Abstract

A three-dimensional optical data storage system that combines a new recording material with a microholographic data format in which data are stored as single-bit microholograms is presented. This format offers less sensitivity to environmental conditions than the page-based holographic approach in addition to an increased compatibility with current storage technologies. The new recording material is based on a thermoplastic material. The results presented indicate that the dimensions of the microholograms are larger than those calculated by use of simple laser beam waist approximations and that multiple layers of microholograms would significantly affect signal levels. Data densities achievable with the microholographic format will likely be limited by those effects.

© 2005 Optical Society of America

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  5. S. S. Orlov, W. Phillips, E. Bjornson, Y. Takashima, P. Sundaram, L. Hesselink, R. Okas, D. Kwan, and R. Snyder, Appl. Opt. 43, 4902 (2004).
    [CrossRef] [PubMed]
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    [CrossRef]
  7. M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
    [CrossRef]
  8. M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
    [CrossRef]

2004 (4)

L. Hesselink, S. S. Orlov, and M. C. Bashaw, Proc. IEEE 92, 1231 (2004).
[CrossRef]

S. Orlic, E. Dietz, S. Frohmann, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, Proc. SPIE 5521, 161 (2004).
[CrossRef]

M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
[CrossRef]

S. S. Orlov, W. Phillips, E. Bjornson, Y. Takashima, P. Sundaram, L. Hesselink, R. Okas, D. Kwan, and R. Snyder, Appl. Opt. 43, 4902 (2004).
[CrossRef] [PubMed]

2003 (2)

D. A. Waldman, C. I. Butler, and D. H. Raguin, Proc. SPIE 5216, 10 (2003).
[CrossRef]

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

1998 (1)

H. J. Eichler, P. Kuemmel, S. Orloc, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

Bashaw, M. C.

L. Hesselink, S. S. Orlov, and M. C. Bashaw, Proc. IEEE 92, 1231 (2004).
[CrossRef]

Bjornson, E.

Boden, E.

M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
[CrossRef]

Butler, C. I.

D. A. Waldman, C. I. Butler, and D. H. Raguin, Proc. SPIE 5216, 10 (2003).
[CrossRef]

Chan, K. P.

M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
[CrossRef]

Dhar, L.

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

Dietz, E.

S. Orlic, E. Dietz, S. Frohmann, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, Proc. SPIE 5521, 161 (2004).
[CrossRef]

Dubois, M.

M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
[CrossRef]

Eichler, H. J.

S. Orlic, E. Dietz, S. Frohmann, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, Proc. SPIE 5521, 161 (2004).
[CrossRef]

H. J. Eichler, P. Kuemmel, S. Orloc, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

Frohmann, S.

S. Orlic, E. Dietz, S. Frohmann, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, Proc. SPIE 5521, 161 (2004).
[CrossRef]

Hesselink, L.

M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
[CrossRef]

L. Hesselink, S. S. Orlov, and M. C. Bashaw, Proc. IEEE 92, 1231 (2004).
[CrossRef]

S. S. Orlov, W. Phillips, E. Bjornson, Y. Takashima, P. Sundaram, L. Hesselink, R. Okas, D. Kwan, and R. Snyder, Appl. Opt. 43, 4902 (2004).
[CrossRef] [PubMed]

Hill, A.

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

Ihas, B.

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

Kuemmel, P.

H. J. Eichler, P. Kuemmel, S. Orloc, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

Kwan, D.

Lawrence, B.

M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
[CrossRef]

Michaels, D.

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

Mueller, C.

S. Orlic, E. Dietz, S. Frohmann, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, Proc. SPIE 5521, 161 (2004).
[CrossRef]

Nielsen, M.

M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
[CrossRef]

Okas, R.

Orlic, S.

S. Orlic, E. Dietz, S. Frohmann, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, Proc. SPIE 5521, 161 (2004).
[CrossRef]

Orloc, S.

H. J. Eichler, P. Kuemmel, S. Orloc, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

Orlov, S. S.

Phillips, W.

Raguin, D. H.

D. A. Waldman, C. I. Butler, and D. H. Raguin, Proc. SPIE 5216, 10 (2003).
[CrossRef]

Schnoes, M.

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

Schoen, R.

S. Orlic, E. Dietz, S. Frohmann, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, Proc. SPIE 5521, 161 (2004).
[CrossRef]

Schomberger, G.

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

Setthachayanon, S.

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

Shi, X.

M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
[CrossRef]

Snyder, R.

Sundaram, P.

Takashima, Y.

Trefzer, M.

S. Orlic, E. Dietz, S. Frohmann, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, Proc. SPIE 5521, 161 (2004).
[CrossRef]

Waldman, D. A.

D. A. Waldman, C. I. Butler, and D. H. Raguin, Proc. SPIE 5216, 10 (2003).
[CrossRef]

Wappelt, A.

H. J. Eichler, P. Kuemmel, S. Orloc, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

Wilson, W. L.

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

Appl. Opt. (1)

IEEE J. Sel. Top. Quantum Electron. (1)

H. J. Eichler, P. Kuemmel, S. Orloc, and A. Wappelt, IEEE J. Sel. Top. Quantum Electron. 4, 840 (1998).
[CrossRef]

Proc. IEEE (1)

L. Hesselink, S. S. Orlov, and M. C. Bashaw, Proc. IEEE 92, 1231 (2004).
[CrossRef]

Proc. SPIE (4)

S. Orlic, E. Dietz, S. Frohmann, C. Mueller, R. Schoen, M. Trefzer, and H. J. Eichler, Proc. SPIE 5521, 161 (2004).
[CrossRef]

D. A. Waldman, C. I. Butler, and D. H. Raguin, Proc. SPIE 5216, 10 (2003).
[CrossRef]

M. Schnoes, B. Ihas, A. Hill, L. Dhar, D. Michaels, S. Setthachayanon, G. Schomberger, and W. L. Wilson, Proc. SPIE 5005, 29 (2003).
[CrossRef]

M. Dubois, X. Shi, B. Lawrence, E. Boden, K. P. Chan, M. Nielsen, and L. Hesselink, Proc. SPIE 5380, 589 (2004).
[CrossRef]

Other (1)

H. J. Coufal, D. Psaltis, and G. T. Sincerbox, eds., Holographic Data Storage, Vol. 76 of Springer Series in Optical Sciences (Springer-Verlag, 2000).
[CrossRef]

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Figures (5)

Fig. 1
Fig. 1

Experimental setup. Atten., attenuator.

Fig. 2
Fig. 2

Normalized experimental diffraction efficiencies as a function of lateral position for 0.5 and 5.0 mW recording powers and the same total energy. The measured laser beam distribution at the waist in air is also shown.

Fig. 3
Fig. 3

Experimental absolute diffraction efficiency as a function of sample depth. Depth is corrected for the refractive index of the sample (1.58). Recording conditions are 5.0 mW total power and 1.0 s exposure. Notice that reflectivity of the top surface ( depth , 0 μ m ) is near 4%, illustrating the adequacy of the detector calibration.

Fig. 4
Fig. 4

Lateral diffraction efficiency profiles of three linear arrays of eleven microholograms with three microhologram spacings: 3.2, 5.0, and 10 μ m . Recording conditions are 1.0 s exposure and 5.0 mW total power. Depth of the three linear arrays, 0.6 mm.

Fig. 5
Fig. 5

Lateral diffraction efficiency profiles of the middle rows of four overlaid two-dimensional 11 × 11 microhologram arrays. Microholograms are laterally spaced by 10 μ m . The recording depth of each array is indicated.

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