Abstract

A low-cost all-fiber wavelength measurement technique is proposed and demonstrated. A macrobending standard single-mode fiber is developed as an edge filter with an optimal design and simple surface processing. A ratiometric wavelength measurement system employing the developed macrobending fiber filter demonstrates a resolution of 10pm in a wavelength range from 1500to1560nm with ease of assembly and calibration.

© 2006 Optical Society of America

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2005 (3)

2004 (1)

2003 (1)

C. Sookdhis, T. Mei, H. S. Djie, and J. Arokiaraj, Opt. Eng. 42, 3421 (2003).
[CrossRef]

1999 (2)

K. B. Rochford and S. D. Dyer, J. Lightwave Technol. 17, 831 (1999).
[CrossRef]

J. J. Lepley and A. S. Siddiqui, IEE Proc. Optoelectron. 146, 121 (1999).
[CrossRef]

1998 (1)

B. Mason, S. P. DenBaars, and L. A. Coldren, IEEE Photon. Technol. Lett. 10, 1085 (1998).
[CrossRef]

1997 (2)

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

L. Faustini and G. Martini, J. Lightwave Technol. 15, 671 (1997).
[CrossRef]

1996 (1)

A. B. L. Ribeiro, L. A. Ferreira, M. Tsvetkov, and J. L. Santos, Electron. Lett. 32, 382 (1996).
[CrossRef]

1994 (1)

M. A. Davis and A. D. Kersey, Electron. Lett. 30, 75 (1994).
[CrossRef]

1992 (2)

S. M. Melle, K. Liu, and R. M. Measures, IEEE Photon. Technol. Lett. 4, 516 (1992).
[CrossRef]

H. Renner, J. Lightwave Technol. 10, 544 (1992).
[CrossRef]

1990 (1)

1989 (1)

I. Valiente and C. Vassallo, Electron. Lett. 25, 1544 (1989).
[CrossRef]

1988 (1)

A. J. Harris, P. A. Shrubshall, and P. F. Castle, J. Lightwave Technol. 6, 80 (1988).
[CrossRef]

Arokiaraj, J.

C. Sookdhis, T. Mei, H. S. Djie, and J. Arokiaraj, Opt. Eng. 42, 3421 (2003).
[CrossRef]

Askin, C. G.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Barton, J. S.

Castle, P. F.

A. J. Harris, P. A. Shrubshall, and P. F. Castle, J. Lightwave Technol. 6, 80 (1988).
[CrossRef]

Coldren, L. A.

B. Mason, S. P. DenBaars, and L. A. Coldren, IEEE Photon. Technol. Lett. 10, 1085 (1998).
[CrossRef]

Davis, M. A.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

M. A. Davis and A. D. Kersey, Electron. Lett. 30, 75 (1994).
[CrossRef]

DenBaars, S. P.

B. Mason, S. P. DenBaars, and L. A. Coldren, IEEE Photon. Technol. Lett. 10, 1085 (1998).
[CrossRef]

Djie, H. S.

C. Sookdhis, T. Mei, H. S. Djie, and J. Arokiaraj, Opt. Eng. 42, 3421 (2003).
[CrossRef]

Dyer, S. D.

Farrell, G.

Faustini, L.

L. Faustini and G. Martini, J. Lightwave Technol. 15, 671 (1997).
[CrossRef]

Ferreira, L. A.

A. B. L. Ribeiro, L. A. Ferreira, M. Tsvetkov, and J. L. Santos, Electron. Lett. 32, 382 (1996).
[CrossRef]

Freir, T.

Friebele, E. J.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Grover, C. P.

Harper, P. G.

Harris, A. J.

A. J. Harris, P. A. Shrubshall, and P. F. Castle, J. Lightwave Technol. 6, 80 (1988).
[CrossRef]

Jiang, J.

Jones, J. D. C.

Kersey, A. D.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

M. A. Davis and A. D. Kersey, Electron. Lett. 30, 75 (1994).
[CrossRef]

Koo, K. P.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Leblanc, M.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Lepley, J. J.

J. J. Lepley and A. S. Siddiqui, IEE Proc. Optoelectron. 146, 121 (1999).
[CrossRef]

Liu, K.

S. M. Melle, K. Liu, and R. M. Measures, IEEE Photon. Technol. Lett. 4, 516 (1992).
[CrossRef]

Liu, L.

Liu, T.

Long, P.

Lu, Z. G.

Martini, G.

L. Faustini and G. Martini, J. Lightwave Technol. 15, 671 (1997).
[CrossRef]

Mason, B.

B. Mason, S. P. DenBaars, and L. A. Coldren, IEEE Photon. Technol. Lett. 10, 1085 (1998).
[CrossRef]

Measures, R. M.

S. M. Melle, K. Liu, and R. M. Measures, IEEE Photon. Technol. Lett. 4, 516 (1992).
[CrossRef]

Mei, T.

C. Sookdhis, T. Mei, H. S. Djie, and J. Arokiaraj, Opt. Eng. 42, 3421 (2003).
[CrossRef]

Melle, S. M.

S. M. Melle, K. Liu, and R. M. Measures, IEEE Photon. Technol. Lett. 4, 516 (1992).
[CrossRef]

Morgan, R.

Patrick, H. J.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Putnam, M. A.

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

Renner, H.

H. Renner, J. Lightwave Technol. 10, 544 (1992).
[CrossRef]

Ribeiro, A. B. L.

A. B. L. Ribeiro, L. A. Ferreira, M. Tsvetkov, and J. L. Santos, Electron. Lett. 32, 382 (1996).
[CrossRef]

Rochford, K. B.

Santos, J. L.

A. B. L. Ribeiro, L. A. Ferreira, M. Tsvetkov, and J. L. Santos, Electron. Lett. 32, 382 (1996).
[CrossRef]

Shrubshall, P. A.

A. J. Harris, P. A. Shrubshall, and P. F. Castle, J. Lightwave Technol. 6, 80 (1988).
[CrossRef]

Siddiqui, A. S.

J. J. Lepley and A. S. Siddiqui, IEE Proc. Optoelectron. 146, 121 (1999).
[CrossRef]

Sookdhis, C.

C. Sookdhis, T. Mei, H. S. Djie, and J. Arokiaraj, Opt. Eng. 42, 3421 (2003).
[CrossRef]

Sun, F. G.

Tsvetkov, M.

A. B. L. Ribeiro, L. A. Ferreira, M. Tsvetkov, and J. L. Santos, Electron. Lett. 32, 382 (1996).
[CrossRef]

Valiente, I.

I. Valiente and C. Vassallo, Electron. Lett. 25, 1544 (1989).
[CrossRef]

Vassallo, C.

I. Valiente and C. Vassallo, Electron. Lett. 25, 1544 (1989).
[CrossRef]

Wang, Q.

Wang, Y.

Xiao, G. Z.

Zha, Y.

Zhang, F.

Zhang, Y.

Zhang, Z.

Zhao, P.

Appl. Opt. (1)

Electron. Lett. (3)

I. Valiente and C. Vassallo, Electron. Lett. 25, 1544 (1989).
[CrossRef]

M. A. Davis and A. D. Kersey, Electron. Lett. 30, 75 (1994).
[CrossRef]

A. B. L. Ribeiro, L. A. Ferreira, M. Tsvetkov, and J. L. Santos, Electron. Lett. 32, 382 (1996).
[CrossRef]

IEE Proc. Optoelectron. (1)

J. J. Lepley and A. S. Siddiqui, IEE Proc. Optoelectron. 146, 121 (1999).
[CrossRef]

IEEE Photon. Technol. Lett. (2)

S. M. Melle, K. Liu, and R. M. Measures, IEEE Photon. Technol. Lett. 4, 516 (1992).
[CrossRef]

B. Mason, S. P. DenBaars, and L. A. Coldren, IEEE Photon. Technol. Lett. 10, 1085 (1998).
[CrossRef]

J. Lightwave Technol. (5)

H. Renner, J. Lightwave Technol. 10, 544 (1992).
[CrossRef]

K. B. Rochford and S. D. Dyer, J. Lightwave Technol. 17, 831 (1999).
[CrossRef]

A. D. Kersey, M. A. Davis, H. J. Patrick, M. Leblanc, K. P. Koo, C. G. Askin, M. A. Putnam, and E. J. Friebele, J. Lightwave Technol. 15, 1442 (1997).
[CrossRef]

L. Faustini and G. Martini, J. Lightwave Technol. 15, 671 (1997).
[CrossRef]

A. J. Harris, P. A. Shrubshall, and P. F. Castle, J. Lightwave Technol. 6, 80 (1988).
[CrossRef]

Opt. Eng. (1)

C. Sookdhis, T. Mei, H. S. Djie, and J. Arokiaraj, Opt. Eng. 42, 3421 (2003).
[CrossRef]

Opt. Express (1)

Opt. Lett. (3)

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Figures (4)

Fig. 1
Fig. 1

(a) Schematic configuration of the ratiometric wavelength measurement system with the fiber bend loss filter; (b) desired spectral response of the fiber filter.

Fig. 2
Fig. 2

(a) Contour plot of bending loss versus length of bending section and bending radius at the wavelength 1500 nm ; (b) contour plot of Δ L s versus length of bending section and bending radius.

Fig. 3
Fig. 3

(a) Measured transmission loss of bending SMF28; (b) measured transmission loss of bending SMF28 with an absorbing coating layer outside.

Fig. 4
Fig. 4

Measured output of the ratiometric system as the input signal increases by 10 pm.

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