass (Schott glass); BBO, β-barium borate.

Fig. 2
Fig. 2

Raw 2DSI data from (a) a 5 fs laser pulse and (b) a pulse dispersed by 1 mm of fused silica. The spectrum is shown in (c) with the extracted group delay (GD) curves shown in (d) alongside the measured and Sellmeier-derived glass group delay.

Fig. 3
Fig. 3

2DSI predicted and measured interferometric autocorrelation of a 5 fs pulse.

Equations (1)

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δ t δ τ ( Δ ω Ω ) ,

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