Abstract

We propose a large-scale variable delay line based on planar light-wave circuit technology and its application as a reference arm in an optical low-coherence reflectometer. This variable delay line is composed of 16 asymmetrical delay arm pairs sandwiched between 2 optical switches, which select the path for a needed delay. This configuration enables us to eliminate the need for a moving part in the reflectometer. We can scan the reference arm over a length of 262.1 mm with a step of less than 1.0μm in air and achieve reflectometer sensitivity of about 47dB.

© 2005 Optical Society of America

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References

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  1. T. Bosselmann and R. Ulrich, in OFS ’84—International Conference on Optical Fiber Sensors, Proceedings (VDE-VERLAG GmbH, 1984), p. 361.
  2. S. Mechels, K. Takada, and K. Okamoto, IEEE Photon. Technol. Lett. 11, 857 (1999).
    [CrossRef]
  3. V. Morgner, W. Drexler, F. X. Kärtner, X. D. Li, C. Pitris, E. P. Ippen, and J. G. Fujimoto, Opt. Lett. 25, 111 (2000).
    [CrossRef]
  4. G. J. Tearney, B. E. Bouma, and J. G. Fujimoto, Opt. Lett. 23, 1811 (1997).
    [CrossRef]
  5. P. G. Sinha and T. Yoshino, J. Lightwave Technol. 16, 2010 (1998).
    [CrossRef]
  6. T. Miya, IEEE J. Sel. Top. Quantum Electron. 6, 38 (2000).
    [CrossRef]
  7. K. Takiguchi, T. Shibata, and M. Itoh, Electron. Lett. 38, 469 (2002).
    [CrossRef]
  8. K. Takiguchi, in Proc. SPIE 5623, 325 (2005).
    [CrossRef]
  9. Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
    [CrossRef]
  10. N. Takato, K. Jinguji, M. Yasu, H. Toba, and M. Kawachi, J. Lightwave Technol. 6, 1003 (1988).
    [CrossRef]
  11. S. Kawakami, Appl. Opt. 22, 2426 (1983).
    [CrossRef] [PubMed]

2005

K. Takiguchi, in Proc. SPIE 5623, 325 (2005).
[CrossRef]

2002

K. Takiguchi, T. Shibata, and M. Itoh, Electron. Lett. 38, 469 (2002).
[CrossRef]

2000

V. Morgner, W. Drexler, F. X. Kärtner, X. D. Li, C. Pitris, E. P. Ippen, and J. G. Fujimoto, Opt. Lett. 25, 111 (2000).
[CrossRef]

Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
[CrossRef]

T. Miya, IEEE J. Sel. Top. Quantum Electron. 6, 38 (2000).
[CrossRef]

1999

S. Mechels, K. Takada, and K. Okamoto, IEEE Photon. Technol. Lett. 11, 857 (1999).
[CrossRef]

1998

1997

1988

N. Takato, K. Jinguji, M. Yasu, H. Toba, and M. Kawachi, J. Lightwave Technol. 6, 1003 (1988).
[CrossRef]

1983

Bosselmann, T.

T. Bosselmann and R. Ulrich, in OFS ’84—International Conference on Optical Fiber Sensors, Proceedings (VDE-VERLAG GmbH, 1984), p. 361.

Bouma, B. E.

Drexler, W.

Fujimoto, J. G.

Hibino, Y.

Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
[CrossRef]

Hida, Y.

Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
[CrossRef]

Himeno, A.

Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
[CrossRef]

Ippen, E. P.

Itoh, M.

K. Takiguchi, T. Shibata, and M. Itoh, Electron. Lett. 38, 469 (2002).
[CrossRef]

Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
[CrossRef]

Jinguji, K.

N. Takato, K. Jinguji, M. Yasu, H. Toba, and M. Kawachi, J. Lightwave Technol. 6, 1003 (1988).
[CrossRef]

Kaneko, A.

Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
[CrossRef]

Kärtner, F. X.

Kawachi, M.

N. Takato, K. Jinguji, M. Yasu, H. Toba, and M. Kawachi, J. Lightwave Technol. 6, 1003 (1988).
[CrossRef]

Kawakami, S.

Li, X. D.

Mechels, S.

S. Mechels, K. Takada, and K. Okamoto, IEEE Photon. Technol. Lett. 11, 857 (1999).
[CrossRef]

Miya, T.

T. Miya, IEEE J. Sel. Top. Quantum Electron. 6, 38 (2000).
[CrossRef]

Morgner, V.

Ohmori, Y.

Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
[CrossRef]

Okamoto, K.

S. Mechels, K. Takada, and K. Okamoto, IEEE Photon. Technol. Lett. 11, 857 (1999).
[CrossRef]

Pitris, C.

Shibata, T.

K. Takiguchi, T. Shibata, and M. Itoh, Electron. Lett. 38, 469 (2002).
[CrossRef]

Sinha, P. G.

Sugita, A.

Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
[CrossRef]

Takada, K.

S. Mechels, K. Takada, and K. Okamoto, IEEE Photon. Technol. Lett. 11, 857 (1999).
[CrossRef]

Takato, N.

N. Takato, K. Jinguji, M. Yasu, H. Toba, and M. Kawachi, J. Lightwave Technol. 6, 1003 (1988).
[CrossRef]

Takiguchi, K.

K. Takiguchi, in Proc. SPIE 5623, 325 (2005).
[CrossRef]

K. Takiguchi, T. Shibata, and M. Itoh, Electron. Lett. 38, 469 (2002).
[CrossRef]

Tearney, G. J.

Toba, H.

N. Takato, K. Jinguji, M. Yasu, H. Toba, and M. Kawachi, J. Lightwave Technol. 6, 1003 (1988).
[CrossRef]

Ulrich, R.

T. Bosselmann and R. Ulrich, in OFS ’84—International Conference on Optical Fiber Sensors, Proceedings (VDE-VERLAG GmbH, 1984), p. 361.

Yasu, M.

N. Takato, K. Jinguji, M. Yasu, H. Toba, and M. Kawachi, J. Lightwave Technol. 6, 1003 (1988).
[CrossRef]

Yoshino, T.

Appl. Opt.

Electron. Lett.

Y. Hida, Y. Hibino, A. Kaneko, M. Itoh, A. Sugita, A. Himeno, and Y. Ohmori, Electron. Lett. 36, 820 (2000).
[CrossRef]

K. Takiguchi, T. Shibata, and M. Itoh, Electron. Lett. 38, 469 (2002).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron.

T. Miya, IEEE J. Sel. Top. Quantum Electron. 6, 38 (2000).
[CrossRef]

IEEE Photon. Technol. Lett.

S. Mechels, K. Takada, and K. Okamoto, IEEE Photon. Technol. Lett. 11, 857 (1999).
[CrossRef]

J. Lightwave Technol.

N. Takato, K. Jinguji, M. Yasu, H. Toba, and M. Kawachi, J. Lightwave Technol. 6, 1003 (1988).
[CrossRef]

P. G. Sinha and T. Yoshino, J. Lightwave Technol. 16, 2010 (1998).
[CrossRef]

Opt. Lett.

Proc. SPIE

K. Takiguchi, in Proc. SPIE 5623, 325 (2005).
[CrossRef]

Other

T. Bosselmann and R. Ulrich, in OFS ’84—International Conference on Optical Fiber Sensors, Proceedings (VDE-VERLAG GmbH, 1984), p. 361.

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Figures (4)

Fig. 1
Fig. 1

(a) Configuration of the PLC circuit for the OLCR. (b) OLCR measurement setup (GPIB, general-purpose interface bus).

Fig. 2
Fig. 2

Measured fiber-to-fiber one-way loss of the variable delay line versus the delay change.

Fig. 3
Fig. 3

Measured unwanted cross talk versus wavelength in the unit configuration of the variable delay line.

Fig. 4
Fig. 4

Measured interference amplitudes of the OLCR.

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