Abstract

A method for polarimetric measurement that uses a discrete space-variant subwavelength dielectric grating is presented. One retrieves the polarization state by measuring the far-field intensity of a beam emerging from the grating followed by a polarizer. The analysis for a partially polarized, quasi-monochromatic beam is performed by use of the beam coherence polarization matrix along with an extended van Cittert–Zernike theorem. We experimentally demonstrate polarization measurements of both fully and partially polarized light.

© 2005 Optical Society of America

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