Abstract

Second-harmonic microscopy has been successfully applied to characterize the second-order nonlinear layer in optical fibers thermally poled at 280 °C and 3.5 kV for 30 min. The nonlinear layer was found to be 5.1μm deep under the anode and was not always centered about the closest point between the electrodes.

© 2005 Optical Society of America

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2003

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[CrossRef]

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[CrossRef]

2002

2000

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[CrossRef]

1999

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[CrossRef]

1998

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[CrossRef]

T. G. Alley and S. R. J. Brueck, Opt. Lett. 23, 1170 (1998).
[CrossRef]

1997

A. Le Calvez, E. Freysz, and A. Ducasse, Opt. Lett. 22, 1547 (1997).
[CrossRef]

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[CrossRef]

1996

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[CrossRef]

W. Margulis and F. Laurell, Opt. Lett. 21, 1786 (1996).
[CrossRef] [PubMed]

1995

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[CrossRef]

1994

1991

Alley, T. G.

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[CrossRef]

T. G. Alley and S. R. J. Brueck, Opt. Lett. 23, 1170 (1998).
[CrossRef]

Arentoft, J.

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[CrossRef]

Beermann, J.

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[CrossRef]

Blazkiewicz, P.

Bozhevolnyi, S. I.

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[CrossRef]

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[CrossRef]

Brueck, S. R. J.

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[CrossRef]

T. G. Alley and S. R. J. Brueck, Opt. Lett. 23, 1170 (1998).
[CrossRef]

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[CrossRef]

R. A. Myers, N. Mukherjee, and S. R. J. Brueck, Opt. Lett. 16, 1732 (1991).
[CrossRef] [PubMed]

Dong, L.

Ducasse, A.

Fage-Pedersen, J.

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[CrossRef]

Fleming, S.

P. Blazkiewicz, W. Xu, D. Wong, and S. Fleming, J. Opt. Soc. Am. B 19, 870 (2002).
[CrossRef]

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[CrossRef]

Freysz, E.

Janos, M.

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[CrossRef]

Kazansky, P. G.

Kirilyuk, A.

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[CrossRef]

Kirilyuk, V.

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[CrossRef]

Kristensen, M.

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[CrossRef]

Kudlinski, A.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[CrossRef]

Kurimura, S.

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[CrossRef]

Laurell, F.

Le Calvez, A.

Lelek, M.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[CrossRef]

Lo, K. M.

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[CrossRef]

Long, X.-C.

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[CrossRef]

Margulis, W.

Martinelli, G.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[CrossRef]

Mukherjee, N.

Myers, R. A.

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[CrossRef]

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[CrossRef]

R. A. Myers, N. Mukherjee, and S. R. J. Brueck, Opt. Lett. 16, 1732 (1991).
[CrossRef] [PubMed]

Pedersen, K.

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[CrossRef]

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[CrossRef]

Quiquempois, Y.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[CrossRef]

Rasing, Th.

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[CrossRef]

Russell, P. St. J.

Shi, P.

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[CrossRef]

Uesu, Y.

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[CrossRef]

Wong, D.

P. Blazkiewicz, W. Xu, D. Wong, and S. Fleming, J. Opt. Soc. Am. B 19, 870 (2002).
[CrossRef]

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[CrossRef]

Xu, W.

P. Blazkiewicz, W. Xu, D. Wong, and S. Fleming, J. Opt. Soc. Am. B 19, 870 (2002).
[CrossRef]

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[CrossRef]

Yamamoto, Y.

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[CrossRef]

Zeghlache, H.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[CrossRef]

Appl. Phys. Lett.

A. Kudlinski, Y. Quiquempois, M. Lelek, H. Zeghlache, and G. Martinelli, Appl. Phys. Lett. 83, 3623 (2003).
[CrossRef]

Y. Uesu, S. Kurimura, and Y. Yamamoto, Appl. Phys. Lett. 66, 2165 (1995).
[CrossRef]

V. Kirilyuk, A. Kirilyuk, and Th. Rasing, Appl. Phys. Lett. 70, 2306 (1997).
[CrossRef]

Electron. Lett.

J. Arentoft, M. Kristensen, K. Pedersen, S. I. Bozhevolnyi, and P. Shi, Electron. Lett. 36, 1635 (2000).
[CrossRef]

IEEE Photonics Technol. Lett.

X.-C. Long, R. A. Myers, and S. R. J. Brueck, IEEE Photonics Technol. Lett. 8, 227 (1996).
[CrossRef]

J. Non-Cryst. Solids

T. G. Alley, S. R. J. Brueck, and R. A. Myers, J. Non-Cryst. Solids 242, 165 (1998).
[CrossRef]

J. Opt. Soc. Am. B

Opt. Commun.

J. Beermann, S. I. Bozhevolnyi, K. Pedersen, and J. Fage-Pedersen, Opt. Commun. 221, 295 (2003).
[CrossRef]

Opt. Fiber Technol.

D. Wong, W. Xu, S. Fleming, M. Janos, and K. M. Lo, Opt. Fiber Technol. 5, 235 (1999).
[CrossRef]

Opt. Lett.

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Figures (3)

Fig. 1
Fig. 1

SH micrographs of the cross-section of a D fiber poled at 3.5 kV at 280 °C for 30 min. (a) Channel 1 image, (b) channel 2 image. The polarization direction of the incident excitation beam is indicated by an arrow. (c) Overlaid image of (a) and (b). [NB: The dark curve shown within the bright SON layer in (b) is an artifact of image conversion from color to gray-scale intensity representation; this is a region of saturated SH signal, not a minimum.]

Fig. 2
Fig. 2

Line-scan characterization of the SON layer: (a) fluorescence signal from channel 1, (b) SH signal from channel 2.

Fig. 3
Fig. 3

SON spatial profile in a thermally poled D fiber.

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