Abstract

We report an electron-probe microanalysis of a hologram recorded in a silica-nanoparticle-dispersed photopolymer film. We used S and Si atoms as label elements to identify formed polymer and nanoparticle species, respectively. It is found that the periodic density distributions of S and Si atoms are out of phase with each other, indicating that those of the formed polymer and nanoparticles are out of phase each other. This result shows decisive evidence of the mutual diffusion of monomer molecules and silica nanoparticles in the film under holographic two-beam interference exposure.

© 2006 Optical Society of America

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References

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  1. M. Haw, Nature 422, 556 (2003).
    [CrossRef] [PubMed]
  2. H.J.Coufal, D.Psaltis, and G.T.Sincerbox, eds., Holographic Data Storage (Springer, 2000).
  3. J. V. Kelly, F. T. O'Neill, J. T. Sheridan, C. Neipp, S. Gallego, and M. Ortuno, J. Opt. Soc. Am. B 22, 407 (2005), and references therein.
    [CrossRef]
  4. N. Suzuki, Y. Tomita, and T. Kojima, Appl. Phys. Lett. 81, 4121 (2002).
    [CrossRef]
  5. Y. Tomita and H. Nishibiraki, Appl. Phys. Lett. 83, 410 (2003).
    [CrossRef]
  6. N. Suzuki and Y. Tomita, Appl. Opt. 43, 2125 (2004).
    [CrossRef] [PubMed]
  7. Y. Tomita, N. Suzuki, and K. Chikama, Opt. Lett. 30, 839 (2005).
    [CrossRef] [PubMed]
  8. Y. Tomita, in Photorefractive Effects, Materials, and Devices, G.Zhang, D.Kip, D.Nolte, and J.Xu, eds., Vol. 99 of OSA Trends in Optics and Photonics Series (Optical Society of America, 2005), p. 274.
  9. J. Crank and G. S. Park, Diffusion in Polymers (Academic, 1968).
  10. W. R. Vieth, Diffusion in and Through Polymers: Principles and Applications (Hanser Gardner, 1991).
  11. N. Suzuki and Y. Tomita, Appl. Phys. Lett. 88, 011105 (2006).
    [CrossRef]
  12. T. Kojima and Y. Tomita, Opt. Rev. 9, 222 (2002).
    [CrossRef]
  13. H. Kogelnik, Bell Syst. Tech. J. 48, 2909 (1969).
  14. K. F. J. Heinrich, Electron Beam X-ray Microanalysis (Van Nostrand Reinhold, 1981).

2006

N. Suzuki and Y. Tomita, Appl. Phys. Lett. 88, 011105 (2006).
[CrossRef]

2005

2004

2003

M. Haw, Nature 422, 556 (2003).
[CrossRef] [PubMed]

Y. Tomita and H. Nishibiraki, Appl. Phys. Lett. 83, 410 (2003).
[CrossRef]

2002

N. Suzuki, Y. Tomita, and T. Kojima, Appl. Phys. Lett. 81, 4121 (2002).
[CrossRef]

T. Kojima and Y. Tomita, Opt. Rev. 9, 222 (2002).
[CrossRef]

1969

H. Kogelnik, Bell Syst. Tech. J. 48, 2909 (1969).

Chikama, K.

Crank, J.

J. Crank and G. S. Park, Diffusion in Polymers (Academic, 1968).

Gallego, S.

Haw, M.

M. Haw, Nature 422, 556 (2003).
[CrossRef] [PubMed]

Heinrich, K. F. J.

K. F. J. Heinrich, Electron Beam X-ray Microanalysis (Van Nostrand Reinhold, 1981).

Kelly, J. V.

Kogelnik, H.

H. Kogelnik, Bell Syst. Tech. J. 48, 2909 (1969).

Kojima, T.

T. Kojima and Y. Tomita, Opt. Rev. 9, 222 (2002).
[CrossRef]

N. Suzuki, Y. Tomita, and T. Kojima, Appl. Phys. Lett. 81, 4121 (2002).
[CrossRef]

Neipp, C.

Nishibiraki, H.

Y. Tomita and H. Nishibiraki, Appl. Phys. Lett. 83, 410 (2003).
[CrossRef]

O'Neill, F. T.

Ortuno, M.

Park, G. S.

J. Crank and G. S. Park, Diffusion in Polymers (Academic, 1968).

Sheridan, J. T.

Suzuki, N.

N. Suzuki and Y. Tomita, Appl. Phys. Lett. 88, 011105 (2006).
[CrossRef]

Y. Tomita, N. Suzuki, and K. Chikama, Opt. Lett. 30, 839 (2005).
[CrossRef] [PubMed]

N. Suzuki and Y. Tomita, Appl. Opt. 43, 2125 (2004).
[CrossRef] [PubMed]

N. Suzuki, Y. Tomita, and T. Kojima, Appl. Phys. Lett. 81, 4121 (2002).
[CrossRef]

Tomita, Y.

N. Suzuki and Y. Tomita, Appl. Phys. Lett. 88, 011105 (2006).
[CrossRef]

Y. Tomita, N. Suzuki, and K. Chikama, Opt. Lett. 30, 839 (2005).
[CrossRef] [PubMed]

N. Suzuki and Y. Tomita, Appl. Opt. 43, 2125 (2004).
[CrossRef] [PubMed]

Y. Tomita and H. Nishibiraki, Appl. Phys. Lett. 83, 410 (2003).
[CrossRef]

N. Suzuki, Y. Tomita, and T. Kojima, Appl. Phys. Lett. 81, 4121 (2002).
[CrossRef]

T. Kojima and Y. Tomita, Opt. Rev. 9, 222 (2002).
[CrossRef]

Y. Tomita, in Photorefractive Effects, Materials, and Devices, G.Zhang, D.Kip, D.Nolte, and J.Xu, eds., Vol. 99 of OSA Trends in Optics and Photonics Series (Optical Society of America, 2005), p. 274.

Vieth, W. R.

W. R. Vieth, Diffusion in and Through Polymers: Principles and Applications (Hanser Gardner, 1991).

Appl. Opt.

Appl. Phys. Lett.

N. Suzuki, Y. Tomita, and T. Kojima, Appl. Phys. Lett. 81, 4121 (2002).
[CrossRef]

Y. Tomita and H. Nishibiraki, Appl. Phys. Lett. 83, 410 (2003).
[CrossRef]

N. Suzuki and Y. Tomita, Appl. Phys. Lett. 88, 011105 (2006).
[CrossRef]

Bell Syst. Tech. J.

H. Kogelnik, Bell Syst. Tech. J. 48, 2909 (1969).

J. Opt. Soc. Am. B

Nature

M. Haw, Nature 422, 556 (2003).
[CrossRef] [PubMed]

Opt. Lett.

Opt. Rev.

T. Kojima and Y. Tomita, Opt. Rev. 9, 222 (2002).
[CrossRef]

Other

K. F. J. Heinrich, Electron Beam X-ray Microanalysis (Van Nostrand Reinhold, 1981).

Y. Tomita, in Photorefractive Effects, Materials, and Devices, G.Zhang, D.Kip, D.Nolte, and J.Xu, eds., Vol. 99 of OSA Trends in Optics and Photonics Series (Optical Society of America, 2005), p. 274.

J. Crank and G. S. Park, Diffusion in Polymers (Academic, 1968).

W. R. Vieth, Diffusion in and Through Polymers: Principles and Applications (Hanser Gardner, 1991).

H.J.Coufal, D.Psaltis, and G.T.Sincerbox, eds., Holographic Data Storage (Springer, 2000).

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Figures (4)

Fig. 1
Fig. 1

Buildup dynamics of Δ n recorded in a silica NDP film at a grating spacing of 2 μ m .

Fig. 2
Fig. 2

EPMA images of a hologram recorded at a grating spacing of 2 μ m .

Fig. 3
Fig. 3

Line-scan profiles for densities of BEs and Si, O, S, and O atoms. The vertical axis was scaled for each density profile in the units of the gray or blue–green–red color scales shown in Fig. 2.

Fig. 4
Fig. 4

AFM image of the hologram after holographic exposure at a grating spacing of 2 μ m .

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