Abstract

Second-harmonic microscopy has been successfully applied to characterize the second-order nonlinear layer in optical fibers thermally poled at 280 °C and 3.5 kV for 30 min. The nonlinear layer was found to be 5.1μm deep under the anode and was not always centered about the closest point between the electrodes.

© 2005 Optical Society of America

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  1. R. A. Myers, N. Mukherjee, and S. R. J. Brueck, Opt. Lett. 16, 1732 (1991).
    [Crossref] [PubMed]
  2. P. G. Kazansky, L. Dong, and P. St. J. Russell, Opt. Lett. 19, 701 (1994).
    [Crossref] [PubMed]
  3. X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
    [Crossref]
  4. D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
    [Crossref]
  5. J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
    [Crossref]
  6. A. Le Calvez, E. Freysz, and A. Ducasse, Opt. Lett. 22, 1547 (1997).
    [Crossref]
  7. W. Margulis and F. Laurell, Opt. Lett. 21, 1786 (1996).
    [Crossref] [PubMed]
  8. T. G. Alley and S. R. J. Brueck, Opt. Lett. 23, 1170 (1998).
    [Crossref]
  9. P. Blazkiewicz, W. Xu, D. Wong, and S. Fleming, J. Opt. Soc. Am. B 19, 870 (2002).
    [Crossref]
  10. A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
    [Crossref]
  11. Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
    [Crossref]
  12. V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
    [Crossref]
  13. J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
    [Crossref]
  14. T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
    [Crossref]

2003 (2)

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[Crossref]

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[Crossref]

2002 (1)

2000 (1)

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[Crossref]

1999 (1)

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[Crossref]

1998 (2)

T. G. Alley and S. R. J. Brueck, Opt. Lett. 23, 1170 (1998).
[Crossref]

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[Crossref]

1997 (2)

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[Crossref]

A. Le Calvez, E. Freysz, and A. Ducasse, Opt. Lett. 22, 1547 (1997).
[Crossref]

1996 (2)

W. Margulis and F. Laurell, Opt. Lett. 21, 1786 (1996).
[Crossref] [PubMed]

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[Crossref]

1995 (1)

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[Crossref]

1994 (1)

1991 (1)

Alley, T. G.

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[Crossref]

T. G. Alley and S. R. J. Brueck, Opt. Lett. 23, 1170 (1998).
[Crossref]

Arentoft, J.

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[Crossref]

Beermann, J.

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[Crossref]

Blazkiewicz, P.

Bozhevolnyi, S. I.

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[Crossref]

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[Crossref]

Brueck, S. R. J.

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[Crossref]

T. G. Alley and S. R. J. Brueck, Opt. Lett. 23, 1170 (1998).
[Crossref]

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[Crossref]

R. A. Myers, N. Mukherjee, and S. R. J. Brueck, Opt. Lett. 16, 1732 (1991).
[Crossref] [PubMed]

Dong, L.

Ducasse, A.

Fage-Pedersen, J.

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[Crossref]

Fleming, S.

P. Blazkiewicz, W. Xu, D. Wong, and S. Fleming, J. Opt. Soc. Am. B 19, 870 (2002).
[Crossref]

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[Crossref]

Freysz, E.

Janos, M.

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[Crossref]

Kazansky, P. G.

Kirilyuk, A.

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[Crossref]

Kirilyuk, V.

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[Crossref]

Kristensen, M.

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[Crossref]

Kudlinski, A.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[Crossref]

Kurimura, S.

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[Crossref]

Laurell, F.

Le Calvez, A.

Lelek, M.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[Crossref]

Lo, K. M.

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[Crossref]

Long, X.-C.

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[Crossref]

Margulis, W.

Martinelli, G.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[Crossref]

Mukherjee, N.

Myers, R. A.

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[Crossref]

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[Crossref]

R. A. Myers, N. Mukherjee, and S. R. J. Brueck, Opt. Lett. 16, 1732 (1991).
[Crossref] [PubMed]

Pedersen, K.

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[Crossref]

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[Crossref]

Quiquempois, Y.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[Crossref]

Rasing, Th.

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[Crossref]

Russell, P. St. J.

Shi, P.

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[Crossref]

Uesu, Y.

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[Crossref]

Wong, D.

P. Blazkiewicz, W. Xu, D. Wong, and S. Fleming, J. Opt. Soc. Am. B 19, 870 (2002).
[Crossref]

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[Crossref]

Xu, W.

P. Blazkiewicz, W. Xu, D. Wong, and S. Fleming, J. Opt. Soc. Am. B 19, 870 (2002).
[Crossref]

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[Crossref]

Yamamoto, Y.

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[Crossref]

Zeghlache, H.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[Crossref]

Appl. Phys. Lett. (3)

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[Crossref]

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[Crossref]

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[Crossref]

Electron. Lett. (1)

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[Crossref]

IEEE Photonics Technol. Lett. (1)

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[Crossref]

J. Non-Cryst. Solids (1)

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[Crossref]

J. Opt. Soc. Am. B (1)

Opt. Commun. (1)

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[Crossref]

Opt. Fiber Technol. (1)

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[Crossref]

Opt. Lett. (5)

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Figures (3)

Fig. 1
Fig. 1

SH micrographs of the cross-section of a D fiber poled at 3.5 kV at 280 °C for 30 min. (a) Channel 1 image, (b) channel 2 image. The polarization direction of the incident excitation beam is indicated by an arrow. (c) Overlaid image of (a) and (b). [NB: The dark curve shown within the bright SON layer in (b) is an artifact of image conversion from color to gray-scale intensity representation; this is a region of saturated SH signal, not a minimum.]

Fig. 2
Fig. 2

Line-scan characterization of the SON layer: (a) fluorescence signal from channel 1, (b) SH signal from channel 2.

Fig. 3
Fig. 3

SON spatial profile in a thermally poled D fiber.

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