Abstract

We propose a new type of arrayed waveguide grating (AWG) device that operates as a Fourier-transform (FT) spectrometer without the need of scanning elements. The large input aperture size typical of a FT spectrometer eliminates the requirement for a narrow single-mode input waveguide while still achieving high spectral resolution with a markedly increased light-gathering capability (étendue). An example of the device with a resolution of 0.07nm (10GHz) and designed for a silicon-on-insulator platform is presented. The calculated spectra show no noticeable deterioration for aperture widths as large as 40μm, yielding more than a 50-fold increase in aperture size compared with conventional AWG or echelle grating based devices at the equivalent resolution.

© 2005 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. S. H. Kong, J. H. Correia, G. de Graaf, M. Bartek, and R. F. Wolffenbuttel, IEEE Instrum. Meas. Mag. 4, 34 (2001).
    [CrossRef]
  2. P. Krippner, J. Mohr, C. Müller, and C. van der Sel, Proc. SPIE 2783, 277 (1996).
    [CrossRef]
  3. R. V. Kruzelecky and A. K. Ghosh, Proc. SPIE 4205, 25 (2001).
    [CrossRef]
  4. D. Sander and J. Müller, Sens. Actuators, A 88, 1 (2001).
    [CrossRef]
  5. P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
    [CrossRef]
  6. Y. Hibino, IEEE J. Sel. Top. Quantum Electron. 8, 1090 (2002).
    [CrossRef]
  7. Y. Yoshikuni, IEEE J. Sel. Top. Quantum Electron. 8, 1101 (2002).
    [CrossRef]
  8. S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
    [CrossRef]
  9. V. R. Almeida, R. P. Panepucci, and M. Lipson, Opt. Lett. 28, 1302 (2003).
    [CrossRef] [PubMed]
  10. A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.
  11. M.-L. Junttila, J. Kauppinen, and E. Ikonen, J. Opt. Soc. Am. A 8, 1457 (1991).
    [CrossRef]
  12. J. M. Harlander, F. L. Roesler, J. G. Cardon, C. R. Englert, and R. R. Conway, Appl. Opt. 41, 1343 (2002).
    [CrossRef] [PubMed]
  13. M. K. Smith and C. van Dam, IEEE J. Sel. Top. Quantum Electron. 2, 236 (1996).
    [CrossRef]
  14. J. Chamberlein, The Principles of Interferometric Spectroscopy (Wiley, 1979), p. 6.
  15. Y. Kawakita, T. Saitoh, S. Shimotaya, and K. Shimomura, IEEE Photonics Technol. Lett. 16, 144 (2004).
    [CrossRef]
  16. O. M. Matos, M. L. Calvo, P. Cheben, A. Delâge, S. Janz, and D.-X. Xu, Proc. SPIE 5622, 885 (2004).
    [CrossRef]
  17. P. Jacquinot, J. Opt. Soc. Am. 44, 761 (1954).
    [CrossRef]
  18. O. Manzardo, R. Michaely, F. Schadelin, W. Noell, T. Overstolz, N. D. Rooij, and H. P. Herzig, Opt. Lett. 29, 1437 (2004).
    [CrossRef] [PubMed]

2004 (5)

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Y. Kawakita, T. Saitoh, S. Shimotaya, and K. Shimomura, IEEE Photonics Technol. Lett. 16, 144 (2004).
[CrossRef]

O. M. Matos, M. L. Calvo, P. Cheben, A. Delâge, S. Janz, and D.-X. Xu, Proc. SPIE 5622, 885 (2004).
[CrossRef]

O. Manzardo, R. Michaely, F. Schadelin, W. Noell, T. Overstolz, N. D. Rooij, and H. P. Herzig, Opt. Lett. 29, 1437 (2004).
[CrossRef] [PubMed]

2003 (1)

2002 (3)

J. M. Harlander, F. L. Roesler, J. G. Cardon, C. R. Englert, and R. R. Conway, Appl. Opt. 41, 1343 (2002).
[CrossRef] [PubMed]

Y. Hibino, IEEE J. Sel. Top. Quantum Electron. 8, 1090 (2002).
[CrossRef]

Y. Yoshikuni, IEEE J. Sel. Top. Quantum Electron. 8, 1101 (2002).
[CrossRef]

2001 (3)

S. H. Kong, J. H. Correia, G. de Graaf, M. Bartek, and R. F. Wolffenbuttel, IEEE Instrum. Meas. Mag. 4, 34 (2001).
[CrossRef]

R. V. Kruzelecky and A. K. Ghosh, Proc. SPIE 4205, 25 (2001).
[CrossRef]

D. Sander and J. Müller, Sens. Actuators, A 88, 1 (2001).
[CrossRef]

1996 (2)

P. Krippner, J. Mohr, C. Müller, and C. van der Sel, Proc. SPIE 2783, 277 (1996).
[CrossRef]

M. K. Smith and C. van Dam, IEEE J. Sel. Top. Quantum Electron. 2, 236 (1996).
[CrossRef]

1991 (1)

1954 (1)

Almeida, V. R.

Balakrishnan, A.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Bartek, M.

S. H. Kong, J. H. Correia, G. de Graaf, M. Bartek, and R. F. Wolffenbuttel, IEEE Instrum. Meas. Mag. 4, 34 (2001).
[CrossRef]

Bidnyk, S.

A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.

Bogdanov, A.

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

Calvo, M. L.

O. M. Matos, M. L. Calvo, P. Cheben, A. Delâge, S. Janz, and D.-X. Xu, Proc. SPIE 5622, 885 (2004).
[CrossRef]

Cardon, J. G.

Chamberlein, J.

J. Chamberlein, The Principles of Interferometric Spectroscopy (Wiley, 1979), p. 6.

Charbonneau, S.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Cheben, P.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

O. M. Matos, M. L. Calvo, P. Cheben, A. Delâge, S. Janz, and D.-X. Xu, Proc. SPIE 5622, 885 (2004).
[CrossRef]

A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.

Cloutier, M.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Conway, R. R.

Correia, J. H.

S. H. Kong, J. H. Correia, G. de Graaf, M. Bartek, and R. F. Wolffenbuttel, IEEE Instrum. Meas. Mag. 4, 34 (2001).
[CrossRef]

de Graaf, G.

S. H. Kong, J. H. Correia, G. de Graaf, M. Bartek, and R. F. Wolffenbuttel, IEEE Instrum. Meas. Mag. 4, 34 (2001).
[CrossRef]

Delâge, A.

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

O. M. Matos, M. L. Calvo, P. Cheben, A. Delâge, S. Janz, and D.-X. Xu, Proc. SPIE 5622, 885 (2004).
[CrossRef]

A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.

Dossou, K.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.

Englert, C. R.

Erickson, L.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Gao, M.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Ghosh, A. K.

R. V. Kruzelecky and A. K. Ghosh, Proc. SPIE 4205, 25 (2001).
[CrossRef]

Harlander, J. M.

Herzig, H. P.

Hibino, Y.

Y. Hibino, IEEE J. Sel. Top. Quantum Electron. 8, 1090 (2002).
[CrossRef]

Ikonen, E.

Jacquinot, P.

Janz, S.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

O. M. Matos, M. L. Calvo, P. Cheben, A. Delâge, S. Janz, and D.-X. Xu, Proc. SPIE 5622, 885 (2004).
[CrossRef]

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.

Junttila, M.-L.

Kauppinen, J.

Kawakita, Y.

Y. Kawakita, T. Saitoh, S. Shimotaya, and K. Shimomura, IEEE Photonics Technol. Lett. 16, 144 (2004).
[CrossRef]

Kong, S. H.

S. H. Kong, J. H. Correia, G. de Graaf, M. Bartek, and R. F. Wolffenbuttel, IEEE Instrum. Meas. Mag. 4, 34 (2001).
[CrossRef]

Krippner, P.

P. Krippner, J. Mohr, C. Müller, and C. van der Sel, Proc. SPIE 2783, 277 (1996).
[CrossRef]

Krug, P. A.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Kruzelecky, R. V.

R. V. Kruzelecky and A. K. Ghosh, Proc. SPIE 4205, 25 (2001).
[CrossRef]

Lamontagne, B.

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.

Lipson, M.

Manzardo, O.

Matos, O. M.

O. M. Matos, M. L. Calvo, P. Cheben, A. Delâge, S. Janz, and D.-X. Xu, Proc. SPIE 5622, 885 (2004).
[CrossRef]

Michaely, R.

Mohr, J.

P. Krippner, J. Mohr, C. Müller, and C. van der Sel, Proc. SPIE 2783, 277 (1996).
[CrossRef]

Müller, C.

P. Krippner, J. Mohr, C. Müller, and C. van der Sel, Proc. SPIE 2783, 277 (1996).
[CrossRef]

Müller, J.

D. Sander and J. Müller, Sens. Actuators, A 88, 1 (2001).
[CrossRef]

Noell, W.

Overstolz, T.

Packirisami, M.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Packirisamy, M.

A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.

Panepucci, R. P.

Pearson, M.

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Picard, M. J.

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

Post, E.

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

Roesler, F. L.

Rooij, N. D.

Saitoh, T.

Y. Kawakita, T. Saitoh, S. Shimotaya, and K. Shimomura, IEEE Photonics Technol. Lett. 16, 144 (2004).
[CrossRef]

Sander, D.

D. Sander and J. Müller, Sens. Actuators, A 88, 1 (2001).
[CrossRef]

Schadelin, F.

Shimomura, K.

Y. Kawakita, T. Saitoh, S. Shimotaya, and K. Shimomura, IEEE Photonics Technol. Lett. 16, 144 (2004).
[CrossRef]

Shimotaya, S.

Y. Kawakita, T. Saitoh, S. Shimotaya, and K. Shimomura, IEEE Photonics Technol. Lett. 16, 144 (2004).
[CrossRef]

Smith, M. K.

M. K. Smith and C. van Dam, IEEE J. Sel. Top. Quantum Electron. 2, 236 (1996).
[CrossRef]

van Dam, C.

M. K. Smith and C. van Dam, IEEE J. Sel. Top. Quantum Electron. 2, 236 (1996).
[CrossRef]

van der Sel, C.

P. Krippner, J. Mohr, C. Müller, and C. van der Sel, Proc. SPIE 2783, 277 (1996).
[CrossRef]

Wolffenbuttel, R. F.

S. H. Kong, J. H. Correia, G. de Graaf, M. Bartek, and R. F. Wolffenbuttel, IEEE Instrum. Meas. Mag. 4, 34 (2001).
[CrossRef]

Xu, D.-X.

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

O. M. Matos, M. L. Calvo, P. Cheben, A. Delâge, S. Janz, and D.-X. Xu, Proc. SPIE 5622, 885 (2004).
[CrossRef]

A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.

Yoshikuni, Y.

Y. Yoshikuni, IEEE J. Sel. Top. Quantum Electron. 8, 1101 (2002).
[CrossRef]

Appl. Opt. (1)

IEEE Instrum. Meas. Mag. (1)

S. H. Kong, J. H. Correia, G. de Graaf, M. Bartek, and R. F. Wolffenbuttel, IEEE Instrum. Meas. Mag. 4, 34 (2001).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron. (3)

Y. Hibino, IEEE J. Sel. Top. Quantum Electron. 8, 1090 (2002).
[CrossRef]

Y. Yoshikuni, IEEE J. Sel. Top. Quantum Electron. 8, 1101 (2002).
[CrossRef]

M. K. Smith and C. van Dam, IEEE J. Sel. Top. Quantum Electron. 2, 236 (1996).
[CrossRef]

IEEE Photonics Technol. Lett. (2)

S. Janz, A. Balakrishnan, S. Charbonneau, P. Cheben, M. Cloutier, A. Delâge, K. Dossou, L. Erickson, M. Gao, P. A. Krug, B. Lamontagne, M. Packirisami, M. Pearson, and D.-X. Xu, IEEE Photonics Technol. Lett. 16, 503 (2004).
[CrossRef]

Y. Kawakita, T. Saitoh, S. Shimotaya, and K. Shimomura, IEEE Photonics Technol. Lett. 16, 144 (2004).
[CrossRef]

J. Opt. Soc. Am. (1)

J. Opt. Soc. Am. A (1)

Opt. Lett. (2)

Proc. SPIE (4)

P. Cheben, A. Bogdanov, A. Delâge, S. Janz, B. Lamontagne, M. J. Picard, E. Post, and D.-X. Xu, Proc. SPIE 5644, 103 (2004).
[CrossRef]

O. M. Matos, M. L. Calvo, P. Cheben, A. Delâge, S. Janz, and D.-X. Xu, Proc. SPIE 5622, 885 (2004).
[CrossRef]

P. Krippner, J. Mohr, C. Müller, and C. van der Sel, Proc. SPIE 2783, 277 (1996).
[CrossRef]

R. V. Kruzelecky and A. K. Ghosh, Proc. SPIE 4205, 25 (2001).
[CrossRef]

Sens. Actuators, A (1)

D. Sander and J. Müller, Sens. Actuators, A 88, 1 (2001).
[CrossRef]

Other (2)

J. Chamberlein, The Principles of Interferometric Spectroscopy (Wiley, 1979), p. 6.

A. Delâge, S. Bidnyk, P. Cheben, K. Dossou, S. Janz, B. Lamontagne, M. Packirisamy, and D.-X. Xu, in Prceedings of the 6th International Conference on Transparent Optical Networks (IEEE, 2004), Vol. 2, pp. 78–83.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (2)

Fig. 1
Fig. 1

(a) General schematic of a FT dispersive planar waveguide device in a transmission geometry. (b) Schematic of the FT AWG microspectrometer with two interleaved truncated AWGs. Dotted and dashed lines in the SWC output direction represent light beams from AWG 1 and AWG 2 , respectively. RW, receiver waveguide; other abbreviations defined in text.

Fig. 2
Fig. 2

(a) Simulated interferogram and (b) calculated spectrum for an extended source. The input waveguide width is 40 μ m .

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

d θ d λ = d θ 2 d θ 1 d λ = n g ( Δ L 2 Δ L 1 ) f λ d n s Δ α = m 2 m 1 n s Λ ,
I ( x ) = 0 B ( λ ) [ 1 + cos 2 π d ( λ ) x ] d λ .
n + 1 = 2 n s D λ + Δ λ sin θ + Δ θ 2 .

Metrics